Multi-sensor scanner configuration for non-contact voltage measurement devices
US-10557875-B2 · Feb 11, 2020 · US
US11933821B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-11933821-B2 |
| Application number | US-202117476054-A |
| Country | US |
| Kind code | B2 |
| Filing date | Sep 15, 2021 |
| Priority date | Sep 15, 2020 |
| Publication date | Mar 19, 2024 |
| Grant date | Mar 19, 2024 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
Systems and methods for operating and calibrating electrical parameter measurement devices are provided herein. The devices may include a current sensor that includes a plurality of magnetic field sensors positioned around a measurement area that receive a current carrying conductor under test. The sensor may include a plurality of concentric rings of magnetic field sensors that provide accurate measurements that ignore magnetic fields from conductors or other components outside of the measurement area. The sensors may be used to determine the position of a conductor under test, and such information may be used to produce accurate measurements by accounting for the conductor's position. A calibration system may also be provided that is operative to generate calibration data that is subsequently used to provide more accurate measurements. The calibration data may include one or more lookup tables, coefficients for one or more mathematical formulas, or other types of data.
Opening claim text (preview).
The invention claimed is: 1. An electrical parameter measurement device, comprising: a front end that includes an opening that is sized and dimensioned to receive a conductor under test; a plurality of magnetic field sensors disposed around the opening, the plurality of magnetic field sensors comprising a first set of magnetic field sensors positioned at a first radial distance from a center of the opening, and a second set of magnetic field sensors positioned a second radial distance from the center of the opening, the second radial distance being greater than the first radial distance, and each magnetic field sensor in the first set is radially aligned with a corresponding magnetic field sensor in the second set; and control circuitry operatively coupled to the plurality of magnetic field sensors, the control circuitry being configured to: receive sensor signals from the plurality of magnetic field sensors; determine a physical position of the conductor under test within the opening of the front end based at least in part on the sensor signals; determine a position-dependent calibration factor based at least in part on the physical position of the conductor under test within the opening of the front end of the electrical parameter measurement device; and apply the position-dependent calibration factor to determine a current parameter of the conductor based at least in part on the sensor signals and the physical position. 2. The electrical parameter measurement device of claim 1 , wherein the physical position of the conductor under test is determined by triangulation of at least three sensor signals received from at least three magnetic field sensors. 3. The electrical parameter measurement device of claim 1 , wherein the physical position of the conductor under test is determined at least in part by mechanical means. 4. The electrical parameter measurement device of claim 1 , wherein the control circuitry is configured to determine the physical position of the conductor under test using sensor signals from exactly three of the magnetic field sensors. 5. The electrical parameter measurement device of claim 1 , wherein each of the plurality of magnetic field sensors comprises a first sub-sensor and a second sub-sensor, the second sub-sensor being arranged at a 90 degree angle relative to the first sub-sensor. 6. The electrical parameter measurement device of claim 1 wherein each of the plurality of magnetic field sensors of the first set is formed in an integrated circuit that includes a respective one of the plurality of magnetic field sensors of the second set. 7. The electrical parameter measurement device of claim 1 , wherein each of the plurality of magnetic field sensors of the first set is mounted to a support with a corresponding, radially aligned magnetic field sensor of the second set. 8. The electrical parameter measurement device of claim 1 , wherein the magnetic field sensors of the first set of magnetic field sensors are coupled in a first series, and the magnetic field sensors of the second set of magnetic field sensors are coupled in a second series. 9. The electrical parameter measurement device of claim 1 , wherein each of the plurality of magnetic field sensors is separately coupled to the control circuitry. 10. The electrical parameter measurement device of claim 1 , wherein the plurality of magnetic field sensors comprises a third set of magnetic field sensors positioned a third radial distance from the center of the opening that is greater than the second radial distance, and the control circuitry is operative to: determine that at least one of the magnetic field sensors of the first set of magnetic field sensors is saturated due to an amount of current in the conductor under test; and determine the current parameter of the conductor based at least in part on sensor signals from the second and third sets of the magnetic field sensors. 11. The electrical parameter measurement device of claim 1 , wherein determining a position-dependent calibration factor comprises utilizing a lookup table. 12. The electrical parameter measurement device of claim 1 , wherein the control circuitry is configured to determine that at least one of the plurality of magnetic field sensors is saturated, and to ignore the at least one of the plurality of magnetic field sensors in determining the current parameter of the conductor under test. 13. The electrical parameter measurement device of claim 1 , further comprising a plurality of non-contact voltage sensors operatively coupled to the control circuitry, wherein the control circuitry determines the physical position of the conductor under test based at least in part on sensor signals received from the plurality of non-contact voltage sensors. 14. The electrical parameter measurement device of claim 13 , wherein the control circuitry is configured to determine a voltage parameter of the conductor under test based at least in part on sensor signals received from the plurality of non-contact voltage sensors. 15. The electrical parameter measurement device of claim 1 , wherein each of the plurality of magnetic field sensors is operative to determine a direction of a magnetic field generated by the conductor under test. 16. The electrical parameter measurement device of claim 1 , wherein the control circuitry applies a unique calibration factor for each of the plurality of magnetic field sensors. 17. An electrical parameter measurement device, comprising: a front end that includes an opening that is sized and dimensioned to receive a conductor under test; a plurality of magnetic field sensors disposed around the opening, the plurality of magnetic field sensors comprising a first set of magnetic field sensors positioned at a first radial distance from a center of the opening, and a second set of magnetic field sensors positioned a second radial distance from the center of the opening, the second radial distance being greater than the first radial distance, and each magnetic field sensor in the first set is radially aligned with a corresponding magnetic field sensor in the second set; and control circuitry operatively coupled to the plurality of magnetic field sensors, the control circuitry being configured to: receive sensor signals from the plurality of magnetic field sensors; determine a physical position of the conductor under test within the opening of the front end based at least in part on the sensor signals or using mechanical means; and determine a current parameter of the conductor based at least in part on the sensor signals and the physical position, wherein the control circuitry is configured to identify a saturated magnetic field sensor from the plurality of magnetic field sensors, and to replace a sensor signal of the saturated magnetic field sensor with an interpolated sensor signal obtained using sensor signals from magnetic field sensors positioned adjacent to the saturated magnetic field sensor. 18. A method of operating an electrical parameter measurement device, the method comprising: placing a conductor under test in an opening of a support member of the electrical parameter measurement device; sensing one or more electrical parameters of the conductor under test, wherein the sensing comprises using a plurality of magnetic field sensors comprising a first set of magnetic field sensors positioned at a first radial distance from a center of the opening, and a second set of magnetic field sensors positioned at a second radial distance from the center of the opening, the second radial d
using coils without a magnetic core, e.g. Rogowski coils · CPC title
Measuring current only · CPC title
Magnetoresistive devices · CPC title
Constructional details independent of the type of device used · CPC title
Geometrical arrangement of magnetic sensor elements; Apparatus combining different magnetic sensor types (G01R33/0206 takes precedence) · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.