Exploratory data interface

US11960830B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11960830-B2
Application numberUS-202016780876-A
CountryUS
Kind codeB2
Filing dateFeb 3, 2020
Priority dateFeb 3, 2020
Publication dateApr 16, 2024
Grant dateApr 16, 2024

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A method for production analysis includes: receiving production data at a processor from a plurality of tools spatially arranged within a manufacturing facility; creating a hierarchal topology of the data in the processor, wherein each level of the hierarchal topology is based on a different one of a plurality of static parameters that are selected from a list consisting of: a tool identifier, a batch identifier, and a spatial orientation; displaying, at a user interface implemented by the processor, a first analysis of a first level of the hierarchal topology, wherein the analysis contains parameters related to other levels of the hierarchal topology; receiving, via the user interface, a selection by a user of a first parameter displayed on the first analysis; and updating the user interface to display a second analysis of a second level of the hierarchal topology that is related to the first parameter.

First claim

Opening claim text (preview).

What is claimed is: 1. A method for constructing a computerized user interface, the method comprising: displaying a first electronic spreadsheet that has a plurality of cells arranged in rows and columns, each row corresponding to a different parameter that is identified in the first column of the row and each cell of each subsequent column displaying a value associated with the parameter identified in the corresponding row; receiving a click on a first cell of the first electronic spreadsheet, wherein the first cell displays a parameter identifier of a first parameter, and the first parameter is a lot i.d.; in response to the click on the first cell of the first electronic spreadsheet, generating and displaying at least one intermediate spreadsheet and receiving at least one click on the at least one intermediate spreadsheet; in response to the at least one click on the at least one intermediate spreadsheet, generating a second electronic spreadsheet that represents data values of a first array of records that pertain to the first parameter, wherein data values of the second electronic spreadsheet are names of variables that pertain to the first parameter and that are ranked according to a metric selected from a list consisting of: out-of-sigma count and p-value; and further in response to the at least one click on the at least one intermediate spreadsheet, displaying the second electronic spreadsheet; in response to a user selection of a first filter in the second electronic spreadsheet, displaying a first data view that represents only data values of a second array of records that are a subset of the first array of records and match the first filter; and in response to a user selection of a second parameter value in the first data view, displaying a second data view that represents data values of a third array of records, which match the second parameter value and also match the first filter. 2. The method of claim 1 , further comprising: displaying, in the second data view, only values of the third array of records, which are related to the first parameter by sharing a common production lot. 3. The method of claim 1 , further comprising: displaying, in the second data view, only values of the third array of records, which are related to the first parameter by sharing a common production tool. 4. A method for production analysis comprising: receiving production data at a processor from a plurality of tools spatially arranged within a manufacturing facility; creating a hierarchal topology of the data in a memory coupled in communication with the processor, wherein each level of the hierarchal topology is based on a different one of a plurality of static parameters that are selected from a list consisting of: a tool identifier, a batch identifier, and a spatial orientation; displaying, at a user interface implemented by the processor, a first analysis of a first level of the hierarchal topology, wherein the analysis contains parameters related to other levels of the hierarchal topology; receiving, via the user interface, a selection by a user of a first parameter displayed in the first analysis, wherein the first parameter is a lot i.d.; in response to the selection of the first parameter displayed in the first analysis, generating and displaying at least one intermediate analysis and receiving at least one selection on the at least one intermediate analysis; in response to the at least one selection in the at least one intermediate analysis, generating a second analysis of a second level of the hierarchal topology, wherein the second level is related to the first parameter; further in response to the at least one selection in the at least one intermediate analysis, updating the user interface to display the second analysis of the second level of the hierarchal topology; in response to a user selection of a first filter in the display of the second analysis, displaying a third analysis that represents only data values of a subset of the data values in the second analysis; and in response to a user selection of a second parameter value in the third analysis, displaying a fourth analysis that represents data values that match the second parameter value and also match the first filter, wherein all of the data values of the fourth analysis pertain to the first parameter and include variable names that are ranked according to a metric selected from a list consisting of: out-of-sigma count and p-value. 5. The method of claim 4 wherein the second analysis contains at least one of the parameters that are related to other levels of the hierarchal topology. 6. The method of claim 5 wherein the first analysis is displayed as a spreadsheet, with the first parameter being displayed as a hyperlinked cell in the spreadsheet, and the second analysis is displayed as a line chart, with the at least one of the parameters being displayed as a hyperlinked point on the chart. 7. The method of claim 5 wherein the first analysis is displayed as a spreadsheet, with the first parameter being displayed as a hyperlinked cell in the spreadsheet, and the second analysis is displayed as a map of locations where the first parameter is out of range, with the at least one of the parameters being displayed as a hyperlinked label on the map. 8. The method of claim 4 further comprising, in response to the second analysis of the second level of the hierarchal topology, modifying a production process parameter. 9. An apparatus for production analysis, comprising: a computer readable storage medium embodying computer executable instructions; and at least one processor, coupled to the computer readable storage medium, and operative by the computer executable instructions to facilitate a method of: receiving production data at a processor from a plurality of tools spatially arranged within a manufacturing facility; creating a hierarchal topology of the data in a memory coupled in communication with the processor, wherein each level of the hierarchal topology is based on a different one of a plurality of static parameters that are selected from a list consisting of: a tool identifier, a batch identifier, and a spatial orientation; displaying, at a user interface implemented by the processor, a first analysis of a first level of the hierarchal topology, wherein the analysis contains parameters related to other levels of the hierarchal topology; receiving, via the user interface, a selection by a user of a first parameter displayed in the first analysis, wherein the first parameter is a lot i.d.; in response to the selection of the first parameter displayed in the first analysis, generating and displaying at least one intermediate analysis and receiving at least one selection in the at least one intermediate analysis; in response to the at least one selection on the at least one intermediate analysis, generating a second analysis of a second level of the hierarchal topology wherein the second level is related to the first parameter; further in response to the at least one selection on the at least one intermediate analysis, updating the user interface to display the second analysis of the second level of the hierarchal topology; in response to a user selection of a first filter in the display of the second analysis, displaying a third analysis that represents only data values of a subset of the data values in the second analysis; and in response to a user selection of a second parameter value in the third analysis, displaying a fourth analysis that represents data values that match the second parameter value and also match the first filter, wherein all of the data values of the fourth analysis pertain to the first parameter and include variable names that ar

Assignees

Inventors

Classifications

  • G06F40/18Primary

    of spreadsheets (form-filling G06F40/174) · CPC title

  • characterised by data acquisition, e.g. workpiece identification · CPC title

  • by tool management · CPC title

  • Hierarchical processing, e.g. outlines · CPC title

  • Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS] · CPC title

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What does patent US11960830B2 cover?
A method for production analysis includes: receiving production data at a processor from a plurality of tools spatially arranged within a manufacturing facility; creating a hierarchal topology of the data in the processor, wherein each level of the hierarchal topology is based on a different one of a plurality of static parameters that are selected from a list consisting of: a tool identifier, …
Who is the assignee on this patent?
IBM
What technology area does this patent fall under?
Primary CPC classification G06F40/18. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Apr 16 2024 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 4 related publications on this page (citations in our corpus or others sharing the same primary CPC).