Optical voltage probe

US11994539B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11994539-B2
Application numberUS-202117770292-A
CountryUS
Kind codeB2
Filing dateMar 26, 2021
Priority dateApr 7, 2020
Publication dateMay 28, 2024
Grant dateMay 28, 2024

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

An optical voltage probe includes: an optical modulator 1 having two modulation electrodes 11 and 12, the optical modulator 1 being configured to modulate an intensity of an incident light depending on a voltage between the two modulation electrodes and output the incident light which is modulated; an input/output optical fiber 2 connected with the optical modulator 1; two contact terminal attachment portions 5, 6 to which contact terminals 3, 4 can be detachably attached and contacted, the two contact terminals 3, 4 being configured to be in contact with the points to be measured, the two contact terminal attachment portions 5, 6 being respectively connected with the modulation electrodes 11, 12; and a package 8 that houses the optical modulator 1 and a part of the input/output optical fiber 2. A voltage signal induced via the contact terminals 3, 4 is converted into an optical intensity modulation signal. When an electric wave having a measurement frequency is applied while the contact terminal attachment portions 5, 6 are opened, the package 8 exhibits a shielding effect of attenuating the electric wave by 15 dB or more compared to an output signal intensity measured without providing the package.

First claim

Opening claim text (preview).

The invention claimed is: 1. An optical voltage probe comprising: an optical modulator having at least two modulation electrodes, the optical modulator being configured to modulate an intensity of an incident light depending on a voltage between the two modulation electrodes and output the incident light which is modulated; an input optical fiber that is connected with the optical modulator; an output optical fiber that is connected with the optical modulator; two contact terminals or two contact terminal attachment portions to which the two contact terminals can be detachably attached and contacted, the two contact terminals being connected with the two modulation electrodes and configured to be in contact with points to be measured; a package that houses the optical modulator, a part of the input optical fiber and a part of the output optical fiber, wherein a voltage signal induced between the two modulation electrodes via the two contact terminals is converted into an optical intensity modulation signal by the optical modulator and the optical intensity modulation signal is outputted through the output optical fiber so that the voltage signal induced between the two modulation electrodes is measured based on the optical intensity modulation signal, the package has a layered or sheet-shaped metal body covering an inside of the package, and when an electric wave having a measurement frequency is applied while the two contact terminals or the two contact terminal attachment portions are opened, the package exhibits a shielding effect of attenuating the electric wave by 15 dB or more compared to an output signal intensity measured without providing the package. 2. An optical voltage probe comprising: an optical modulator having at least two modulation electrodes, the optical modulator being configured to modulate an intensity of an incident light depending on a voltage between the two modulation electrodes and output the incident light which is modulated; an input optical fiber that is connected with the optical modulator; an output optical fiber that is connected with the optical modulator; two contact terminal attachment portions to which two contact terminals can be detachably attached and contacted, the two contact terminals being connected with the two modulation electrodes and configured to be in contact with the points to be measured; and a package that houses the optical modulator, a part of the input optical fiber and a part of the output optical fiber, wherein the two contact terminal attachment portions are installed inner than a position of a surface of the package, a voltage signal induced between the two modulation electrodes via the two contact terminal is converted into an optical intensity modulation signal by the optical modulator and the optical intensity modulation signal is outputted through the output optical fiber so that the voltage signal induced between the two modulation electrodes is measured based on the optical intensity modulation signal, and when an electric wave having a measurement frequency is applied while the two contact terminal attachment portions are opened, the package exhibits a shielding effect of attenuating the electric wave by 15 dB or more compared to an output signal intensity measured without providing the package. 