Adaptive subsampling for demura corrections

Patent metadata

Field	Value
Publication number	US-12046192-B2
Application number	US-202018034664-A
Country	US
Kind code	B2
Filing date	Dec 29, 2020
Priority date	Dec 29, 2020
Publication date	Jul 23, 2024
Grant date	Jul 23, 2024

Abstract

The present disclosure relates to methods and devices for display processing including an apparatus, e.g., a DPU. The apparatus may receive a plurality of panel measurements for a display panel, each of the plurality of panel measurements associated with a plurality of subpixels in the display panel. The apparatus may also determine, upon receiving the plurality of panel measurements, at least one offset for one or more subpixels of the plurality of subpixels associated with each of the plurality of panel measurements. The apparatus may also store, upon determining the at least one offset for the one or more subpixels, the at least one offset for the one or more subpixels associated with each of the plurality of panel measurements.

First claim

What is claimed is:

1. A method of display processing, comprising:
receiving a plurality of panel measurements for a display panel, each of the plurality of panel measurements associated with a plurality of subpixels in the display panel;
determining, upon receiving the plurality of panel measurements, at least one offset for one or more subpixels of the plurality of subpixels associated with each of the plurality of panel measurements; and
storing, upon determining the at least one offset for the one or more subpixels, the at least one offset for the one or more subpixels associated with each of the plurality of panel measurements,
wherein the at least one offset is represented by S B , where the at least one offset is determined by:

S
B

=

arg
⁢
min

α
∈
A

⁢

(

❘
"\[LeftBracketingBar]"

T
-

1
N

⁢

∑

β
∈
B

⁢

(

eval
⁢

(

β
,
α

)

)

❘
"\[RightBracketingBar]"

)

,

where A represents a set of available offsets, B represents a set of samples within a sub-block of the one or more subpixels, N represents a number of samples within the sub-block of the one or more subpixels, T represents a target luminance for the one or more subpixels, and eval represents a function for estimating a luminance of sample β with offset α.

2. The method of claim 1 , wherein the one or more subpixels correspond to an M×N block of subpixels or an M×N grid of subpixels, where M is a number of rows and N is a number of columns.

3. The method of claim 2 , wherein M is equal to two (2) and N is equal to two (2), such that the one or more subpixels correspond to a 2×2 block of subpixels or a 2×2 grid of subpixels.

4. The method of claim 1 , wherein each of the one or more subpixels are subsampled or dynamically subsampled to determine the at least one offset.

5. The method of claim 1 , wherein the at least one offset corresponds to at least one of a demura offset or a correction factor for a demura surface.

6. The method of claim 1 , wherein the at least one offset corresponds to an absolute difference between a predicted luminance for the one or more subpixels and a target luminance for the one or more subpixels.

7. The method of claim 1 , wherein the at least one offset for the one or more subpixels is determined based on a plurality of offset types.

8. The method of claim 7 , further comprising:
selecting the at least offset from the plurality of offset types, wherein the plurality of offset types corresponds to a plurality of partition types for the one or more subpixels.

9. The method of claim 7 , wherein the plurality of offset types is preselected, preconfigured, or predetermined.

10. The method of claim 1 , further comprising:
identifying the one or more subpixels of the plurality of subpixels associated with each of the plurality of panel measurements.

11. The method of claim 1 , wherein each of the panel measurements include at least one of one or more color levels or one or more color components.

12. The method of claim 1 , wherein the plurality of panel measurements is performed by at least one camera or at least one demura camera.

13. The method of claim 1 , further comprising:
applying, upon determining the at least one offset for the one or more subpixels, a clustering algorithm to each of the at least one offset for the one or more subpixels.

14. The method of claim 1 , further comprising:
compressing, upon determining the at least one offset for the one or more subpixels, the at least one offset for the one or more subpixels associated with each of the plurality of panel measurements.

15. The method of claim 1 , further comprising:
generating, upon determining the at least one offset for the one or more subpixels, a codebook based on the at least one offset for the one or more subpixels.

16. An apparatus for display processing, comprising:
a memory; and
at least one processor coupled to the memory and configured to:
receive a plurality of panel measurements for a display panel, each of the plurality of panel measurements associated with a plurality of subpixels in the display panel;
determine, upon receiving the plurality of panel measurements, at least one offset for one or more subpixels of the plurality of subpixels associated with each of the plurality of panel measurements; and
store, upon determining the at least one offset for the one or more subpixels, the at least one offset for the one or more subpixels associated with each of the plurality of panel measurements,

wherein the at least one offset is represented by S B , where the at least one offset is determined by:

S
B

=

arg
⁢
min

α
∈
A

⁢

(

❘
"\[LeftBracketingBar]"

Assignees

• Qualcomm Inc

Inventors

• Jacobson Natan
• Stan Daniel
• Ikizyan Ike
• Sternberg Mark
• Tang Timothy David
• Li Yan
• Yang Xinchao

Classifications

• G09G2360/16

  Calculation or use of calculated indices related to luminance levels in display data · CPC title

• G09G2320/0233

  Improving the luminance or brightness uniformity across the screen · CPC title

• G09G3/2074

  using sub-pixels · CPC title

• G09G3/006

  Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays (testing individual LED's G01R31/2635; testing lamps G01R31/44; testing of optical features of LCD displays G02F1/1309) · CPC title

• G09G2320/0285

  using tables for spatial correction of display data · CPC title