Method for measuring concentration of fluorine gas in halogen fluoride-containing gas using mass spectrometer

US11984308B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11984308-B2
Application numberUS-202017608527-A
CountryUS
Kind codeB2
Filing dateNov 12, 2020
Priority dateNov 27, 2019
Publication dateMay 14, 2024
Grant dateMay 14, 2024

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A method for measuring the concentration of fluorine gas (F 2 ) contained in a halogen fluoride-containing gas using an analysis apparatus having a halogen fluoride-containing gas supply source, a fluorine-containing gas supply source, a tube, a capillary, and a mass spectrometer, the method including, before measuring the concentration of fluorine gas, performing passivation treatment on the tube and the capillary using a passivation gas containing a fluorine-containing gas supplied from the fluorine-containing gas supply source.

First claim

Opening claim text (preview).

The invention claimed is: 1. A method for measuring a concentration of fluorine gas (F2) contained in a halogen fluoride-containing gas by using an analysis apparatus having a halogen fluoride-containing gas supply source, a fluorine-containing gas supply source, a tube, a capillary, and a mass spectrometer, the method comprising: before measuring the concentration of fluorine gas, performing passivation treatment on the tube and the capillary by using a passivation gas containing a fluorine-containing gas supplied from the fluorine-containing gas supply source. 2. The method for measuring a concentration of fluorine gas according to claim 1 , wherein the fluorine-containing gas is at least one kind of gas selected from the group consisting of F 2 , HF, NF 3 , SF 6 , and a halogen fluoride. 3. The method for measuring a concentration of fluorine gas according to claim 1 , wherein a temperature used to perform the passivation treatment is 70 to 500° C. 4. The method for measuring a concentration of fluorine gas according to claim 1 , wherein time to perform the passivation treatment is 1 to 5 hours. 5. The method for measuring a concentration of fluorine gas according to claim 1 , wherein a concentration of the fluorine-containing gas in the passivation gas is 8 to 100 volume %. 6. The method for measuring a concentration of fluorine gas according to claim 5 , wherein the analysis apparatus further has a diluent gas supply source, and adjusts the concentration of the fluorine-containing gas in the passivation gas by using a diluent gas supplied from the diluent gas supply source. 7. The method for measuring a concentration of fluorine gas according to claim 6 , wherein the diluent gas is at least one selected from helium, argon, nitrogen gas (N 2 ), carbon dioxide, and carbon tetrafluoride. 8. The method for measuring a concentration of fluorine gas according to claim 1 , wherein a halogen fluoride contained in the halogen fluoride-containing gas is at least one selected from the group consisting of chlorine fluoride, chlorine trifluoride, bromine fluoride, bromine trifluoride, bromine pentafluoride, iodine fluoride, iodine trifluoride, iodine pentafluoride, and iodine heptafluoride. 9. An apparatus for measuring a concentration of fluorine gas, the apparatus comprising: a halogen fluoride-containing gas supply source; a fluorine-containing gas supply source; a tube; a capillary; and a mass spectrometer, wherein the tube and the capillary have been subjected to passivation treatment with a passivation gas containing a fluorine-containing gas supplied from the fluorine-containing gas supply source.

Assignees

Inventors

Classifications

  • for gaseous samples (interfaces to gas chromatographs G01N30/7206) · CPC title

  • Step by step routines describing the use of the apparatus (H01J49/0081 takes precedence) · CPC title

  • Time-of-flight spectrometers (H01J49/36 takes precedence) · CPC title

  • G01N27/62Primary

    by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode · CPC title

  • C01B7/19Primary

    Fluorine; Hydrogen fluoride · CPC title

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What does patent US11984308B2 cover?
A method for measuring the concentration of fluorine gas (F 2 ) contained in a halogen fluoride-containing gas using an analysis apparatus having a halogen fluoride-containing gas supply source, a fluorine-containing gas supply source, a tube, a capillary, and a mass spectrometer, the method including, before measuring the concentration of fluorine gas, performing passivation treatment on the t…
Who is the assignee on this patent?
Showa Denko Kk, Resonac Corp
What technology area does this patent fall under?
Primary CPC classification H01J49/0422. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue May 14 2024 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).