Systems and methods for performing multiple precurser, neutral loss and product ion scans in a single ion trap

Patent metadata

Field	Value
Publication number	US-12027355-B2
Application number	US-202318142212-A
Country	US
Kind code	B2
Filing date	May 2, 2023
Priority date	Jul 27, 2017
Publication date	Jul 2, 2024
Grant date	Jul 2, 2024

Abstract

The invention generally relates to systems and methods for performing multiple precursor, neutral loss and product ion scans in a single ion trap. In certain aspects, the invention provides systems including a mass spectrometer having a single ion trap, and a central processing unit (CPU), and storage coupled to the CPU for storing instructions that when executed by the CPU cause the system to apply at least one of the following ion scans to a single ion population in the single ion trap: multiple precursor ion scans, a plurality of segmented neutral loss scans, or multiple simultaneous neutral loss scans.

First claim

What is claimed is:

1. A system comprising:
a mass spectrometer comprising a single ion trap; and
a central processing unit (CPU), and storage coupled to the CPU for storing instructions that when executed by the CPU cause the system to apply at least one of the following ion scans to a single ion population in the single ion trap and prior to an ejection event: multiple precursor ion scans, a plurality of segmented neutral loss scans, or multiple simultaneous neutral loss scans.

2. The system according to claim 1 , wherein the multiple precursor ion scans are applied sequentially to the single ion population.

3. The system according to claim 1 , wherein the multiple precursor ion scans are applied simultaneously to the single ion population.

4. The system according to claim 1 , wherein the ion scans are multiple precursor ion scans, and the CPU is configured to cause the system to apply at least one additional scan to the single ion trap.

5. The system according to claim 4 , wherein the at least one additional scan is a neutral loss scan.

6. The system according to claim 5 , wherein the CPU causes the system to apply the neutral loss scan simultaneously with the multiple precursor ion scans.

7. The system according to claim 5 , wherein the CPU causes the system to apply the neutral loss scan sequentially with the multiple precursor ion scans.

8. The system according to claim 4 , wherein the at least one additional scan is one or more product ion scans, wherein the CPU is configured to perform the at least one additional scan after the CPU performs the multiple precursor ion scans.

9. A method for analyzing a single ion population, the method comprising;
generating a single ion population that is transferred into a single ion trap of a mass spectrometer; and
applying, via a CPU operably associated with the mass spectrometer, at least one of the following ion scans to the single ion population in the single ion trap and prior to an ejection event: multiple precursor ion scans, a plurality of segmented neutral loss scans, or multiple simultaneous neutral loss scans.

10. The method according to claim 9 , wherein the multiple precursor ion scans are applied sequentially to the single ion population.

11. The method according to claim 9 , wherein the multiple precursor ion scans are applied simultaneously to the single ion population.

12. The method according to claim 9 , wherein the ion scans are multiple precursor ion scans and the method further comprises applying, via the CPU operably associated with the mass spectrometer, at least one additional scan to the single ion trap.

13. The method according to claim 12 , wherein the at least one additional scan is a neutral loss scan.

14. The method according to claim 13 , wherein the neutral loss scan is applied simultaneously with the multiple precursor ion scans.

15. The method according to claim 13 , wherein the neutral loss scan is applied sequentially with the multiple precursor ion scans.

16. The method according to claim 12 , wherein the at least one additional scan is one or more product ion scans, which are performed after the multiple precursor ion scans.

17. The method according to claim 12 , wherein the at least one additional scan is a product ion scan.

18. The method according to claim 12 , wherein the at least one additional scan is a plurality of segmented neutral loss scans.

19. A method for analyzing a sample, the method comprising;
generating a single ion population from a sample that is transferred into a single ion trap of a mass spectrometer; and
applying, via a CPU operably associated with the mass spectrometer, at least one of the following ion scans to the single ion population in the single ion trap and prior to an ejection event: multiple precursor ion scans, a plurality of segmented neutral loss scans, or multiple simultaneous neutral loss scans, thereby analyzing the sample.

20. The method according to claim 19 , wherein the sample is selected from the group consisting of: a biological sample, an agricultural sample, an industrial sample, an environmental sample, and a combination thereof.

Assignees

• Purdue Research Foundation

Inventors

• Cooks Robert Graham
• Snyder Dalton

Classifications

• H01J49/0081 Primary

  Tandem in time, i.e. using a single spectrometer · CPC title

• H01J49/004

  Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn · CPC title

• H01J49/0013

  Miniaturised spectrometers, e.g. having smaller than usual scale, integrated conventional components · CPC title

• H01J49/0027 Primary

  Methods for using particle spectrometers · CPC title