Testing method and testing device

US12019529B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12019529-B2
Application numberUS-202118006768-A
CountryUS
Kind codeB2
Filing dateJul 30, 2021
Priority dateJul 31, 2020
Publication dateJun 25, 2024
Grant dateJun 25, 2024

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  5. First independent claim

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Abstract

Official abstract text for this publication.

The present disclosure provides a testing method and a testing device. The testing method includes: configuring one or more testing parameters for a to-be-tested object, and performing at least two testing processes to obtain a testing value of each performance index for each testing process, each of the at least two testing processes being used to test different performance index of the to-be-tested object or to test different performance indices of the to-be-tested object; and generating a testing result of the to-be-tested object in accordance with the testing value of each performance index for each testing process. According to the present disclosure, it is able to perform the multi-dimensional test, thereby to meet the requirement on the performance indices in different scenarios, improve the testing efficiency, and increase the reliability of the testing result for true performance of a terminal.

First claim

Opening claim text (preview).

What is claimed is: 1. A testing method, comprising: configuring one or more testing parameters for a to-be-tested object, and performing at least two testing processes to obtain testing value(s) of each of performance index(es) for each testing process, each of the at least two testing processes being used to test the performance index(es) of the to-be-tested object which is/are different from the other performance index(es) of the to-be-tested object being obtained by the other testing process(es); and generating a testing result of the to-be-tested object in accordance with the testing value(s) of each of the performance index(es) for each testing process, wherein the configuring the one or more testing parameters for the to-be-tested object and performing at least two testing processes to obtain the testing value(s) of each of the performance index(es) for each testing process comprises performing test for at least one round, and in each round, the one or more testing parameters are configured for the to-be-tested object and performance index threshold(s) is/are set, wherein the at least two testing processes are performed in parallel in each round, wherein when the at least two testing processes are performed in parallel in each round, the performing a current testing process comprises: configuring a second testing parameter for the to-be-tested object, setting performance index threshold(s) corresponding to each testing process, and performing the at least two testing processes in parallel so as to obtain the testing value(s) of each of the performance index(es) for each testing process, a value of the second testing parameter being an initial value or a value adjusted after the test in a previous round is terminated; and determining whether each testing process passes the test in accordance with the testing value(s) of each of the performance index(es) obtained in each testing process and the performance index threshold(s). 2. The testing method according to claim 1 , wherein the generating the testing result of the to-be-tested object in accordance with the testing value(s) of each of the performance index(es) for each testing process comprises: terminating the test in the current round when any testing process in the current round fails to pass the test; or terminating the test in the current round when all the testing processes in the current round pass the test. 3. The testing method according to claim 2 , wherein the generating the testing result of the to-be-tested object in accordance with the testing value(s) of each of the performance index(es) for each testing process comprises: when the test in the current round is terminated and all the testing processes pass the test, determining that the test in the current round passes; or, when the test in the current round is terminated and there are one or more testing processes which fail to pass the test, determining that the test in the current round fails; or wherein the generating the testing result of the to-be-tested object in accordance with the testing value(s) of each of the performance index(es) for each testing process further comprises: outputting the testing value(s) of each performance index(es) obtained in the current round, when the test in the current round is terminated. 4. The testing method according to claim 1 , wherein the at least two testing processes comprise a first testing process and a second testing process, and there is an association relationship between a performance index measured in the first testing process and a performance index measured in the second testing process, wherein the association relationship comprises at least one of: that the performance index measured in the first testing process is positively associated with the performance index measured in the second testing process, that the performance index measured in the first testing process is negatively associated with the performance index measured in the second testing process, or the performance index measured in the first testing process and the performance index measured in the second testing process are in a mutual cause-effect relation. 5. The testing method according to claim 1 , further comprising: determining a target performance index in a target application scenario in accordance with a first mapping relationship between an application scenario and the performance index(es) of the to-be-tested object; determining a target testing parameter corresponding to the target performance index in accordance with a second mapping relationship between the performance index(es) and the one or more testing parameters of the to-be-tested object; and generating the at least two testing processes for measuring the target performance index in accordance with the target testing parameter. 6. The testing method according to claim 1 , wherein the generating the testing result of the to-be-tested object in accordance with the testing value(s) of each of the performance index(es) for each testing process comprises: forming a polygon with the performance index measured in each testing process as a vertex; taking a line connecting a center and each vertex of the polygon as a scale line, and marking a numerical value of a corresponding performance index on the scale line; determining a corresponding threshold point on the scale line in accordance with performance index threshold(s) for each performance index, and connecting the threshold points on adjacent scale lines sequentially to generate a threshold region corresponding to the performance index threshold(s); determining a corresponding testing value point on the scale line in accordance with the testing value(s) of each of the performance index(es) for each testing process, and connecting the testing value points on the adjacent scale lines sequentially to generate a testing value region corresponding to the testing value of the performance index; and obtaining the testing result indicating whether the to-be-tested object has passed the test in accordance with whether the threshold region is comprised in the testing value region. 7. The testing method according to claim 6 , wherein the obtaining the testing result indicating whether the to-be-tested object has passed the test in accordance with whether the threshold region is comprised in the testing value region comprises: when an entire threshold region is comprised in the testing value region, obtaining the testing result indicating that the to-be-tested object has passed the test, otherwise obtaining the testing result indicating that the to-be-tested object fails to pass the test. 8. A testing device, comprising a transceiver and a processor, wherein the transceiver is configured to configure one or more testing parameters for a to-be-tested object, wherein the processor is configured to: perform at least two testing processes to obtain testing value(s) of each of the performance index(es) for each testing process, each of the at least two testing processes being used to test the performance index(es) of the to-be-tested object which is/are different from the other performance index(es) of the to-be-tested object being obtained by the other testing process(es)object; and generate a testing result of the to-be-tested object in accordance with the testing value(s) of each of the performance index(es) for each testing process, wherein the processor is further configured to perform test for at least one round, and in each round, the one or more testing parameters are configured for the to-be-tested object and performance index threshold(s) is/are set, wherein the processor is further configured to perform the at least two testing processes in parallel in each round, wherein when the at l

Assignees

Inventors

Classifications

  • Threshold · CPC title

  • Monitoring arrangements determined by the means or processing involved in reporting the monitored data (error or fault reporting or logging G06F11/0766) · CPC title

  • where the monitored property is the power consumption (power management in a computing system G06F1/3203) · CPC title

  • for performance assessment · CPC title

  • measuring at different reception times · CPC title

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Frequently asked questions

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What does patent US12019529B2 cover?
The present disclosure provides a testing method and a testing device. The testing method includes: configuring one or more testing parameters for a to-be-tested object, and performing at least two testing processes to obtain a testing value of each performance index for each testing process, each of the at least two testing processes being used to test different performance index of the to-be-…
Who is the assignee on this patent?
China Mobile Comm Co Ltd Res Inst, China Mobile Communications Group Co Ltd
What technology area does this patent fall under?
Primary CPC classification G06F11/2289. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jun 25 2024 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 5 related publications on this page (citations in our corpus or others sharing the same primary CPC).