3. An optical voltage probe comprising: an optical modulator having at least two modulation electrodes, the optical modulator being configured to modulate an intensity of an incident light depending on a voltage between the two modulation electrodes and output the incident light which is modulated; an input optical fiber that is connected with the optical modulator; an output optical fiber that is connected with the optical modulator; two contact terminals or two contact terminal attachment portions to which the two contact terminals can be detachably attached and contacted, the two contact terminals being connected with the two modulation electrodes and configured to be in contact with points to be measured; a package that houses the optical modulator, a part of the input optical fiber and a part of the output optical fiber, wherein a voltage signal induced between the two modulation electrodes via the two contact terminals is converted into an optical intensity modulation signal by the optical modulator and the optical intensity modulation signal is outputted through the output optical fiber so that the voltage signal induced between the two modulation electrodes is measured based on the optical intensity modulation signal, the package includes an electric wave absorber for reducing a reflection of an electromagnetic wave arrived from an outside of the package and reflected by the package, and when an electric wave having a measurement frequency is applied while the two contact terminals or the two contact terminal attachment portions are opened, the package exhibits a shielding effect of attenuating the electric wave by 15 dB or more compared to an output signal intensity measured without providing the package. 4. The optical voltage probe according to claim 3 , wherein the electric wave absorber is a sheet-shaped electric wave absorber provided on a surface of the package. 5. The optical voltage probe according to claim 3 , wherein the package exhibits the shielding effect by reducing a transmission of the electric wave by the electric wave absorber. 6. The optical voltage probe according to claim 1 , wherein an interval between the two contact terminals or between the two contact terminal attachment portions is 3 mm or more. 7. The optical voltage probe according to claim 1 , wherein the optical modulator is a branch interference type optical modulator using an optical waveguide formed on a lithium niobate crystal substrate. 8. The optical voltage probe according to claim 7 , wherein the optical modulator is a reflection type optical modulator where the incident light is reflected inside the optical modulator to change a direction of the incident light, and the input optical fiber and the output optical fiber are formed by one input/output optical fiber. 9. The optical voltage probe according to claim 7 , wherein at least one electrode capacitively coupled with the two modulation electrodes is provided between the two modulation electrodes. 10. The optical voltage probe according to claim 4 , wherein the package exhibits the shielding effect by reducing a transmission of the electric wave by the electric wave absorber. 11. The optical voltage probe according to claim 2 , wherein an interval between the two contact terminals or between the two contact terminal attachment portions is 3 mm or more. 12. The optical voltage probe according to claim 3 , wherein an interval between the two contact terminals or between the two contact terminal attachment portions is 3 mm or more. 13. The optical voltage probe according to claim 2 , wherein the optical modulator is a branch interference type optical modulator using an optical waveguide formed on a lithium niobate crystal substrate. 14. The optical voltage probe according to claim 3 , wherein the optical modulator is a branch interference type optical modulator using an optical waveguide formed on a lithium niobate crystal substrate. 15. The optical voltage probe according to claim 4 , wherein the optical modulator is a branch interference type optical modulator using an optical waveguide formed on a lithium niobate crystal substrate. 16. The optical voltage probe according to claim 5 , wherein the optical modulator is a branch interfer

Assignees

Inventors

Classifications

  • G01R15/22Primary

    using light-emitting devices, e.g. LED, optocouplers {(G01R31/31901 takes precedence)} · CPC title

  • Measuring voltage only · CPC title

  • Operation of the cell; Circuit arrangements (G02F1/05 takes precedence) · CPC title

  • G02F1/035Primary

    in an optical waveguide structure · CPC title

  • in optical fibres · CPC title

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Frequently asked questions

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What does patent US11994539B2 cover?
An optical voltage probe includes: an optical modulator 1 having two modulation electrodes 11 and 12, the optical modulator 1 being configured to modulate an intensity of an incident light depending on a voltage between the two modulation electrodes and output the incident light which is modulated; an input/output optical fiber 2 connected with the optical modulator 1; two contact terminal atta…
Who is the assignee on this patent?
Seiko Giken Kk, Rohm Co Ltd
What technology area does this patent fall under?
Primary CPC classification G01R15/22. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue May 28 2024 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).