Dielectric material, device comprising dielectric material, and method of preparing dielectric material

US11946154B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11946154-B2
Application numberUS-202017126902-A
CountryUS
Kind codeB2
Filing dateDec 18, 2020
Priority dateDec 30, 2019
Publication dateApr 2, 2024
Grant dateApr 2, 2024

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  5. First independent claim

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Abstract

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Provided are a dielectric material, a device including the dielectric material, and a method of preparing the dielectric material, in which the dielectric material may include: a layered perovskite compound, wherein the layered perovskite compound may include at least one selected from a Dion-Jacobson phase, an Aurivillius phase, and a Ruddlesden-Popper phase, a temperature coefficient of capacitance (TCC) of a capacitance at 200° C. with respect to a capacitance at 40° C. may be in a range of about −15 percent (%) to about 15%, and a permittivity of the dielectric material may be 200 or greater in a range of about 1 kilohertz (kHz) to about 1 megahertz (MHz).

First claim

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What is claimed is: 1. A dielectric material comprising: a layered perovskite compound comprising a material phase of at least one selected from a Dion-Jacobson phase, an Aurivillius phase, and a Ruddlesden-Popper phase, wherein a temperature coefficient of capacitance (TCC) of a capacitance at 200° C. with respect to a capacitance at 40° C. in a range of about −15 percent (%) to about 15%, and a permittivity is 200 or greater in a range of about 1 kilohertz (kHz) to about 1 megahertz (MHz). 2. The dielectric material of claim 1 , wherein the layered perovskite compound comprising the Dion-Jacobson phase is represented by Formula 1: AB 2 C n−3 D n O 3n+1   (Formula 1) wherein, in Formula 1, A includes a monovalent element, B includes a divalent element, C includes a monovalent element, D includes a pentavalent element, and n is an integer from 3 to 6. 3. The dielectric material of claim 1 , wherein A and C in Formula 1 each independently include at least one of sodium (Na), potassium (K), and rubidium (Rb). 4. The dielectric material of claim 1 , wherein B in Formula 1 includes at least one of calcium (Ca), strontium (Sr), and barium (Ba). 5. The dielectric material of claim 1 , wherein D in Formula 1 includes at least one of niobium (Nb), vanadium (V), and tantalum (Ta). 6. The dielectric material of claim 1 , wherein the layered perovskite compound comprising the Dion-Jacobson phase is represented by Formula 2: ACa 2 C n−3 Nb n O 3n+1   (Formula 2) wherein, in Formula 2, A includes at least one of Na, K, and Rb, C includes at least one of Na, K, and Rb, and n is an integer from 3 to 6. 7. The dielectric material of claim 1 , wherein the layered perovskite compound comprising the Dion-Jacobson phase comprising at least one of KCa 2 Nb 3 O 10 , KCa 2 NaNb 4 O 13 , KCa 2 Na 2 Nb 5 O 16 , KCa 2 Na 3 Nb 6 O 19 , KCa 2 KNb 4 O 13 , KCa 2 K 2 Nb 5 O 16 , KCa 2 K 3 Nb 6 O 19 , KCa 2 RbNb 4 O 13 , KCa 2 Rb 2 Nb 5 O 16 , KCa 2 Rb 3 Nb 6 O 19 , NaCa 2 Nb 3 O 10 , NaCa 2 KNb 4 O 13 , NaCa 2 K 2 Nb 5 O 16 , NaCa 2 K 3 Nb 6 O 19 , NaCa 2 NaNb 4 O 13 , NaCa 2 Na 2 Nb 5 O 16 , NaCa 2 Na 3 Nb 6 O 19 , NaCa 2 RbNb 4 O 13 , NaCa 2 Rb 2 Nb 5 O 16 , NaCa 2 Rb 3 Nb 6 O 19 , RbCa 2 Nb 3 O 10 , RbCa 2 KNb 4 O 13 , RbCa 2 K 2 Nb 5 O 16 , RbCa 2 K 3 Nb 6 O 19 , RbCa 2 RbNb 4 O 13 , RbCa 2 Rb 2 Nb 5 O 16 , RbCa 2 Rb 3 Nb 6 O 19 , RbCa 2 NaNb 4 O 13 , RbCa 2 Na 2 Nb 5 O 16 , and RbCa 2 Na 3 Nb 6 O 19 . 8. The dielectric material of claim 1 , wherein the dielectric material is a sinter of the layered perovskite compound comprising at least one selected from the Dion-Jacobson phase, the Aurivillius phase, and the Ruddlesden-Popper phase. 9. The dielectric material of claim 8 , wherein a difference between a position of a peak shown in a range of about 200 reciprocal centimeters (cm −1 ) to about 300 cm −1 in a Raman spectrum of the dielectric material and a position of a peak shown in a range of about 200 cm −1 to about 300 cm −1 in a Raman spectrum of a non-sintered layered perovskite compound used in preparing the dielectric material is 5 cm −1 or less. 10. The dielectric material of claim 1 , wherein the layered perovskite compound comprising the Aurivillius phase is represented by Formula 3: (Bi 2 O 2 )(A′ n−1 B′ n O 3n+1 )  (Formula 3) wherein, in Formula 3, A′ includes at least one of a monovalent, a divalent, and a trivalent element, B′ includes at least one of a trivalent, a pentavalent, and a hexavalent element, and n is an integer from 3 to 6. 