Information coding in dendritic structures and tags

US11875501B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11875501-B2
Application numberUS-202017072701-A
CountryUS
Kind codeB2
Filing dateOct 16, 2020
Priority dateNov 7, 2014
Publication dateJan 16, 2024
Grant dateJan 16, 2024

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Abstract

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Disclosed are methods and systems that include obtaining at least one image of a dendritic structure, analyzing the at least one image to identify one or more features associated with the dendritic structure, and determining a numerical value associated with the dendritic structure based on the one or more features.

First claim

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What is claimed is: 1. A method comprising: obtaining a first image of a first subset of units of a dendritic structure, wherein the dendritic structure is a fractal dendritic structure; analyzing, using an electronic processor, the first image to identify a first set of one or more features associated with the first subset of units of the dendritic structure; determining a first numerical value associated with the first subset of units of the dendritic structure based on the first set of one or more features; obtaining a second image of a second subset of units of the dendritic structure; analyzing, using an electronic processor, the second image to identify a second set of one or more features associated with the second subset of units of the dendritic structure; determining a second numerical value associated with the second subset of units of the dendritic structure based on the second set of one or more features; comparing, using an electronic processor, at least one of the first and second numerical values associated with the first and second subset of units of the dendritic structure, respectively, with stored information comprising reference numerical values associated with known dendritic structures; and based on the comparing, assessing whether the dendritic structure corresponds to one of the known dendritic structures, wherein: determining the first numerical value comprises determining a base n-digit associated with each of at least some of the one or more features associated with the first subset of units of the dendritic structure, wherein n is, independently for each subset of units, greater than 2, or determining the second numerical value comprises determining a base n-digit associated with each of at least some of the one or more features associated with the second subset of units of the dendritic structure, wherein n is, independently for each subset of units, greater than 2. 2. The method of claim 1 , wherein the first set of one or more features comprises one or more angles between segments of the first subset of units of the dendritic structure. 3. The method of claim 1 , wherein the first set of one or more features comprises one or more lengths of segments of the first subset of units of the dendritic structure. 4. The method of claim 3 , wherein the first set of one or more features comprises one or more distances of locations on the first subset of units of the dendritic structure from a reference point. 5. The method of claim 1 , wherein the first set of one or more features comprises one or more angles of rotation of locations on the first subset of units of the dendritic structure relative to a reference line. 6. The method of claim 1 , wherein the second set of one or more features comprises one or more angles between segments of the second subset of units of the dendritic structure. 7. The method of claim 1 , wherein the second set of one or more features comprises one or more lengths of segments of the second subset of units of the dendritic structure. 8. The method of claim 1 , wherein the second set of one or more features comprises one or more distances of locations on the second subset of units of the dendritic structure from a reference point. 9. The method of claim 1 , wherein the second set of one or more features comprises one or more angles of rotation of locations on the second subset of units of the dendritic structure relative to a reference line. 10. The method of claim 1 , wherein the second subset of units of the dendritic structure mitigates dendritic pattern errors within the first subset of units of the dendritic structure. 11. A method comprising: obtaining a first image of a first subset of units of a dendritic structure, wherein the dendritic structure is a fractal dendritic structure; analyzing, using an electronic processor, the first image to identify a first set of one or more features associated with the first subset of units of the dendritic structure; determining a first numerical value associated with the first subset of units of the dendritic structure based on the first set of one or more features; obtaining a second image of a second subset of units of the dendritic structure; analyzing, using an electronic processor, the second image to identify a second set of one or more features associated with the second subset of units of the dendritic structure; determining a second numerical value associated with the second subset of units of the dendritic structure based on the second set of one or more features; comparing, using an electronic processor, at least one of the first and second numerical values associated with the first and second subset of units of the dendritic structure, respectively, with stored information comprising reference numerical values associated with known dendritic structures; and based on the comparing, assessing whether the dendritic structure corresponds to one of the known dendritic structures, wherein: the first set of one or more features comprises one or more angles of rotation of locations on the first subset of units of the dendritic structure relative to a reference line, or the second set of one or more features comprises one or more angles of rotation of locations on the second subset of units of the dendritic structure relative to a reference line. 12. The method of claim 11 , wherein the first set of one or more features comprises one or more angles between segments of the first subset of units of the dendritic structure. 13. The method of claim 11 , wherein the first set of one or more features comprises one or more lengths of segments of the first subset of units of the dendritic structure. 14. The method of claim 11 , wherein the first set of one or more features comprises one or more distances of locations on the first subset of units of the dendritic structure from a reference point. 15. The method of claim 11 , wherein the second set of one or more features comprises one or more angles between segments of the second subset of units of the dendritic structure. 16. The method of claim 11 , wherein the second set of one or more features comprises one or more lengths of segments of the second subset of units of the dendritic structure. 17. The method of claim 11 , wherein the second set of one or more features comprises one or more distances of locations on the second subset of units of the dendritic structure from a reference point. 18. The method of claim 11 , wherein determining the first numerical value comprises determining a base n-digit associated with each of at least some of the one or more features associated with the first subset of units of the dendritic structure, wherein n is, independently for each subset of units, greater than 2. 19. The method of claim 11 , wherein determining the second numerical value comprises determining a base n-digit associated with each of at least some of the one or more features associated with the second subset of units of the dendritic structure, wherein n is, independently for each subset of units, greater than 2. 20. The method of claim 11 , wherein the second subset of units of the dendritic structure mitigates dendritic pattern errors within the first subset of units of the dendritic structure.

Assignees

Inventors

Classifications

  • G06T7/0008Primary

    checking presence/absence · CPC title

  • B42D25/36Primary

    comprising special materials · CPC title

  • Metallic materials · CPC title

  • Dendritic macromolecules · CPC title

  • of area, perimeter, diameter or volume · CPC title

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Frequently asked questions

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What does patent US11875501B2 cover?
Disclosed are methods and systems that include obtaining at least one image of a dendritic structure, analyzing the at least one image to identify one or more features associated with the dendritic structure, and determining a numerical value associated with the dendritic structure based on the one or more features.
Who is the assignee on this patent?
Kozicki Michael N, Univ Arizona State
What technology area does this patent fall under?
Primary CPC classification G06T7/0008. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jan 16 2024 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 12 related publications on this page (citations in our corpus or others sharing the same primary CPC).