Sampling method and sampling system

Patent metadata

Field	Value
Publication number	US-11926440-B2
Application number	US-202017092422-A
Country	US
Kind code	B2
Filing date	Nov 9, 2020
Priority date	May 9, 2018
Publication date	Mar 12, 2024
Grant date	Mar 12, 2024

Abstract

A sampling method includes: obtaining topographical information about a predetermined wide area by using a first sensor on a work machine; selecting a candidate area within the wide area, the candidate area is less than an area of the wide area, and setting a movement route based on the information about the wide area, the movement route allows a distal end portion of an arm provided on the work machine to reach a preparation position without coming into contact with an obstacle, the preparation position being located above the candidate area; moving the distal end portion of the arm along the movement route to the preparation position, and obtaining topographical information about the candidate area by using a second sensor on the distal end portion of the arm; and specifying a sampling point based on the information about the candidate area and performing sampling at the specified sampling point.

First claim

The invention claimed is:

1. A sampling method comprising:
obtaining topographical information about a predetermined wide area by using a first sensor provided on a work machine;
selecting a candidate area within the wide area based on the topographical information about the wide area, the candidate area having an area less than an area of the wide area, and setting a movement route based on the topographical information about the wide area, the movement route being a route that allows a distal end portion of an arm provided on the work machine to reach a preparation position without coming into contact with an obstacle, the preparation position facing the candidate area;
moving the distal end portion of the arm along the movement route to the preparation position, and thereafter obtaining topographical information about the candidate area by using a second sensor provided on the distal end portion of the arm; and
specifying a sampling point based on the topographical information about the candidate area and performing sampling at the specified sampling point.

2. The sampling method according to claim 1 , wherein
the second sensor includes a projector configured to project a predetermined reference mark, and
obtaining the topographical information about the candidate area includes:
projecting the reference mark onto the candidate area; and
obtaining the topographical information about the candidate area based on a shape of the reference mark that is displayed on the candidate area by projection.

3. The sampling method according to claim 2 , comprising projecting the reference mark from the projector in an advancing direction of the distal end portion of the arm when moving the distal end portion of the arm to the preparation position, determining whether or not there is an obstacle on the movement route based on presence or absence of a display of the reference mark by projection or based on a shape and a size of the reference mark displayed by projection, and if it is determined that there is an obstacle on the movement route, moving the distal end portion of the arm to the preparation position in a manner to avoid the obstacle.

Assignees

• Kawasaki Heavy Ind Ltd

Inventors

• Sakamoto Fuminobu
• Kurose Toyotoshi

Classifications

• B64G1/222

  for deploying structures between a stowed and deployed state · CPC title

• B64G1/105 Primary

  Space science · CPC title

• B64G1/16

  Extraterrestrial cars · CPC title

• B64G1/2427

  Transfer orbits · CPC title

• B64G1/36

  using sensors, e.g. sun-sensors, horizon sensors · CPC title