Robotic systems for rapid ultrasonic surface inspection

Patent metadata

Field	Value
Publication number	US-12038412-B2
Application number	US-202217824656-A
Country	US
Kind code	B2
Filing date	May 25, 2022
Priority date	Apr 22, 2021
Publication date	Jul 16, 2024
Grant date	Jul 16, 2024

Abstract

Robotic systems for rapid ultrasonic surface inspection are described. An example system may have an inspection robot to move in a direction of travel on an inspection surface. The robot may have a payload with a first and a second ultrasonic (UT) phased array, and a rastering device that executes a reciprocating motion of the payload. The system may have an inspection controller with a positioning circuit to provide an inspection position command, an inspection circuit to provide a rastering position command and an interrogation command. The robot is responsive to the inspection position command to move to an inspection position, and the rastering device is responsive to the rastering position command to move the payload through at least a portion of a range of reciprocating motion. The UT phased arrays are responsive to the interrogation command to perform an inspection on three axes of inspection.

First claim

What is claimed:

1. A system, comprising:
an inspection robot structured to move in a direction of travel on an inspection surface, the inspection robot including:
a first payload including a first ultrasonic (UT) phased array and a second UT phased array, the first UT phased array and second UT phased array being arranged in a first parallel configuration;
a first rastering device structured to move the first payload in a first direction of inspection, the first direction of inspection being distinct from the direction of travel, and the first direction of inspection being distinct from a direction of the first parallel configuration;
a second payload including a third UT phased array and a fourth UT phased array arranged in a second parallel configuration;
a second rastering device structured to move the second payload in a second direction of inspection, the second direction of inspection being distinct from the direction of travel, and the second direction of inspection being distinct from a direction of the second parallel configuration; and
an inspection controller, the inspection controller comprising:
an inspection circuit structured to provide an interrogation command to implement a synchronous mode inspection,
wherein the synchronous mode inspection includes coordinating movement between the first payload and the second payload by the first rastering device and the second rastering device, and
wherein the first rastering device and the second rastering device are each responsive to the interrogation command.

2. The system of claim 1 , wherein the first and second directions of inspection are orthogonal to the direction of travel and parallel with the inspection surface.

3. The system of claim 2 , wherein the first and second directions of inspection are mirrored relative to an axis orthogonal to the direction of travel.

4. The system of claim 1 , wherein the first and second directions of inspection are parallel.

5. The system of claim 1 , the inspection controller further comprising:
a positioning circuit structured to position the inspection robot at a selected inspection position; and
the inspection circuit structured to provide the interrogation command in response to the inspection robot being positioned at the selected inspection position.

6. The system of claim 5 , wherein the synchronous mode inspection further comprises a position coordination profile between the first rastering device and the second rastering device.

7. The system of claim 5 , wherein the synchronous mode inspection further comprises a velocity coordination profile between the first rastering device and the second rastering device.

8. The system of claim 5 , wherein the synchronous mode inspection further comprises a time based coordination of operations of the first rastering device and the second rastering device.

9. The system of claim 5 , wherein the inspection circuit is further structured to provide the interrogation command to implement an asynchronous mode inspection.

10. The system of claim 1 , wherein the synchronous mode inspection includes moving the first payload in the first direction of inspection and moving the second payload in the second direction of inspection while maintaining a selected distance between the first payload and the second payload.

11. The system of claim 10 , wherein the selected distance varies.

12. The system of claim 1 , wherein the synchronous mode inspection includes mitigating a force on the inspection robot orthogonal to the inspection of travel based on a combined movement of the first payload and the second payload, and the mitigating the force includes moving the first payload and the second payload in opposite directions.

13. A method for surface inspection, the method comprising:
positioning an inspection robot at a selected inspection position, wherein the inspection robot includes a first rastering device structured to move a first payload in a first direction of inspection and a second rastering device structured to move a second payload in a second direction of inspection;
providing an interrogation command to implement a synchronous mode inspection in response to the inspection robot being positioned at the selected inspection position,
wherein the synchronous mode inspection includes coordinating movement between the first payload and the second payload by the first rastering device and the second rastering device, and
wherein the first rastering device and the second rastering device are each responsive to the interrogation command.

14. The method of claim 13 , further comprising providing the interrogation command to implement an asynchronous mode inspection.

15. The method of claim 13 , further comprising coordinating velocities between a first and second payload.

Assignees

• Gecko Robotics Inc

Inventors

• David Chase
• Aparicio Jose
• Mora Juan Roberto Mendoza
• Low Kevin Y
• Demmer Troy
• Bryner Edward A
• Corl Scott Ashley

Classifications

• G01N2291/0289

  Internal structure, e.g. defects, grain size, texture · CPC title

• G01N29/04

  Analysing solids (using acoustic emission techniques G01N29/14) · CPC title

• G01N29/043

  in the interior, e.g. by shear waves · CPC title

• G01N29/07

  by measuring propagation velocity or propagation time of acoustic waves · CPC title

• G01N29/262

  by electronic orientation or focusing, e.g. with phased arrays (phased arrays per se G10K11/34) · CPC title