Polyimide film having improved heat resistance and method for manufacturing same
US-2019048143-A1 · Feb 14, 2019 · US
US11898009B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-11898009-B2 |
| Application number | US-201917048431-A |
| Country | US |
| Kind code | B2 |
| Filing date | Apr 19, 2019 |
| Priority date | Apr 20, 2018 |
| Publication date | Feb 13, 2024 |
| Grant date | Feb 13, 2024 |
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A flexible electronic device containing a polyimide film exhibiting excellent C-V characteristics. The polyimide film is a film that shows a maximum gradient of 0.005/V or more in a capacitance-voltage measurement of a laminate in which a polyimide film having a film thickness of 0.75 μm is formed on a silicon wafer having a resistance value of 4 Ωcm; the maximum gradient meaning a maximum value of an absolute value of a gradient in a normalized capacity-voltage curve during a third scan of forward direction scans; a capacity-voltage curve being measured by applying a direct current voltage is to the polyimide film with respect to the silicon wafer between a lowest voltage V 1 and a highest voltage V 2 , and measuring capacitance while the direct current voltage is scanned in a forward direction and scanned in a negative direction; the normalized capacity-voltage curve being normalized so that the capacity at the lowest voltage V 1 is 1.
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The invention claimed is: 1. A polyimide film-based flexible electronic device substrate formed from a polyimide that does not comprise a compound including a Si-containing group, wherein the polyimide has a maximum gradient of 0.005/V or more in a capacitance-voltage measurement of a laminate in which a polyimide film having a film thickness of 0.75 μm is formed on a silicon wafer having a resistance value of 4 Ωcm; wherein the maximum gradient is a maximum value of an absolute value of a gradient in a normalized capacity-voltage curve during a third scan of forward direction scans; wherein a capacity-voltage curve is measured by applying a direct current voltage to the polyimide film with respect to the silicon wafer between a lowest voltage V 1 and a highest voltage V 2 , and measuring capacitance while the direct current voltage is scanned in a forward direction from the lowest voltage V 1 to the highest voltage V 2 and scanned in a negative direction from the highest voltage V 2 to the lowest voltage V 1 ; where the lowest voltage V 1 is a voltage at which the capacity of only the polyimide film is observed, and the normalized capacity-voltage curve is normalized so that the capacity at the lowest voltage V 1 is 1. 2. The polyimide film-based flexible electronic device substrate according to claim 1 , wherein a weight ratio of an imide group (—CONCO—) in a repeating unit of the polyimide is less than 38.3 wt %. 3. The polyimide film-based flexible electronic device substrate according to claim 1 , wherein the concentration of amine end groups calculated from a feed ratio in the entire polyimide is 29 μmol/g or less. 4. A polyimide precursor comprising a repeating unit which is obtainable by reacting: a tetracarboxylic acid component (A) comprising at least 3,3′, 4,4′-biphenyltetracarboxylic dianhydride, and a diamine component (B) comprising: (B-1) at least one diamine selected from the group consisting of 1,4-diaminobenzene, [1.1′: 4′,1″-terphenyl]-4,4″-diamine, and 1,4-bis [2-(4-aminophenyl)-2-propyl]benzene, and (B-2) at least one diamine selected from the group consisting of 9,9-bis (4-aminophenyl) fluorene, 4,4′-(49H-fluorene-9,9-diyl)bis([1,1′-biphenyl]-5,2-diyl))bis(oxy))diamine, and 4,4′-([1,1′-binaphthalene]-2,2′-diylbis(oxy))diamine, with the proviso that when the diamine component (B) comprises 1,4-diaminobenzene and 9,9-bis(4-aminophenyl)fluorene), the amount of diamine compound(s) other than the diamine of (B-1) and the diamine (B-2) is 20 mol % or less, with the proviso that the repeating unit does not include a Si-containing group. 5. The polyimide precursor according to claim 4 , wherein the diamine component (B) comprises the diamine of (B-1) and the diamine of (B-2) in an amount of 40 mol % or more in total. 6. The polyimide precursor according to claim 4 , wherein a sum of ratios of the repeating units derived from 3,3′, 4,4′-biphenyltetracarboxylic dianhydride and the diamine (B-1) and the repeating units derived from 3,3′, 4,4′-biphenyltetracarboxylic dianhydride and the diamine (B-2) is 40 mol % or more. 7. A polyimide obtained by imidizing the polyimide precursor according to claim 4 . 8. A polyimide film comprising the polyimide according to claim 7 . 9. A flexible electronic device comprising the polyimide film according to claim 1 . 10. The flexible electronic device according to claim 9 , wherein the substrate is formed from the polyimide film according to claim 8 . 11. A method for manufacturing a flexible electronic device according to claim 9 , comprising: applying a polyimide precursor solution or a polyimide precursor solution composition onto a carrier substrate, and performing imidization to form a laminate having a carrier substrate and a polyimide film that becomes the substrate.
using temporary substrates · CPC title
characterised by materials, geometry or structure of the substrates · CPC title
wherein the TFTs are in active matrices · CPC title
Wholly aromatic polyimides, i.e. having both tetracarboxylic and diamino moieties aromatically bound · CPC title
the unsaturated precursors being wholly aromatic · CPC title
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