Solar cell, electronic device, and manufacturing method of solar cell
US-2016043246-A1 · Feb 11, 2016 · US
US11966201B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-11966201-B2 |
| Application number | US-202017432785-A |
| Country | US |
| Kind code | B2 |
| Filing date | Feb 21, 2020 |
| Priority date | Feb 21, 2019 |
| Publication date | Apr 23, 2024 |
| Grant date | Apr 23, 2024 |
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A photovoltaic device includes an electrically-conductive front contact layer; an electrically-conductive back contact layer, the back contact layer being intended to be situated further from a source of incident light than the front contact layer; and a semiconductor-based PIN junction having a substantially amorphous intrinsic silicon layer sandwiched between a P-type doped semiconductor layer and an N-type doped semiconductor layer. The layer of the PIN junction situated closest to the back contact layer is a silicon-germanium alloy layer including at least 2 mol % of germanium.
Opening claim text (preview).
The invention claimed is: 1. A photovoltaic device comprising: an electrically-conductive front contact layer; an electrically-conductive back contact layer, said back contact layer being situated further from a source of incident light than said front contact layer; and a semiconductor-based PIN junction comprising a substantially amorphous intrinsic silicon layer sandwiched between a P-type doped semiconductor layer and an N-type doped semiconductor layer, wherein the layer of said PIN junction situated closest to said back contact layer is a silicon-germanium alloy layer comprising at least 2 mol % of germanium. 2. The photovoltaic device according to claim 1 , wherein said silicon-germanium layer comprises at least 10 mol % germanium. 3. The photovoltaic device according to claim 1 , further comprising an anti-reflective layer situated on a light-incident side of said front contact layer. 4. The photovoltaic device according to claim 3 , wherein said anti-reflective layer exhibits an index of refraction lower than an index of refraction of said front contact layer. 5. The photovoltaic device according to claim 1 , wherein a surface of the silicon-germanium alloy layer facing towards the front contact layer has an rms roughness of at least 10 nm. 6. The photovoltaic device according to claim 1 , further comprising a substantially-transparent substrate situated on a light-incident side of said front contact layer. 7. The photovoltaic device according to claim 6 , further comprising an anti-reflective coating disposed on a front side of said substantially-transparent substrate, said anti-reflective coating exhibiting an index of refraction lower than an index of refraction of said substrate. 8. The photovoltaic device according to claim 5 , wherein said front contact layer comprises at least one of zinc oxide and tin oxide. 9. The photovoltaic device according to claim 1 , further comprising a substrate arranged on a surface of said back contact layer facing away from a light-incident side of said back contact layer. 10. The photovoltaic device according to claim 9 , wherein said back contact layer comprises at least one of zinc oxide and tin oxide. 11. The photovoltaic device according to claim 1 , wherein the layers of the PIN junction other than that based on silicon-germanium alloy are based on amorphous silicon. 12. A timepiece comprising a photovoltaic device according to claim 1 . 13. The timepiece according to claim 12 , wherein said photovoltaic device forms at least part of a dial or a bezel comprised by said timepiece. 14. A method of manufacturing a photovoltaic device according to claim 1 wherein said silicon-germanium layer is deposited by plasma-assisted chemical vapour deposition under the following conditions for a reactor of 13.56 MHz plasma excitation frequency, 15 mm inter-electrode distance, and 45×55 cm electrode surface dimensions: silane flow 30-50 sccm; germane flow 6-10 sccm; hydrogen flow 1200-1500 sccm; phosphene flow 0.5-1.5 sccm, or diborane flow 0.5-1.5 sccm; pressure 3.0-3.5 mbar; and plasma power 100-150 W. 15. The photovoltaic device according to claim 1 , wherein said silicon-germanium alloy layer comprises 15% to 25% germanium. 16. The photovoltaic device according to claim 1 , wherein said silicon-germanium alloy layer comprises substantially 20% germanium.
having multiple Group IV elements, e.g. SiGe or SiC · CPC title
comprising at least two Group IV elements, e.g. SiGe · CPC title
including Group IV-IV materials, e.g. SiGe or SiC · CPC title
including microcrystalline Group IV-IV materials, e.g. microcrystalline SiGe · CPC title
made of transparent conductive layers, e.g. transparent conductive oxide [TCO] layers · CPC title
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