TOF mass calibration

Patent metadata

Field	Value
Publication number	US-11948788-B2
Application number	US-202017310989-A
Country	US
Kind code	B2
Filing date	Jun 10, 2020
Priority date	Jun 12, 2019
Publication date	Apr 2, 2024
Grant date	Apr 2, 2024

Abstract

A calibration apparatus for a mass analyzer includes an ion source device and a dual-purpose electron beam generating unit. The ion source device ionizes an analyte of a sample, producing analyte ions. The dual-purpose electron beam generating unit is positioned between the ion source device and the mass analyzer. In a first mode, the dual-purpose electron beam generating unit is used to create fragments of analyte ions of unknown mass-to-charge ratio. In a second mode, the dual-purpose electron beam generating unit is used to create ions of calibration compounds of known mass-to-charge ratio. All ions are subsequently transferred to the mass analyzer.

First claim

What is claimed is:

1. A mass calibration apparatus for a mass analyzer, comprising:
an ion source device of a mass spectrometer for ionizing an analyte of a sample, producing analyte ions; and
a dual-purpose electron beam generating unit of the mass spectrometer located between the ion source device and a mass analyzer of the mass spectrometer that,
in a first mode, when the mass spectrometer is in mass spectrometry (MS) mode, transmits the analyte ions to the mass analyzer directly or through one or more other units of the mass spectrometer for mass analysis or, when the mass spectrometer is in mass spectrometry/mass spectrometry (MS/MS) mode, fragments the analyte ions into product ions and transmits the product ions to the mass analyzer directly or through the one or more other units for mass analysis or transmits the analyte ions to a collision cell of the mass spectrometer for fragmentation that, in turn, transmits resulting product ions to the mass analyzer for mass analysis, and,
in a second mode, creates ions of calibration compounds and transmits the calibration ions to the mass analyzer directly or through the one or more other units for mass analysis.

2. The apparatus of claim 1 , wherein the dual-purpose electron beam generating unit is an electron-based dissociation (ExD) cell, wherein, in the first mode, when the mass spectrometer is in MS/MS mode, the ExD cell receives the analyte ions, fragments the analyte ions using an electron beam, producing product ions, and transmits the product ions to the mass analyzer directly or through the one or more other units for mass analysis and, in the second mode, the ExD cell ionizes a gas of the ExD cell using the electron beam, producing calibrant ions, and transmits the calibrant ions to the mass analyzer directly or through the one or more other units for mass analysis.

3. The apparatus of claim 1 , wherein the dual-purpose electron beam generating unit is an electron-based dissociation (ExD) cell, and wherein the collision cell comprises a collision-induced dissociation (CID) collision cell positioned between the ExD cell and the mass analyzer.

4. The apparatus of claim 3 , wherein, in the first mode, when the mass spectrometer is in MS mode, the ExD cell transmits the analyte ions through the CID collision cell to the mass analyzer for mass analysis and, in the second mode, the ExD cell creates ions of calibration compounds and transmits the calibration ions through the CID collision cell to the mass analyzer for mass analysis.

5. The apparatus of claim 3 , wherein, in the first mode, when the mass spectrometer is in MS/MS mode, the ExD cell transmits the analyte ions to the CID collision cell that, in turn, transmits resulting product ions to the mass analyzer for mass analysis and, in the second mode, the ExD cell creates ions of calibration compounds and transmits the calibration ions through the CID collision cell to the mass analyzer for mass analysis.

6. The apparatus of claim 1 , wherein the calibrant compounds include a background gas.

7. The apparatus of claim 6 , wherein the background gas includes a component of air or a component of vacuum pump oil.

8. The apparatus of claim 1 , wherein the dual-purpose electron beam generating unit is an electron-based dissociation (ExD) collision cell, wherein the apparatus further comprises a gas source fluidly coupled to the ExD collision cell, and wherein the gas source provides the calibrant compounds to the ExD cell as a gas calibrant.

