Method for extracting information from a display panel, device, and electronic device

US11880910B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11880910-B2
Application numberUS-202016969570-A
CountryUS
Kind codeB2
Filing dateMay 11, 2020
Priority dateApr 27, 2020
Publication dateJan 23, 2024
Grant dateJan 23, 2024

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Abstract

Official abstract text for this publication.

A method for extracting information from the display panel, a device, and an electronic device are provided. The method includes obtaining output instructions of auxiliary signs in a design drawing of the display panel, obtaining different types of default auxiliary sign specification parameters, collecting sign parameters of the auxiliary signs in the design drawing of the display panel according to the auxiliary sign specification parameters, and outputting the sign parameters of the auxiliary signs in the design drawing of the display panel.

First claim

Opening claim text (preview).

What is claimed is: 1. A method for extracting information from a design drawing of a display panel, comprising: by an electronic device, obtaining an instruction to output auxiliary signs in the design drawing; and in response to the instruction, obtaining a plurality of preset types of auxiliary sign specification parameters, acquiring sign parameters of the auxiliary signs from the design drawing according to the auxiliary sign specification parameters, and outputting the sign parameters, wherein the auxiliary signs comprise one or more types of auxiliary marks, the auxiliary sign specification parameters comprise a layer position of each of the types of auxiliary marks, a size of each auxiliary mark of each of the types of auxiliary marks, and a shape of each auxiliary mark of each of the types of auxiliary marks, and the sign parameters comprise respective coordinates of the auxiliary marks; and the acquiring of the sign parameters comprises: for each of the types of auxiliary marks, taking the each of the types of auxiliary marks as a target type of auxiliary marks, and determining a first target layer where the target type of auxiliary marks are located in the design drawing according to the auxiliary sign specification parameters; finding the target type of auxiliary marks in the first target layer according to a size of each auxiliary mark of the target type of auxiliary marks and a shape of each auxiliary mark of the target type of auxiliary marks that are indicated in the auxiliary sign specification parameters; and acquiring a coordinate of each auxiliary mark of the found target type of auxiliary marks. 2. The method according to claim 1 , wherein the sign parameters further comprise a value of a distance of each of the auxiliary marks from an edge, and the acquiring of the sign parameters further comprises: for each of the types of auxiliary marks, acquiring a value of a distance of each auxiliary mark of the found target type of auxiliary marks from the edge. 3. The method according to claim 1 , wherein the one or more types of auxiliary marks comprise at least one of a cutting alignment mark, a cutting inspection mark, an exposure alignment mark, or a metal layer positioning mark. 4. The method according to claim 1 , wherein the auxiliary signs further comprise one or more types of auxiliary testkeys, the auxiliary sign specification parameters comprise a layer position of each of the types of auxiliary testkeys, a size of each auxiliary testkey of each of the types of auxiliary testkeys, and a shape of each auxiliary testkey of each of the types of auxiliary testkeys, and the sign parameters further comprise respective coordinates of the auxiliary testkeys; and wherein the acquiring of the sign parameters further comprises: for each of the types of auxiliary testkeys, taking the each of the types of auxiliary testkeys as a target type of auxiliary testkeys, and determining a second target layer where the target type of auxiliary testkeys are located in the design drawing according to the auxiliary sign specification parameters; and acquiring respective coordinates of the target type of auxiliary testkeys in the second target layer. 5. The method according to claim 1 , wherein the display panel is an organic light emitting diode display panel. 6. The method according to claim 1 , further comprising: when the design drawing is updated, acquiring updated sign parameters of the auxiliary signs from the updated design drawing according to the auxiliary sign specification parameters; and outputting the updated sign parameters. 