Power semiconductor device and power semiconductor core module
US-2018331077-A1 · Nov 15, 2018 · US
US12051671B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-12051671-B2 |
| Application number | US-201917293579-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jan 23, 2019 |
| Priority date | Jan 23, 2019 |
| Publication date | Jul 30, 2024 |
| Grant date | Jul 30, 2024 |
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The present invention has an object to enhance manufacturability of a pressure-contact-type semiconductor device. A pressure-contact-type semiconductor device according to the present invention includes: a semiconductor chip, the semiconductor chip including a guard ring and a gate signal input/output part in the first main surface; a first external electrode being formed on a side of the first main surface of the semiconductor chip; a conductive pattern being formed on the first external electrode; a contact pin connecting the gate signal input/output part and the conductive pattern; a plate-like electrode being provided on the second main surface of the semiconductor chip; a disc spring being provided on the plate-like electrode; and a second external electrode being provided on the disc spring, the second external electrode and the first external electrode interposing the semiconductor chip.
Opening claim text (preview).
The invention claimed is: 1. A pressure-contact-type semiconductor device comprising: a semiconductor chip including a first main surface and a second main surface being a surface to face the first main surface, the semiconductor chip including a gate signal input/output part in the first main surface; a first external electrode being formed on a side of the first main surface of the semiconductor chip; a conductive pattern being formed on the first external electrode; a contact pin connecting the gate signal input/output part and the conductive pattern; a plate-like electrode being provided on the second main surface of the semiconductor chip; a disc spring being provided on the plate-like electrode; and a second external electrode being provided on the disc spring, the second external electrode and the first external electrode interposing the semiconductor chip. 2. The pressure-contact-type semiconductor device according to claim 1 , wherein the gate signal input/output part is provided at an end portion of the first main surface of the semiconductor chip. 3. The pressure-contact-type semiconductor device according to claim 1 , wherein an area of a main surface of the plate-like electrode is larger than an area of the second main surface of the semiconductor chip. 4. The pressure-contact-type semiconductor device according to claim 1 , further comprising a coupling member connecting the plate-like electrode and the second external electrode, wherein the coupling member uses, as a main material, aluminum, copper, silver, gold, or molybdenum. 5. The pressure-contact-type semiconductor device according to claim 1 , wherein the semiconductor chip is a semiconductor chip using a wide-bandgap semiconductor.
Package configurations · CPC title
Interconnections or connectors in packages · CPC title
for connecting multiple chips together · CPC title
Shapes or dispositions of interconnections · CPC title
having another interconnection being formed by a cover plate parallel to the conductive base, e.g. sandwich type · CPC title
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