9. The apparatus of claim 8 , wherein the ExD cell ionizes the gas calibrant by applying the electron beam with a kinetic energy between 24 eV and 150 eV.

10. The apparatus of claim 2 , wherein the ExD cell ionizes the calibrant compounds by applying the electron beam with a kinetic energy between 24 eV and 150 eV.

11. The apparatus of claim 2 , wherein the ExD cell fragments the analyte ions by applying the electron beam with a kinetic energy of less than 2 eV.

12. The apparatus of claim 1 , wherein the dual-purpose electron beam generating unit is an electron-based dissociation (ExD) cell and wherein the ExD cell includes an electron capture dissociation (ECD) cell or an electron transfer dissociation (ETD) cell.

13. The apparatus of claim 8 , further comprising a processor for controlling the ion source device, the ExD cell, the gas source, the CID collision cell, and the mass analyzer.

14. A method for calibrating a mass analyzer, comprising:
instructing an ion source device to ionize an analyte of a sample using a processor, producing analyte ions,
instructing a dual-purpose electron beam generating unit of the mass spectrometer located between the ion source device and a mass analyzer of the mass spectrometer, in a first mode, when the mass spectrometer is in mass spectrometry (MS) mode, to transmit the analyte ions to the mass analyzer directly or through one or more other units of the mass spectrometer for mass analysis using the processor,
instructing the dual-purpose electron beam generating unit, in the first mode, when the mass spectrometer is in mass spectrometry/mass spectrometry (MS/MS) mode, to fragment the analyte ions into product ions and transmit the product ions to the mass analyzer directly or through the one or more other units for mass analysis or to transmit the analyte ions to a collision cell of the mass spectrometer for fragmentation that, in turn, transmits resulting product ions to the mass analyzer for mass analysis using the processor, and
instructing the dual-purpose electron beam generating unit, in a second mode, to create ions of calibration compounds and transmit the calibration ions to the mass analyzer directly or through the one or more other units for mass analysis using the processor.

15. A computer program product, comprising a non-transitory tangible computer-readable storage medium whose contents include a program with instructions being executed on a processor so as to perform a method for calibrating a mass analyzer, comprising:
providing a system, wherein the system comprises one or more distinct software modules, and wherein the distinct software modules comprise a control module;
instructing an ion source device to ionize an analyte of a sample using the control module, producing analyte ions,
instructing a dual-purpose electron beam generating unit of the mass spectrometer located between the ion source device and a mass analyzer of the mass spectrometer, in a first mode, when the mass spectrometer is in mass spectrometry (MS) mode, to transmit the analyte ions to the mass analyzer directly or through one or more other units of the mass spectrometer for mass analysis using the control module,
instructing the dual-purpose electron beam generating unit, in the first mode, when the mass spectrometer is in mass spectrometry/mass spectrometry (MS/MS) mode, to fragment the analyte ions into product ions and transmit the product ions to the mass analyzer directly or through the one or more other units for mass analysis or to transmit the analyte ions to a collision cell of the mass spectrometer for fragmentation that, in turn, transmits resulting product ions to the mass analyzer for mass analysis using the control module, and
instructing the dual-purpose electron beam generating unit, in a second mode, to create ions of calibration compounds and transmit the calibration ions to the mass analyzer directly or through the one or more other units for mass analysis using the control module.

Assignees

• Dh Technologies Dev Pte Ltd

Inventors

• Haufler Robert E
• Loyd William M
• Baba Takashi

Classifications

• H01J49/40 Primary

  Time-of-flight spectrometers (H01J49/36 takes precedence) · CPC title

• H01J49/0031

  Step by step routines describing the use of the apparatus (H01J49/0081 takes precedence) · CPC title

• H01J49/0036

  Step by step routines describing the handling of the data generated during a measurement · CPC title

• H01J49/0009 Primary

  Calibration of the apparatus · CPC title

• H01J49/147

  with electrons, e.g. electron impact ionisation, electron attachment (H01J49/145 takes precedence) · CPC title