Photoresist for semiconductor fabrication

US12044966B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12044966-B2
Application numberUS-202318355641-A
CountryUS
Kind codeB2
Filing dateJul 20, 2023
Priority dateSep 30, 2020
Publication dateJul 23, 2024
Grant dateJul 23, 2024

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

An organometallic precursor for extreme ultraviolet (EUV) lithography is provided. An organometallic precursor includes an aromatic di-dentate ligand, a transition metal coordinated to the aromatic di-dentate ligand, and an extreme ultraviolet (EUV) cleavable ligand coordinated to the transition metal. The aromatic di-dentate ligand includes a plurality of pyrazine molecules.

First claim

Opening claim text (preview).

What is claimed is: 1. An organometallic precursor, comprising: an aromatic di-dentate ligand; a transition metal coordinated to the aromatic di-dentate ligand; and an extreme ultraviolet (EUV) cleavable ligand coordinated to the transition metal, wherein the aromatic di-dentate ligand comprises a plurality of pyrazine molecules. 2. The organometallic precursor of claim 1 , wherein the aromatic di-dentate ligand comprises 2,2′-bipyrazine. 3. The organometallic precursor of claim 1 , wherein the transition metal has a high atomic absorption cross section. 4. The organometallic precursor of claim 1 , wherein the transition metal is selected from a group consisting of tin (Sn), bismuth (Bi), antimony (Sb), indium (In), and tellurium (Te). 5. The organometallic precursor of claim 1 , further comprising: poly(2-hydroxyethyl methacrylate) (pHEMA), poly(4-hydroxystyrene) (PHS), polyglycidyl ether, or polyether polyol. 6. The organometallic precursor of claim 1 , wherein the EUV cleavable ligand comprises an alkenyl group or a carboxylate group. 7. The organometallic precursor of claim 1 , wherein the EUV cleavable ligand comprises a fluoro-substitute. 8. An organometallic precursor, comprising: an aromatic di-dentate ligand comprising a first pyrazine ring and a second pyrazine ring; a transition metal coordinated to a nitrogen atom on the first pyrazine ring and a nitrogen atom on the second pyrazine ring; a first EUV cleavable ligand coordinated to the transition metal; and a second EUV cleavable ligand coordinated to the transition metal. 9. The organometallic precursor of claim 8 , wherein the aromatic di-dentate ligand comprises bipyrazine, wherein the first pyrazine ring is connected to the second pyrazine ring. 10. The organometallic precursor of claim 8 , wherein the aromatic di-dentate ligand comprises 2,2′-bipyrazine. 11. The organometallic precursor of claim 8 , wherein the transition metal has a high atomic absorption cross section. 12. The organometallic precursor of claim 8 , wherein the transition metal is selected from a group consisting of tin (Sn) ion, bismuth (Bi) ion, antimony (Sb) ion, indium (In) ion, and tellurium (Te) ion. 13. The organometallic precursor of claim 8 , further comprising: poly(2-hydroxyethyl methacrylate) (pHEMA), poly(4-hydroxystyrene) (PHS), polyglycidyl ether, or polyether polyol. 14. The organometallic precursor of claim 8 , wherein the EUV cleavable ligand comprises an alkenyl group or a carboxylate group. 15. The organometallic precursor of claim 14 , wherein the EUV cleavable ligand comprises a fluoro-substitute. 16. An organometallic precursor, comprising: an aromatic di-dentate ligand; a transition metal coordinated to the aromatic di-dentate ligand; and an extreme ultraviolet (EUV) cleavable ligand coordinated to the transition metal, wherein the aromatic di-dentate ligand comprises a plurality of pyrazine molecules, wherein the transition metal is selected from a group consisting of tin (Sn), bismuth (Bi), antimony (Sb), indium (In), and tellurium (Te). 17. The organometallic precursor of claim 2 , wherein the aromatic di-dentate ligand comprises 2,2′-bipyrazine. 18. The organometallic precursor of claim 1 , further comprising: poly(2-hydroxyethyl methacrylate) (pHEMA), poly(4-hydroxystyrene) (PHS), polyglycidyl ether, or polyether polyol. 19. The organometallic precursor of claim 1 , wherein the EUV cleavable ligand comprises an alkenyl group or a carboxylate group. 20. The organometallic precursor of claim 1 , wherein the EUV cleavable ligand comprises a fluoro-substitute.

Assignees

Inventors

Classifications

  • Treatment before imagewise removal, e.g. prebaking {(G03F7/265 takes precedence)} · CPC title

  • G03F7/0042Primary

    with inorganic or organometallic light-sensitive compounds not otherwise provided for, e.g. inorganic resists (G03F7/075 takes precedence) · CPC title

  • G03F7/40Primary

    Treatment after imagewise removal, e.g. baking · CPC title

  • C07F5/00Primary

    Compounds containing elements of Groups 3 or 13 of the Periodic Table · CPC title

  • Compounds containing elements of Groups 6 or 16 of the Periodic Table · CPC title

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What does patent US12044966B2 cover?
An organometallic precursor for extreme ultraviolet (EUV) lithography is provided. An organometallic precursor includes an aromatic di-dentate ligand, a transition metal coordinated to the aromatic di-dentate ligand, and an extreme ultraviolet (EUV) cleavable ligand coordinated to the transition metal. The aromatic di-dentate ligand includes a plurality of pyrazine molecules.
Who is the assignee on this patent?
Taiwan Semiconductor Mfg Co Ltd
What technology area does this patent fall under?
Primary CPC classification G03F7/0042. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jul 23 2024 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 5 related publications on this page (citations in our corpus or others sharing the same primary CPC).