Non-contact electrical parameter measurement device with radial dual mounted sensors

US11933821B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11933821-B2
Application numberUS-202117476054-A
CountryUS
Kind codeB2
Filing dateSep 15, 2021
Priority dateSep 15, 2020
Publication dateMar 19, 2024
Grant dateMar 19, 2024

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  1. Title

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  2. Abstract

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  4. Key dates

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  5. First independent claim

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

Systems and methods for operating and calibrating electrical parameter measurement devices are provided herein. The devices may include a current sensor that includes a plurality of magnetic field sensors positioned around a measurement area that receive a current carrying conductor under test. The sensor may include a plurality of concentric rings of magnetic field sensors that provide accurate measurements that ignore magnetic fields from conductors or other components outside of the measurement area. The sensors may be used to determine the position of a conductor under test, and such information may be used to produce accurate measurements by accounting for the conductor's position. A calibration system may also be provided that is operative to generate calibration data that is subsequently used to provide more accurate measurements. The calibration data may include one or more lookup tables, coefficients for one or more mathematical formulas, or other types of data.

First claim

Opening claim text (preview).

The invention claimed is: 1. An electrical parameter measurement device, comprising: a front end that includes an opening that is sized and dimensioned to receive a conductor under test; a plurality of magnetic field sensors disposed around the opening, the plurality of magnetic field sensors comprising a first set of magnetic field sensors positioned at a first radial distance from a center of the opening, and a second set of magnetic field sensors positioned a second radial distance from the center of the opening, the second radial distance being greater than the first radial distance, and each magnetic field sensor in the first set is radially aligned with a corresponding magnetic field sensor in the second set; and control circuitry operatively coupled to the plurality of magnetic field sensors, the control circuitry being configured to: receive sensor signals from the plurality of magnetic field sensors; determine a physical position of the conductor under test within the opening of the front end based at least in part on the sensor signals; determine a position-dependent calibration factor based at least in part on the physical position of the conductor under test within the opening of the front end of the electrical parameter measurement device; and apply the position-dependent calibration factor to determine a current parameter of the conductor based at least in part on the sensor signals and the physical position. 2. The electrical parameter measurement device of claim 1 , wherein the physical position of the conductor under test is determined by triangulation of at least three sensor signals received from at least three magnetic field sensors. 3. The electrical parameter measurement device of claim 1 , wherein the physical position of the conductor under test is determined at least in part by mechanical means. 4. The electrical parameter measurement device of claim 1 , wherein the control circuitry is configured to determine the physical position of the conductor under test using sensor signals from exactly three of the magnetic field sensors. 5. The electrical parameter measurement device of claim 1 , wherein each of the plurality of magnetic field sensors comprises a first sub-sensor and a second sub-sensor, the second sub-sensor being arranged at a 90 degree angle relative to the first sub-sensor. 6. The electrical parameter measurement device of claim 1 wherein each of the plurality of magnetic field sensors of the first set is formed in an integrated circuit that includes a respective one of the plurality of magnetic field sensors of the second set. 7. The electrical parameter measurement device of claim 1 , wherein each of the plurality of magnetic field sensors of the first set is mounted to a support with a corresponding, radially aligned magnetic field sensor of the second set. 8. The electrical parameter measurement device of claim 1 , wherein the magnetic field sensors of the first set of magnetic field sensors are coupled in a first series, and the magnetic field sensors of the second set of magnetic field sensors are coupled in a second series. 9. The electrical parameter measurement device of claim 1 , wherein each of the plurality of magnetic field sensors is separately coupled to the control circuitry. 10. The electrical parameter measurement device of claim 1 , wherein the plurality of magnetic field sensors comprises a third set of magnetic field sensors positioned a third radial distance from the center of the opening that is greater than the second radial distance, and the control circuitry is operative to: determine that at least one of the magnetic field sensors of the first set of magnetic field sensors is saturated due to an amount of current in the conductor under test; and determine the current parameter of the conductor based at least in part on sensor signals from the second and third sets of the magnetic field sensors. 