Scanning electrochemical microscopy with oscillating probe tip

Patent metadata

Field	Value
Publication number	US-11921130-B2
Application number	US-202117146288-A
Country	US
Kind code	B2
Filing date	Jan 11, 2021
Priority date	Apr 16, 2010
Publication date	Mar 5, 2024
Grant date	Mar 5, 2024

Abstract

A new scanning electrochemical microscopy tip positioning method that allows topography and surface activity to be resolved independently is presented. A SECM tip is oscillated relative to the surface of interest. Changes in the oscillation amplitude, caused by the intermittent contact of the SECM tip with the surface of interest, are used to detect the surface of interest, and as a feedback signal for various types of imaging.

First claim

The invention claimed is:

1. A method comprising:
oscillating, using a piezoelectric positioner fitted with a strain gauge sensor, a scanning microscopy ultramicroelectrode probe tip in height relative to a surface of interest;
detecting damping of an amplitude of the oscillation of the probe tip by detecting by the strain gauge sensor a decrease in the amplitude of the oscillation of the probe tip as compared to an amplitude of oscillation of the probe tip in a bulk solution, the decrease in the amplitude of the oscillation of the probe tip indicating intermittent contact with the surface of interest;
using the detected decrease in the amplitude to detect the surface of interest; and
using the probe tip to measure or modify activity of the surface of interest simultaneously with detecting damping.

2. A method as claimed in claim 1 , comprising detecting the decrease in the amplitude of the oscillation of the probe tip during an approach curve measurement.

3. A method as claimed in claim 2 , comprising terminating the approach curve measurement when intermittent contact is detected.

4. A method as claimed in claim 2 , comprising terminating the approach curve measurement on detecting a decrease in sensor tip oscillation amplitude as compared to oscillation amplitude in a reference medium.

5. A method as claimed in claim 2 , comprising terminating the approach curve measurement on detecting a decrease of between 0.5% and 15% in sensor tip oscillation amplitude as compared to oscillation amplitude in a reference medium.

6. A method as claimed in claim 2 , comprising terminating the approach curve measurement on detecting a decrease of about 5-10% in tip sensor oscillation amplitude as compared to oscillation amplitude in a reference medium.

7. A method as claimed in claim 1 , further comprising constructing an image using a series of line scans, each line scan including a forward intermittent contact scan and a reverse constant distance scan.

8. A method according to claim 1 , further comprising using a measured oscillation amplitude to control the probe tip movement relative to the surface of interest.

9. A method as claimed in claim 1 , wherein oscillating the probe tip comprises oscillating the probe tip with a magnitude of between 1% and 2% of the radius of an active electrode of the probe tip.

10. A method according to claim 1 , wherein the oscillation to the probe tip is selected from the group of:
sinusoidal oscillation, sawtooth oscillation, and square oscillation.

11. A method according to claim 1 , in which a frequency of oscillation is selected from the group:
between 5 and 100,000 Hz, between 5 and 5,000 Hz, and between 30 and 110 Hz.

12. A method according to claim 1 , in which an amplitude of oscillation is selected from the group:
between 0.1 nm and 1 μm, between 5 nm and 500 nm, and between 15 nm and 250 nm.

13. A method according to claim 1 , further comprising using a measured electrochemical response of the probe to provide information about the surface of interest.

14. A method according to claim 13 , in which the electrochemical response of the probe tip is the current generated at the probe tip when held at a potential to interact with a species of interest.

15. A method according to claim 13 , in which the electrochemical response of the probe tip is the potential generated at the probe tip when interacting with a species of interest.

16. A method according to claim 13 , comprising using the electrochemical response of the probe tip to deliver chemical species to the surface of interest.

17. A method as claimed in claim 1 , wherein oscillating of the probe tip is normal or generally normal to the surface of interest.

18. A non-transitory computer readable medium having stored thereon machine readable code that when executed by a processor of a scanning microscopy apparatus cause the apparatus to perform a method comprising:
oscillating an ultramicroelectrode probe tip in height relative to a surface of interest using a piezoelectric positioner fitted with a strain gauge sensor;
detecting damping of an amplitude of the oscillation of the probe tip by detecting by the strain gauge sensor a decrease in the amplitude of the oscillation of the probe tip as compared to an amplitude of oscillation of the probe tip in a bulk solution, the decrease in the amplitude of the oscillation of the probe tip indicating intermittent contact with the surface of interest;
using the detected damping to detect the surface of interest; and
using the probe tip to measure or modify activity of the surface of interest simultaneously with detecting damping.

19. Apparatus configured:
to oscillate a scanning microscopy ultramicroelectrode probe tip in height relative to a surface of interest using a piezoelectric positioner fitted with a strain gauge sensor;
to detect damping of an amplitude of the oscillation of the probe tip by detecting by the strain gauge sensor a decrease in the amplitude of the oscillation of the probe tip as compared to an amplitude of oscillation of the probe tip in a bulk solution, the decrease in the amplitude of the oscillation of the probe tip indicating intermittent contact with the surface of interest;
to use the detected damping to detect the surface of interest; and
to use the probe tip to measure or modify activity of the surface of interest simultaneously with detecting damping.

Assignees

• Univ Warwick
• Univ Warwick

Inventors

• Unwin Patrick
• Mckelvey Kim Martin

Classifications

• G01Q60/60 Primary

  SECM [Scanning Electro-Chemical Microscopy] or apparatus therefor, e.g. SECM probes · CPC title

• B22D19/14

  the objects being filamentary or particulate in form (making alloys containing fibres or filaments by contacting the fibres or filaments with molten metal C22C47/08) · CPC title

• C23C26/02

  applying molten material to the substrate · CPC title

• E21C35/183

  with inserts or layers of wear-resisting material {(drill bits with wear-resistant parts E21B10/46)} · CPC title

• E21C35/1831

  Fixing methods or devices · CPC title