Utensil for evaluating length measurement error in X-ray CT device for three-dimensional shape measurement

Patent metadata

Field	Value
Publication number	US-11998382-B2
Application number	US-202217678726-A
Country	US
Kind code	B2
Filing date	Feb 23, 2022
Priority date	Apr 21, 2017
Publication date	Jun 4, 2024
Grant date	Jun 4, 2024

Abstract

In order to sufficiently capture spatial distortion specific to an X-ray CT device and evaluate the three-dimensional shape measurement accuracy of the X-ray CT device, in a utensil, by attaching support rods fixing spheres to the tip thereof and having different lengths to a base spheres are arranged in an XYZ space on the base. On a flat surface on the top of the base, the support rods supporting the spheres and having different lengths are arranged at predetermined intervals. In doing so, the spheres are arranged in the XYZ space respectively at appropriate inter-sphere distances.

First claim

The invention claimed is:

1. A utensil for evaluating a length measurement error in an X-ray CT device for three-dimensional shape measurement, which utensil is positioned for use on a rotation stage of the X-ray CT device for three-dimensional shape measurement such that a Z axis as a rotation axis of the rotation stage coincides with a center of a cylindrical imaging space, the utensil comprising:
a base; and
multiple spheres arranged in an XYZ space on the base corresponding to the imaging space, wherein:
the multiple spheres include an outer circumference side sphere arranged on one outer circumferential circle around the Z axis in each of multiple X-Y planes having different Z positions;
a radius of an outer circumferential circle on which the outer circumference side sphere is arranged in each of the multiple X-Y planes is same and coordinates (X, Y) of an outer circumference side sphere arranged in all of the multiple X-Y planes are different; and
multiple outer circumference side spheres include two sets of two spheres symmetrically arranged with respect to the Z axis.

2. A utensil for evaluating a length measurement error in an X-ray CT device for three-dimensional shape measurement, which utensil is positioned for use on a rotation stage of the X-ray CT device for three-dimensional shape measurement such that a Z axis as a rotation axis of the rotation stage coincides with a center of a cylindrical imaging space, the utensil comprising:
a base; and
multiple spheres arranged in an XYZ space on the base corresponding to the imaging space, wherein:
the multiple spheres include multiple outer circumference side spheres arranged on one outer circumferential circle around the Z axis in each of multiple X-Y planes having different Z positions;
a radius of an outer circumferential circle on which the multiple outer circumference side spheres are arranged in each of the multiple X-Y planes is same and coordinates (X, Y) of multiple outer circumference side spheres arranged in all of the multiple X-Y planes are different; and
the multiple outer circumference side spheres include two sets of two spheres symmetrically arranged with respect to the Z axis.

3. A utensil for evaluating a length measurement error in an X-ray CT device for three-dimensional shape measurement, which utensil is positioned for use on a rotation stage of the X-ray CT device for three-dimensional shape measurement such that a Z axis as a rotation axis of the rotation stage coincides with a center of a cylindrical imaging space, the utensil comprising:
a base; and
multiple spheres arranged in an XYZ space on the base corresponding to the imaging space, wherein:
the multiple spheres include an outer circumference side sphere arranged on one outer circumferential circle around the Z axis in each of multiple X-Y planes having different Z positions;
a radius of an outer circumferential circle on which the outer circumference side sphere is arranged in each of the multiple X-Y planes is same and coordinates (X, Y) of an outer circumference side sphere arranged in all of the multiple X-Y planes are different; and
multiple outer circumference side spheres are arranged in each X-Y plane such that a projection position on a reference X-Y plane whose z-coordinate is zero is put at regular intervals along one circle around the Z axis.

4. A utensil for evaluating a length measurement error in an X-ray CT device for three-dimensional shape measurement, which utensil is positioned for use on a rotation stage of the X-ray CT device for three-dimensional shape measurement such that a Z axis as a rotation axis of the rotation stage coincides with a center of a cylindrical imaging space, the utensil comprising:
a base; and
multiple spheres arranged in an XYZ space on the base corresponding to the imaging space, wherein:
the multiple spheres include multiple outer circumference side spheres arranged on one outer circumferential circle around the Z axis in each of multiple X-Y planes having different Z positions;
a radius of an outer circumferential circle on which the multiple outer circumference side spheres are arranged in each of the multiple X-Y planes is same and coordinates (X, Y) of multiple outer circumference side spheres arranged in all of the multiple X-Y planes are different; and
multiple outer circumference side spheres are arranged in each X-Y plane such that a projection position on a reference X-Y plane whose z-coordinate is zero is put at regular intervals along one circle around the Z axis.

Assignees

• Shimadzu Corp
• Aist

Inventors

• Kishi Taketo
• Sato Makoto
• Takatsuji Toshiyuki
• Abe Makoto
• Fujimoto Hiroyuki

Classifications

• A61B6/583 Primary

  using calibration phantoms · CPC title

• A61B6/032

  Transmission computed tomography [CT] · CPC title

• A61B90/06

  Measuring instruments not otherwise provided for · CPC title

• A61B2090/061

  for measuring dimensions, e.g. length · CPC title

• G01B15/04 Primary

  for measuring contours or curvatures · CPC title