Electron capture detector

Patent metadata

Field	Value
Publication number	US-11971394-B2
Application number	US-201917047606-A
Country	US
Kind code	B2
Filing date	Apr 16, 2019
Priority date	Apr 26, 2018
Publication date	Apr 30, 2024
Grant date	Apr 30, 2024

Abstract

The electron capture detector (100) is a device for detecting a sample (α1). The electron capture detector (100) includes a detection cell (1), a sample inlet (2), and an electron emitting element (20). The detection cell (1) forms a reaction chamber (6). The sample inlet (2) introduces a first carrier gas containing the sample (α1) into the reaction chamber (6). The electron emitting element (20) emits electrons (β) into the reaction chamber (6). An ion (α2) derived from the sample component is generated as a result of the electron emitting element (20) emitting electrons (β) into the reaction chamber (6).

First claim

The invention claimed is:

1. An electron capture detector for detecting a sample, comprising:
a detection cell that forms a reaction chamber;
a sample inlet which introduces a first carrier gas containing the sample into the reaction chamber; and
an electron emitting element that emits electrons into the reaction chamber, wherein
the electron emitting element includes:
a surface electrode facing the reaction chamber, and
a lower electrode facing the surface electrode, wherein
the electrons are emitted from the surface electrode to the reaction chamber as a result of a voltage being applied between the surface electrode and the lower electrode.

2. The electron capture detector according to claim 1 , wherein
an ion derived from a sample component is generated as a result of the electron emitting element emitting the electrons into the reaction chamber.

3. The electron capture detector according to claim 1 , further comprising
a counter electrode facing the surface electrode via the reaction chamber.

4. The electron capture detector according to claim 3 , further comprising
a current detector that detects a current flowing through the counter electrode.

5. The electron capture detector according to claim 1 , wherein
the reaction chamber has a square pillar shape or a cylindrical shape.

6. The electron capture detector according to claim 1 , wherein
an energy of the electrons emitted by the electron emitting element is lower than an ionization potential of the sample.

7. The electron capture detector according to claim 1 , wherein
an energy of the electrons emitted by the electron emitting element is greater than 0 eV and 10 eV or less.

8. The electron capture detector according to claim 1 , further comprising
a carrier gas inlet that introduces a second carrier gas into the reaction chamber, wherein
the second carrier gas does not contain the sample.

9. The electron capture detector according to claim 8 , wherein
the sample inlet introduces the first carrier gas into the reaction chamber after the carrier gas inlet introduces the second carrier gas into the reaction chamber.

10. The electron capture detector according to claim 8 , wherein
the second carrier gas has a prescribed temperature.

11. The electron capture detector according to claim 1 , wherein:
the electron emitting element further includes an intermediate layer positioned between the surface electrode and the lower electrode, and
the intermediate layer has a prescribed volume resistivity.

12. The electron capture detector according to claim 11 , wherein
the intermediate layer contains a silicone resin and conductive fine particles dispersed in the silicone resin, or contains a porous alumina layer.

Assignees

• Sharp Kk

Inventors

• Komaru Shohei
• Iwamatsu Tadashi

Classifications

• G01N30/70 Primary

  Electron capture detectors · CPC title

• G01N27/66

  and measuring current or voltage · CPC title

• H01J49/08

  Electron sources, e.g. for generating photo-electrons, secondary electrons or Auger electrons · CPC title

• G01N27/64 Primary

  using wave or particle radiation to ionise a gas, e.g. in an ionisation chamber · CPC title