Fabrication of dendritic structures and tags
US-2021230763-A1 · Jul 29, 2021 · US
US11875501B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-11875501-B2 |
| Application number | US-202017072701-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 16, 2020 |
| Priority date | Nov 7, 2014 |
| Publication date | Jan 16, 2024 |
| Grant date | Jan 16, 2024 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
Disclosed are methods and systems that include obtaining at least one image of a dendritic structure, analyzing the at least one image to identify one or more features associated with the dendritic structure, and determining a numerical value associated with the dendritic structure based on the one or more features.
Opening claim text (preview).
What is claimed is: 1. A method comprising: obtaining a first image of a first subset of units of a dendritic structure, wherein the dendritic structure is a fractal dendritic structure; analyzing, using an electronic processor, the first image to identify a first set of one or more features associated with the first subset of units of the dendritic structure; determining a first numerical value associated with the first subset of units of the dendritic structure based on the first set of one or more features; obtaining a second image of a second subset of units of the dendritic structure; analyzing, using an electronic processor, the second image to identify a second set of one or more features associated with the second subset of units of the dendritic structure; determining a second numerical value associated with the second subset of units of the dendritic structure based on the second set of one or more features; comparing, using an electronic processor, at least one of the first and second numerical values associated with the first and second subset of units of the dendritic structure, respectively, with stored information comprising reference numerical values associated with known dendritic structures; and based on the comparing, assessing whether the dendritic structure corresponds to one of the known dendritic structures, wherein: determining the first numerical value comprises determining a base n-digit associated with each of at least some of the one or more features associated with the first subset of units of the dendritic structure, wherein n is, independently for each subset of units, greater than 2, or determining the second numerical value comprises determining a base n-digit associated with each of at least some of the one or more features associated with the second subset of units of the dendritic structure, wherein n is, independently for each subset of units, greater than 2. 2. The method of claim 1 , wherein the first set of one or more features comprises one or more angles between segments of the first subset of units of the dendritic structure. 3. The method of claim 1 , wherein the first set of one or more features comprises one or more lengths of segments of the first subset of units of the dendritic structure. 4. The method of claim 3 , wherein the first set of one or more features comprises one or more distances of locations on the first subset of units of the dendritic structure from a reference point. 5. The method of claim 1 , wherein the first set of one or more features comprises one or more angles of rotation of locations on the first subset of units of the dendritic structure relative to a reference line. 6. The method of claim 1 , wherein the second set of one or more features comprises one or more angles between segments of the second subset of units of the dendritic structure. 7. The method of claim 1 , wherein the second set of one or more features comprises one or more lengths of segments of the second subset of units of the dendritic structure. 8. The method of claim 1 , wherein the second set of one or more features comprises one or more distances of locations on the second subset of units of the dendritic structure from a reference point. 9. The method of claim 1 , wherein the second set of one or more features comprises one or more angles of rotation of locations on the second subset of units of the dendritic structure relative to a reference line. 10. The method of claim 1 , wherein the second subset of units of the dendritic structure mitigates dendritic pattern errors within the first subset of units of the dendritic structure. 11. A method comprising: obtaining a first image of a first subset of units of a dendritic structure, wherein the dendritic structure is a fractal dendritic structure; analyzing, using an electronic processor, the first image to identify a first set of one or more features associated with the first subset of units of the dendritic structure; determining a first numerical value associated with the first subset of units of the dendritic structure based on the first set of one or more features; obtaining a second image of a second subset of units of the dendritic structure; analyzing, using an electronic processor, the second image to identify a second set of one or more features associated with the second subset of units of the dendritic structure; determining a second numerical value associated with the second subset of units of the dendritic structure based on the second set of one or more features; comparing, using an electronic processor, at least one of the first and second numerical values associated with the first and second subset of units of the dendritic structure, respectively, with stored information comprising reference numerical values associated with known dendritic structures; and based on the comparing, assessing whether the dendritic structure corresponds to one of the known dendritic structures, wherein: the first set of one or more features comprises one or more angles of rotation of locations on the first subset of units of the dendritic structure relative to a reference line, or the second set of one or more features comprises one or more angles of rotation of locations on the second subset of units of the dendritic structure relative to a reference line. 12. The method of claim 11 , wherein the first set of one or more features comprises one or more angles between segments of the first subset of units of the dendritic structure. 13. The method of claim 11 , wherein the first set of one or more features comprises one or more lengths of segments of the first subset of units of the dendritic structure. 14. The method of claim 11 , wherein the first set of one or more features comprises one or more distances of locations on the first subset of units of the dendritic structure from a reference point. 15. The method of claim 11 , wherein the second set of one or more features comprises one or more angles between segments of the second subset of units of the dendritic structure. 16. The method of claim 11 , wherein the second set of one or more features comprises one or more lengths of segments of the second subset of units of the dendritic structure. 17. The method of claim 11 , wherein the second set of one or more features comprises one or more distances of locations on the second subset of units of the dendritic structure from a reference point. 18. The method of claim 11 , wherein determining the first numerical value comprises determining a base n-digit associated with each of at least some of the one or more features associated with the first subset of units of the dendritic structure, wherein n is, independently for each subset of units, greater than 2. 19. The method of claim 11 , wherein determining the second numerical value comprises determining a base n-digit associated with each of at least some of the one or more features associated with the second subset of units of the dendritic structure, wherein n is, independently for each subset of units, greater than 2. 20. The method of claim 11 , wherein the second subset of units of the dendritic structure mitigates dendritic pattern errors within the first subset of units of the dendritic structure.
checking presence/absence · CPC title
comprising special materials · CPC title
Metallic materials · CPC title
Dendritic macromolecules · CPC title
of area, perimeter, diameter or volume · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.