Semiconductor device, control flow inspection method, non-transitory computer readable medium, and electronic device

Patent metadata

Field	Value
Publication number	US-11868467-B2
Application number	US-201917620804-A
Country	US
Kind code	B2
Filing date	Jun 25, 2019
Priority date	Jun 25, 2019
Publication date	Jan 9, 2024
Grant date	Jan 9, 2024

Abstract

A semiconductor device ( 100 ) includes: a determination unit ( 110 ) configured to determine whether an avoidance condition of inspection of control flow integrity is satisfied (e.g., a degree of similarity with a previous input value is in a predetermined range) based on determination auxiliary information, which is at least an input value in a target code block to be executed among a plurality of code blocks in a predetermined program, and an inspection unit ( 120 ) configured to avoid inspection of control flow integrity in the target code block when it is determined that the avoidance condition is satisfied.

First claim

What is claimed is:

1. A semiconductor device comprising:
at least one memory configured to store instructions; and
at least one processor configured to execute the instructions to:
acquire, as determination auxiliary information, at least one input value to a target code block to be executed among a plurality of code blocks in a predetermined program;
determine whether an avoidance condition of inspection of control flow integrity is satisfied based on the at least one input value to the target code block, by checking whether a data content of the at least one input value matches a predetermined value or whether a data size of the at least one input value is within a predetermined range; in response to the determination indicating that the avoidance condition has been satisfied, not perform avoid the inspection of the control flow integrity in the target code block;
in response to the determination indicating that the avoidance condition has not been satisfied, perform the inspection of the control flow integrity in the target code block,
wherein not performing the inspection of the control flow integrity when the avoidance condition has been satisfied reduces processing overhead while maintaining security during execution of the predetermined program.

2. The semiconductor device according to claim 1 , wherein the at least one processor is further configured to execute the instructions to
make the determination using a degree of similarity with previous determination auxiliary information at a time of past execution in the target code block as the avoidance condition.

3. The semiconductor device according to claim 1 , wherein
the determination auxiliary information further includes at least one internal state variable value when the target code block is executed, and
the at least one processor is further configured to execute the instructions to
take into account a range of the at least one internal state variable value as the avoidance condition when making the determination.

4. The semiconductor device according to claim 1 , wherein the at least one processor is further configured to execute the instructions to
set an avoidance level in accordance with a degree to which the avoidance condition is satisfied when the determination indicates that the avoidance condition is satisfied, and
perform or not perform the inspection in accordance with the avoidance level.

5. The semiconductor device according to claim 4 , wherein a threshold of the avoidance level is defined in advance in each of the plurality of code blocks, and
the at least one processor is further configured to execute the instructions to
perform or not perform the inspection when the avoidance level satisfies the threshold of the avoidance level defined in the target code block.

6. The semiconductor device according to claim 1 , further comprising a storage apparatus configured to store history information of the determination auxiliary information, wherein
the at least one processor is further configured to execute the instructions to:
acquire the determination auxiliary information in the target code block;
make the determination based on the history information and the acquired determination auxiliary information; and
add the acquired determination auxiliary information in the storage apparatus as additional history information in accordance with the result of the determination.

7. The semiconductor device according to claim 6 , wherein the at least one processor is further configured to execute the instructions to
make the determination using a determination model in which the avoidance condition is learned using the history information.

8. The semiconductor device according to claim 7 , wherein the at least one processor is further configured to execute the instructions to
update parameters by learning the avoidance condition of the determination model using the history information.

9. The semiconductor device according to claim 1 , wherein
the semiconductor device includes a secure area and a non-secure area,
the secure area includes at least the at least one memory, a determination circuit and an inspection circuit,
the non-secure area includes the at least one processor, and
the determination circuit is configured to make the determination in accordance with execution of an inspection instruction for calling inspection of the control flow integrity set in the target code block by the at least one processor.

10. A control flow inspection method, comprising:
acquiring, by a computer and as determination auxiliary information, at least one input value to a target code block to be executed among a plurality of code blocks in a predetermined program;
a determining, by the computer, of whether an avoidance condition of inspection of control flow integrity is satisfied based on the at least one input value to the target code block, by checking whether a data content of the at least one input value matches a predetermined value or whether a data size of the at least one input value is within a predetermined range;
in response to the determination indicating that the avoidance condition has been satisfied, not performing, by the computer, the inspection of the control flow integrity in the target code block;
in response to the determination indicating that the avoidance condition has not been satisfied, performing, by the computer, the inspection of the control flow integrity in the target code block,
wherein not performing the inspection of the control flow integrity when the avoidance condition has been satisfied reduces processing overhead while maintaining security during execution of the predetermined program.

11. A non-transitory computer readable medium storing a control flow inspection program executable by a computer to perform:
acquiring, as determination auxiliary information, at least one input value to a target code block to be executed among a plurality of code blocks in a predetermined program;
determining whether an avoidance condition of inspection of control flow integrity is satisfied based on the at least one input value to the target code block, by checking whether a data content of the at least one input value matches a predetermined value or whether a data size of the at least one input value is within a predetermined range;
in response to the determination indicating that the avoidance condition has been satisfied, not performing the avoid the inspection of the control flow integrity in the target code block;
in response to the determination indicating that the avoidance condition has not been satisfied, performing the inspection of the control flow integrity in the target code block,
wherein not performing the inspection of the control flow integrity when the avoidance condition has been satisfied reduces processing overhead while maintaining security during execution of the predetermined program.

12. An electronic device comprising a semiconductor device,
wherein the semiconductor device comprises:
at least one memory configured to store instructions; and
at least one processor configured to execute the instructions to:
acquire, as determination auxiliary information, at least one input value to a target code block to be executed among a plurality of code blocks in a predetermined program;
determine whether an avoidance condition of inspection of control flow integrity is satisfied based on the at least one input value to the target code block, by checking whether a data content of the at least one input value matches a predetermined value or whether a data size of the at least one input value is within a predetermined range;
in respo

Assignees

• Nec Corp

Inventors

• JADA Astha
• Kobayashi Toshiki
• Sasaki Takayuki
• ASONI Daniele Enrico
• Perrig Adrian

Classifications

• G06F21/54 Primary

  by adding security routines or objects to programs · CPC title

• G06F21/53 Primary

  by executing in a restricted environment, e.g. sandbox or secure virtual machine · CPC title

• G06F21/565

  by checking file integrity · CPC title