7. An electronic device, comprising: one or more processors; and a memory storing one or more applications executable by the processors to perform operations comprising: obtaining an instruction to output auxiliary signs in a design drawing of a display panel; and in response to the instruction, obtaining a plurality of preset types of auxiliary sign specification parameters, acquiring sign parameters of the auxiliary signs from the design drawing according to the auxiliary sign specification parameters, and outputting the sign parameters, wherein the auxiliary signs comprise one or more types of auxiliary marks, the auxiliary sign specification parameters comprise a layer position of each of the types of auxiliary marks, a size of each auxiliary mark of each of the types of auxiliary marks, and a shape of each auxiliary mark of each of the types of auxiliary marks, and the sign parameters comprise respective coordinates of the auxiliary marks; and the acquiring of the sign parameters comprises: for each of the types of auxiliary marks, taking the each of the types of auxiliary marks as a target type of auxiliary marks, and determining a first target layer where the target type of auxiliary marks are located in the design drawing according to the auxiliary sign specification parameters; finding the target type of auxiliary marks in the first target layer according to a size of each auxiliary mark of the target type of auxiliary marks and a shape of each auxiliary mark of the target type of auxiliary marks that are indicated in the auxiliary sign specification parameters; and acquiring a coordinate of each auxiliary mark of the found target type of auxiliary marks. 8. The electronic device according to claim 7 , wherein the sign parameters further comprise a value of a distance of each of the auxiliary marks from an edge, and the acquiring of the sign parameters further comprises: for each of the types of auxiliary marks, acquiring a value of a distance of each auxiliary mark of the found target type of auxiliary marks from the edge. 9. The electronic device according to claim 7 , wherein the one or more types of auxiliary marks comprise at least one of a cutting alignment mark, a cutting inspection mark, an exposure alignment mark, or a metal layer positioning mark. 10. The electronic device according to claim 7 , wherein the auxiliary signs further comprise one or more types of auxiliary testkeys, the auxiliary sign specification parameters comprise a layer position of each of the types of auxiliary testkeys, a size of each auxiliary testkey of each of the types of auxiliary testkeys, and a shape of each auxiliary testkey of each of the types of auxiliary testkeys, and the sign parameters further comprise respective coordinates of the auxiliary testkeys; and wherein the acquiring of the sign parameters further comprises: for each of the types of auxiliary testkeys, taking the each of the types of auxiliary testkeys as a target type of auxiliary testkeys, and determining a second target layer where the target type of auxiliary testkeys are located in the design drawing according to the auxiliary sign specification parameters; and acquiring respective coordinates of the target type of auxiliary testkeys in the second target layer. 11. The electronic device according to claim 7 , wherein the display panel is an organic light emitting diode display panel. 12. The electronic device according to claim 7 , wherein the operations further comprise: when the design drawing is updated, acquiring updated sign parameters of the auxiliary signs from the updated design drawing according to the auxiliary sign specification parameters; and outputting the updated sign parameters. 13. A non-transitory computer-readable storage medium, storing one or more applications executable by one or more processors to perform operations comprising: obtaining an instruction to output auxiliary signs in a design drawing of a display panel; and in response to the instruction, obtaining a plurality of preset types

Assignees

Inventors

Classifications

  • G06T11/00Primary

    Two-dimensional [2D] image generation · CPC title

  • G06F30/10Primary

    Geometric CAD · CPC title

  • Design verification or optimisation, e.g. using design rule check [DRC], layout versus schematics [LVS] or finite element methods [FEM] (optical proximity correction [OPC] design processes G03F1/36) · CPC title

  • G06F30/00Primary

    Computer-aided design [CAD] · CPC title

  • Design optimisation, verification or simulation (optimisation, verification or simulation of circuit designs G06F30/30) · CPC title

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What does patent US11880910B2 cover?
A method for extracting information from the display panel, a device, and an electronic device are provided. The method includes obtaining output instructions of auxiliary signs in a design drawing of the display panel, obtaining different types of default auxiliary sign specification parameters, collecting sign parameters of the auxiliary signs in the design drawing of the display panel accord…
Who is the assignee on this patent?
Shenzhen China Star Optoelectronics Semiconductor Display Tech Co Ltd
What technology area does this patent fall under?
Primary CPC classification G06T11/00. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jan 23 2024 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).