11. The dielectric material of claim 10 , wherein A′ in Formula 3 includes at least one of Na, K, Rb, Ca, and Sr, and B′ includes at least one of scandium (Sc), lanthanum (La), titanium (Ti), zirconium (Zr), hafnium (Hf) vanadium (V), niobium (Nb), tantalum (Ta), chromium (Cr), molybdenum (Mo), tungsten (W), manganese (Mn), technetium (Tc), rhenium (Re), iron (Fe), ruthenium (Ru), osmium (Os), cobalt (Co), rhodium (Rh), iridium (Ir), nickel (Ni), palladium (Pd), platinum (Pt), copper (Cu), silver (Ag), gold (Au), zinc (Zn), aluminum (Al), gallium (Ga), indium (In), and thallium (Tl). 12. The dielectric material of claim 1 , wherein the layered perovskite compound comprising the Ruddlesden-Popper phase is represented by Formula 4: A″ n″−1 B″ 2 C″ n″ O 3n″+1   (Formula 4) wherein, in Formula 4, A″ includes at least one of a monovalent, a divalent, and a trivalent element, B″ includes at least one of a monovalent, a divalent, and a trivalent element, C″ includes at least one of a trivalent, a quadrivalent, a pentavalent, and a hexavalent element, and n″ is an integer from 1 to 6. 13. The dielectric material of claim 12 , wherein A″ and B″ each independently include at least one of Na, K, Rb, Ca, Sr, and Ba, and C″ includes at least one of Sc, La, Ti, Zr, Hf, V, Nb, Ta, Cr, Mo, W, Mn, Tc, Re, Fe, Ru, Os, Co, Rh, Ir, Ni, Pd, Pt, Cu, Ag, Au, Zn, Al, Ga, In, and Tl. 14. The dielectric material of claim 1 , further comprising a metal salt, wherein the layered perovskite compound and the metal salt is in a solid solution. 15. The dielectric material of claim 14 , wherein the solid solution of the layered perovskite compound and the metal salt is represented by Formulae 5 to 7: x M a X b - (1-x) ·AB 2 C n−3 D n O 3n+1   (Formula 5) wherein, in Formula 5, A includes a monovalent element, B includes a divalent element, C includes a monovalent element, D includes a pentavalent element, and n is an integer from 3 to 6, M includes an element of Group 1, 2, or 3 of the Periodic Table of Elements, X includes a monovalent anion, a divalent anion, or a trivalent anion, excluding halogen, and 0<x<1, 1≤a≤3, and 1≤b≤4; x M a X b -(1 −x )[(Bi 2 O 2 )(A′ n−1 B′ n O 3n+1 )]  (Formula 6) wherein, in Formula 6, A′ includes a monovalent, divalent, or trivalent element, B′ includes a trivalent, pentavalent, or hexavalent element, and n is an integer from 3 to 6, M includes an element of Group 1, 2, or 3 of the Periodic Table of Elements, X includes a monovalent anion, a divalent anion, or a trivalent anion, excluding halogen, and 0<x<1, 1≤a≤3, and 1≤b≤4; x M a X b -(1 −x )A″ n−1 B″ 2 C″ n O 3n+1   (Formula 7) wherein, in Formula 7, A″ includes a monovalent, divalent, or trivalent element, B″ includes a monovalent, divalent, or trivalent element, C″ includes a trivalent, quadrivalent, pentavalent, or hexavalent element, and n is an integer from 1 to 6, M includes an element of Group 1, 2, or 3 of the Periodic Table of Elements, X includes a monovalent anion, a divalent anion, or a trivalent anion, excluding halogen, and 0<x<1, 1≤a≤3, and 1≤b≤4. 16. A device comprising: a plurality of electrodes; and the dielectric material of claim 1 disposed between a plurality of the electrodes. 17. The device of claim 16 , wherein the device is a capacitor. 18. The device of claim 17 , wherein the capacitor is a laminated capacitor, the plurality of electrodes include a plurality of internal electrodes, and the dielectric material is alternately disposed between the plurality of internal electrodes. 19. The device of claim 18 , wherein a permittivity of the dielectric material is 500 or greater in a range of about 1 kHz to about 1 MHz. 20. A method of preparing a dielectric material comprising: preparing a mixture of a layered perovskite compound and a metal salt, the layered perovskite compound comprising a material phase of at least one selected from a Dion-Jacobson phase, an Aurivillius phase, and

Assignees

Inventors

Classifications

  • C30B1/023Primary

    from solids with amorphous structure · CPC title

  • General methods for coating; Devices therefor · CPC title

  • Oxides (C03C17/02 takes precedence) · CPC title

  • Tungsten oxides, tungstates, or oxide-forming salts thereof · CPC title

  • Perovskite structure ABO3 · CPC title

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What does patent US11946154B2 cover?
Provided are a dielectric material, a device including the dielectric material, and a method of preparing the dielectric material, in which the dielectric material may include: a layered perovskite compound, wherein the layered perovskite compound may include at least one selected from a Dion-Jacobson phase, an Aurivillius phase, and a Ruddlesden-Popper phase, a temperature coefficient of capac…
Who is the assignee on this patent?
Samsung Electronics Co Ltd
What technology area does this patent fall under?
Primary CPC classification C30B1/023. Mapped technology areas include Chemistry & Metallurgy.
When was this patent published?
Publication date Tue Apr 02 2024 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).