11. The electrical parameter measurement device of claim 1 , wherein determining a position-dependent calibration factor comprises utilizing a lookup table. 12. The electrical parameter measurement device of claim 1 , wherein the control circuitry is configured to determine that at least one of the plurality of magnetic field sensors is saturated, and to ignore the at least one of the plurality of magnetic field sensors in determining the current parameter of the conductor under test. 13. The electrical parameter measurement device of claim 1 , further comprising a plurality of non-contact voltage sensors operatively coupled to the control circuitry, wherein the control circuitry determines the physical position of the conductor under test based at least in part on sensor signals received from the plurality of non-contact voltage sensors. 14. The electrical parameter measurement device of claim 13 , wherein the control circuitry is configured to determine a voltage parameter of the conductor under test based at least in part on sensor signals received from the plurality of non-contact voltage sensors. 15. The electrical parameter measurement device of claim 1 , wherein each of the plurality of magnetic field sensors is operative to determine a direction of a magnetic field generated by the conductor under test. 16. The electrical parameter measurement device of claim 1 , wherein the control circuitry applies a unique calibration factor for each of the plurality of magnetic field sensors. 17. An electrical parameter measurement device, comprising: a front end that includes an opening that is sized and dimensioned to receive a conductor under test; a plurality of magnetic field sensors disposed around the opening, the plurality of magnetic field sensors comprising a first set of magnetic field sensors positioned at a first radial distance from a center of the opening, and a second set of magnetic field sensors positioned a second radial distance from the center of the opening, the second radial distance being greater than the first radial distance, and each magnetic field sensor in the first set is radially aligned with a corresponding magnetic field sensor in the second set; and control circuitry operatively coupled to the plurality of magnetic field sensors, the control circuitry being configured to: receive sensor signals from the plurality of magnetic field sensors; determine a physical position of the conductor under test within the opening of the front end based at least in part on the sensor signals or using mechanical means; and determine a current parameter of the conductor based at least in part on the sensor signals and the physical position, wherein the control circuitry is configured to identify a saturated magnetic field sensor from the plurality of magnetic field sensors, and to replace a sensor signal of the saturated magnetic field sensor with an interpolated sensor signal obtained using sensor signals from magnetic field sensors positioned adjacent to the saturated magnetic field sensor. 18. A method of operating an electrical parameter measurement device, the method comprising: placing a conductor under test in an opening of a support member of the electrical parameter measurement device; sensing one or more electrical parameters of the conductor under test, wherein the sensing comprises using a plurality of magnetic field sensors comprising a first set of magnetic field sensors positioned at a first radial distance from a center of the opening, and a second set of magnetic field sensors positioned at a second radial distance from the center of the opening, the second radial d

Assignees

Inventors

Classifications

  • G01R15/181Primary

    using coils without a magnetic core, e.g. Rogowski coils · CPC title

  • Measuring current only · CPC title

  • G01R33/09Primary

    Magnetoresistive devices · CPC title

  • G01R15/207Primary

    Constructional details independent of the type of device used · CPC title

  • Geometrical arrangement of magnetic sensor elements; Apparatus combining different magnetic sensor types (G01R33/0206 takes precedence) · CPC title

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What does patent US11933821B2 cover?
Systems and methods for operating and calibrating electrical parameter measurement devices are provided herein. The devices may include a current sensor that includes a plurality of magnetic field sensors positioned around a measurement area that receive a current carrying conductor under test. The sensor may include a plurality of concentric rings of magnetic field sensors that provide accurat…
Who is the assignee on this patent?
Fluke Corp
What technology area does this patent fall under?
Primary CPC classification G01R15/181. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Mar 19 2024 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 6 related publications on this page (citations in our corpus or others sharing the same primary CPC).