Radiation detector with laser cut absorber tiles
US-2023145517-A1 · May 11, 2023 · US
US11925039B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-11925039-B2 |
| Application number | US-202016972627-A |
| Country | US |
| Kind code | B2 |
| Filing date | Nov 17, 2020 |
| Priority date | Sep 7, 2020 |
| Publication date | Mar 5, 2024 |
| Grant date | Mar 5, 2024 |
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The present disclosure provides an optical-sensing device, a manufacturing method thereof, and a display panel. The optical-sensing device includes a sensor TFT disposed on a substrate and a switch TFT connected with the sensor TFT. The sensor TFT and the switch TFT include a first active layer and a second active layer, the first active layer comprises a first IGZO layer and a perovskite layer disposed on the first IGZO layer, and the second active layer comprises a second IGZO layer.
Opening claim text (preview).
What is claimed is: 1. An optical-sensing device, comprising: a substrate; a sensor thin film transistor (TFT) disposed on the substrate, the sensor TFT comprising a first active layer; and a switch TFT disposed on the substrate and connected with the sensor TFT, the switch TFT comprising a second active layer; wherein the first active layer comprises a first indium gallium zinc oxide (IGZO) layer, a perovskite layer disposed on the first IGZO layer, and a first graphene layer disposed on the first IGZO layer; and the second active layer comprises a second IGZO layer. 2. The optical-sensing device in claim 1 , wherein the second active layer further comprises a second graphene layer disposed on the second IGZO layer. 3. The optical-sensing device in claim 1 , wherein the sensor TFT comprises: a first bottom gate electrode disposed on the substrate; an insulating layer covering the first bottom gate electrode; the first active layer disposed on the insulating layer; a first source electrode and a first drain electrode disposed on the insulating layer and connected with two ends of the first active layer; and a planarization layer covering the first active layer, the first source electrode, and the first drain electrode. 4. The optical-sensing device in claim 3 , wherein the switch TFT comprises: a second bottom gate electrode disposed on the substrate; the insulating layer covering the second bottom gate electrode; the second active layer disposed on the insulating layer; a second source electrode and a second drain electrode disposed on the insulating layer and connected with two ends of the second active layer; and the planarization layer covering the second active layer, the second source electrode, and the second drain electrode; wherein the second source electrode connects with the first drain electrode. 5. The optical-sensing device in claim 3 , wherein the sensor TFT further comprises a first top gate electrode disposed on the planarization layer and corresponding to the first active layer. 6. The optical-sensing device in claim 1 , further comprising a storage capacitance structure disposed on the substrate, wherein the storage capacitance structure is electrically connected with the sensor TFT and/or the switch TFT. 7. A display panel, comprising a liquid crystal display panel and an optical-sensing device disposed on the liquid crystal display panel, the optical-sensing device comprising: a substrate; a sensor TFT, disposed on the substrate and comprising a first active layer; and a switch TFT, disposed on the substrate, connected with the sensor TFT, and comprising a second active layer; wherein the first active layer comprises a first indium gallium zinc oxide (IGZO) layer, a perovskite layer disposed on the first IGZO layer, and a first graphene layer disposed on the first IGZO layer; and the second active layer comprises a second IGZO layer. 8. The display panel in claim 7 , wherein the second active layer further comprises a second graphene layer disposed on the second IGZO layer. 9. The display panel in claim 7 , wherein the sensor TFT comprises: a first bottom gate electrode disposed on the substrate; an insulating layer covering the first bottom gate electrode; the first active layer disposed on the insulating layer; a first source electrode and a first drain electrode disposed on the insulating layer and connected with two ends of the first active layer; and a planarization layer covering the first active layer, the first source electrode, and the first drain electrode. 10. The display panel in claim 9 , wherein the switch TFT comprises: a second bottom gate electrode disposed on the substrate; the insulating layer covering the second bottom gate electrode; the second active layer disposed on the insulating layer; a second source electrode and a second drain electrode disposed on the insulating layer and connected with two ends of the second active layer; and the planarization layer covering the second active layer, the second source electrode, and the second drain electrode; wherein the second source electrode connects with the first drain electrode. 11. The display panel in claim 9 , wherein the sensor TFT further comprises a first top gate electrode disposed on the planarization layer and corresponding to the first active layer. 12. The display panel in claim 7 , further comprising a storage capacitance structure disposed on the substrate, wherein the storage capacitance structure is electrically connected with the sensor TFT and/or the switch TFT. 13. An optical-sensing device, comprising: a substrate; a sensor thin film transistor (TFT) disposed on the substrate, the sensor TFT comprising a first active layer; and a switch TFT disposed on the substrate and connected with the sensor TFT, the switch TFT comprising a second active layer; wherein the first active layer comprises a first indium gallium zinc oxide (IGZO) layer and a perovskite layer disposed on the first IGZO layer, and the second active layer comprises a second IGZO layer and a second graphene layer disposed on the second IGZO layer. 14. The optical-sensing device in claim 13 , wherein the sensor TFT comprises: a first bottom gate electrode disposed on the substrate; an insulating layer covering the first bottom gate electrode; the first active layer disposed on the insulating layer; a first source electrode and a first drain electrode disposed on the insulating layer and connected with two ends of the first active layer; and a planarization layer covering the first active layer, the first source electrode, and the first drain electrode. 15. The optical-sensing device in claim 14 , wherein the switch TFT comprises: a second bottom gate electrode disposed on the substrate; the insulating layer covering the second bottom gate electrode; the second active layer disposed on the insulating layer; a second source electrode and a second drain electrode disposed on the insulating layer and connected with two ends of the second active layer; and the planarization layer covering the second active layer, the second source electrode, and the second drain electrode; wherein the second source electrode connects with the first drain electrode. 16. The optical-sensing device in claim 14 , wherein the sensor TFT further comprises a first top gate electrode disposed on the planarization layer and corresponding to the first active layer. 17. The optical-sensing device in claim 13 , further comprising a storage capacitance structure disposed on the substrate, wherein the storage capacitance structure is electrically connected with the sensor TFT and/or the switch TFT.
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