Method and apparatus for automated test plan generation to measure a measurement object

Patent metadata

Field	Value
Publication number	US-12019958-B2
Application number	US-202016950629-A
Country	US
Kind code	B2
Filing date	Nov 17, 2020
Priority date	May 17, 2018
Publication date	Jun 25, 2024
Grant date	Jun 25, 2024

Abstract

A method for generating a test plan for testing a measurement object includes obtaining a data record representing the measurement object. The method includes setting a reference structure based on the data. The method includes assigning at least one reference structure-specific test feature to the reference structure. A test is carried out based on data for the data record representing the measurement object as to whether structures that are similar to or the same as the reference structure are present. The reference structure-specific test feature is assigned to each similar or same structure as the structure-specific test feature. The method includes generating the test plan to include the structure-specific test features.

First claim

What is claimed is:

1. A computer-implemented method for controlling a measuring device, the computer-implemented method comprising:
obtaining a data record representing a measurement object;
setting a reference structure based on the data;
assigning at least one reference structure-specific test feature to the reference structure, wherein:
a test is carried out based on data for the data record representing the measurement object as to whether structures that are similar to or identical to the reference structure are present, and
the reference structure-specific test feature is assigned to each similar or identical structure as the structure-specific test feature;

generating a test plan to include the structure-specific test features; and
controlling the measuring device to perform a measurement procedure based on the test plan to capture measurement points of the measurement object.

2. The computer-implemented method of claim 1 , wherein at least one geometric element is assigned to the reference structure, wherein the reference structure-specific test feature is determined based on the at least one geometric element.

3. The computer-implemented method of claim 2 , wherein the data record representing the measurement object is at least one of (i) generated by measuring the measurement object represented by the data record and (ii) a target data record.

4. The computer-implemented method of claim 1 , wherein the data record representing the measurement object is at least one of (i) generated by measuring the measurement object represented by the data record and (ii) a target data record.

5. The computer-implemented method of claim 1 , wherein:
a test is carried out based on data for a further data record representing the measurement object or a further measurement object as to whether structures that are similar to or identical to the reference structure are present;
the reference structure-specific test feature is assigned to each similar or identical structure; and
the test plan is generated to include the reference structure-specific test features.

6. The computer-implemented method of claim 5 , wherein the further data record is generated by measuring at least one of the measurement object and another measurement object of a same kind as the measurement object.

7. The computer-implemented method of claim 6 , wherein a criterion for determining the similarity of structures in a target data record is more stringent than a criterion for determining the similarity of structures in a data record generated by measurement.

8. The computer-implemented method of claim 5 , wherein structure-specific position information items and/or orientation information items known in advance or determined in advance are taken into account during the test based on data as to whether structures that are similar to or identical to the reference structure are present in the further data record.

9. The computer-implemented method of claim 6 , wherein structure-specific position information items and/or orientation information items known or determined in advance are taken into account during the test based on data as to whether structures that are similar to or identical to the reference structure are present in the further data record.

10. The computer-implemented method of claim 1 , wherein the data record representing the measurement object is a three-dimensional data record.

11. The computer-implemented method of claim 1 , wherein the data record representing the measurement object is a two-dimensional data record.

12. The computer-implemented method of claim 1 , wherein the data record is an image data record.

13. The computer-implemented method of claim 1 , wherein a test feature is assigned to the reference structure based on an assignment known in advance and/or in that a geometric element is assigned to the reference structure based on an assignment known in advance.

14. The computer-implemented method of claim 1 , wherein a criterion for determining the similarity of structures in a target data record is more stringent than a criterion for determining the similarity of structures in a data record generated by measurement.

15. The computer-implemented method of claim 1 , wherein the method is carried out as a simulation.

16. The computer-implemented method of claim 1 , further comprising testing the measurement object in accordance with the test plan.

17. A non-transitory computer-readable medium comprising processor-executable instructions that embody the computer-implemented method of claim 1 .

18. The computer-implemented method of claim 1 wherein the measuring device includes a coordinate measuring machine.

19. An apparatus comprising:
an interface;
an evaluation device communicatively coupled with the interface; and
a measuring device communicatively coupled with the interface and the evaluation device and configured to capture measurement points of a measurement object,
wherein:
the interface is configured to read a data record representing the measurement object,
the evaluation device is configured to set a reference structure based on data,
the evaluation device is configured to assign at least one reference structure-specific test feature to the reference structure,
the evaluation device is configured to test, based on data for the data record representing the measurement object, whether structures similar to or identical to the reference structure are present,
the evaluation device is configured to assign the reference structure-specific test feature to each similar or identical structure as a structure-specific test feature,
the evaluation device is configured to generate a test plan including the structure-specific test features, and
the measuring device is configured to perform a measurement procedure based on the test plan to capture the measurement points of the measurement object; and
a control device configured to control the measuring device to test the measurement object in accordance with the test plan.

Assignees

• Zeiss Carl Industrielle Messtechnik Gmbh

Inventors

• Mayr Adam Ana Carolina
• Rieger Stephan
• Mayer Florian

Classifications

• G06F30/10

  Geometric CAD · CPC title

• G06F30/20 Primary

  Design optimisation, verification or simulation (optimisation, verification or simulation of circuit designs G06F30/30) · CPC title

• G01B21/04 Primary

  by measuring coordinates of points · CPC title