Laminate and pattern forming method
US-2018107116-A1 · Apr 19, 2018 · US
US12044969B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-12044969-B2 |
| Application number | US-202017438786-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 5, 2020 |
| Priority date | Mar 12, 2019 |
| Publication date | Jul 23, 2024 |
| Grant date | Jul 23, 2024 |
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A resist underlayer film-forming composition revealing high reflow properties while applying and heating the composition on a substrate, allowing a flat application on a multi-level substrate thus forming a flat film. The composition includes a copolymer having a repeating structural unit of the following Formula (1) and/or a repeating structural unit of the following Formula (2) and an organic solvent: (in Formulae (1) and (2), R 1 is a functional group of Formula (3); in Formula (3), Q 1 and Q 2 are each independently a hydrogen atom or a C 1-5 alkyl group, and * is a dangling bond to an oxygen atom; and in Formula (2), X 1 is a C 1-50 organic group, and i and j are each independently 0 or 1).
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The invention claimed is: 1. A resist underlayer film-forming composition comprising a copolymer having a repeating structural unit of the following Formula (1) and/or a repeating structural unit of the following Formula (2) and an organic solvent: (in Formulae (1) and (2), R 1 is a functional group of Formula (3); in Formula (3), Q 1 and Q 2 are each independently a hydrogen atom or a C 1-5 alkyl group, and * is a dangling bond to an oxygen atom; and in Formula (2), X 1 is a C 1-50 organic group, and i and j are each independently 0 or 1). 2. The resist underlayer film-forming composition according to claim 1 , wherein the functional group of Formula (3) is a group of the following Formula (4): (wherein * is a dangling bond to an oxygen atom). 3. The resist underlayer film-forming composition according to claim 1 , wherein, in the repeating structural unit of Formula (2), X 1 is a linear, branched, or cyclic divalent hydrocarbon group having a carbon atom number of 2 to 20, a linear, branched, or cyclic divalent organic group having a carbon atom number of 2 to 20 and at least one sulfur atom or oxygen atom, or a divalent organic group containing at least one C 6-20 aromatic ring or C 3-12 heterocyclic ring, and the heterocyclic ring has at least one sulfur atom or oxygen atom. 4. The resist underlayer film-forming composition according to claim 1 , wherein the copolymer contains a repeating structural unit formed from an R 1 -containing monomer in an amount of 25% or more. 5. The resist underlayer film-forming composition according to claim 1 , wherein the composition further comprises a photo-crosslinking agent. 6. The resist underlayer film-forming composition according to claim 1 , wherein the composition further comprises a compound of the following Formula (5) and/or a compound of the following Formula (6): (wherein X 2 is a carbonyl group or a methylene group; l and m are each independently an integer of 0 to 5 and satisfy a relation of 3≤1+m≤10; R 3 is a C 1-4 alkylene group or alkenylene group or a single bond; k is 0 or 1; and n is an integer of 2 to 4). 7. The resist underlayer film-forming composition according to claim 1 , wherein the composition further comprises a surfactant. 8. A method for producing a resist underlayer film, the method comprising a step of applying the resist underlayer film-forming composition according to claim 1 to a multi-level substrate; and a heating step of thermally curing the composition. 9. The method for producing a resist underlayer film according to claim 8 , wherein the heating temperature in the heating step is 200° ° C. to 300° ° C. 10. The method for producing a resist underlayer film according to claim 9 , wherein the method further comprises a light exposure step. 11. A method for producing a resist underlayer film without a light exposure step, the method comprising a step of applying the resist underlayer film-forming composition according to claim 1 to a multi-level substrate; and a heating step of thermally curing the composition at 250° C. or higher.
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