Silica particle and method for producing the same

US11866340B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11866340-B2
Application numberUS-202016997541-A
CountryUS
Kind codeB2
Filing dateAug 19, 2020
Priority dateMar 24, 2020
Publication dateJan 9, 2024
Grant dateJan 9, 2024

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  1. Title

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Abstract

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A silica particle includes: a quaternary ammonium salt, in which the following expressions are satisfied, 0.90≤F BEFORE /F AFTER ≤1.10, and 5≤F SINTERING /F BEFORE ≤20, in which F BEFORE represents a maximum frequency value of a pore diameter of 2 nm or less in the silica particles before washing, which is obtained from a pore distribution curve in a nitrogen gas adsorption method, F AFTER represents a maximum frequency value of the pore diameter of 2 nm or less in the silica particles after washing, which is obtained from the pore distribution curve in the nitrogen gas adsorption method, and F SINTERING represents a maximum frequency value of the pore diameter of 2 nm or less in the silica particles before washing and after sintering at 600° C., which is obtained from the pore distribution curve in the nitrogen gas adsorption method.

First claim

Opening claim text (preview).

What is claimed is: 1. Silica particles, comprising: the silica particles containing a quaternary ammonium salt, wherein the following expressions are satisfied, 0.90≤ F BEFORE /F AFTER ≤1.10, and 5≤ F SINTERING /F BEFORE ≤20, wherein F BEFORE represents a maximum frequency value of a pore diameter of 2 nm or less in the silica particles before washing, which is obtained from a pore distribution curve in a nitrogen gas adsorption method; F AFTER represents a maximum frequency value of a pore diameter of 2 nm or less in the silica particles after washing, which is obtained from a pore distribution curve in the nitrogen gas adsorption method; and F SINTERING represents a maximum frequency value of a pore diameter of 2 nm or less in the silica particles before washing and after sintering at 600° C., which is obtained from a pore distribution curve in the nitrogen gas adsorption method. 2. The silica particles according to claim 1 , wherein the quaternary ammonium salt contains a compound represented by a general formula (AM), wherein, in the general formula (AM), R 1 , R 2 , R 3 and R 4 each independently represents an optionally substituted alkyl group, aralkyl group or aryl group, X − represents an anion, and two or more of R 1 , R 2 , R 3 and R 4 may be linked to each other to form a ring. 3. The silica particles according to claim 2 , wherein, in the general formula (AM), R 1 , R 2 , R 3 and R 4 each independently represents an optionally substituted alkyl group having 1 or more and 16 or less carbon atoms, or an optionally substituted aralkyl group having 7 or more and 10 or less carbon atoms. 4. The silica particles according to claim 1 , wherein a number average particle diameter of the silica particles is 5 nm or more and 300 nm or less. 5. The silica particles according to claim 1 , wherein a number average particle diameter of the silica particles is 5 nm or more and 100 nm or less. 6. The silica particles according to claim 1 , wherein the silica particles satisfy the following expression: 0.01≤ N /(silica particle)×100≤1.00, wherein N represents an abundance of a nitrogen element derived from the quaternary ammonium salt detected by an oxygen and nitrogen analysis, and (silica particle) represents a total weight of the silica particles. 7. The silica particles according to claim 1 , wherein an average pore diameter of the silica particle is 0.55 nm or more and 2.00 nm or less. 8. The silica particles according to claim 1 , wherein the silica particles are is hydrophobically treated silica. 9. The silica particles according to claim 1 , wherein the silica particles contain aluminum. 10. The silica particles according to claim 9 , wherein a ratio Si/Al of an abundance Si of a silicon element detected by an X-ray photoelectron spectroscopy to an abundance Al of an aluminum element detected by the X-ray photoelectron spectroscopy is 0.01 or more and 0.30 or less. 11. A method for producing the silica particles according to claim 1 , comprising: preparing a silica particles-containing suspension; and then mixing the silica particles-containing suspension with the quaternary ammonium salt to obtain a powder in which the silica particles are surface-treated with the quaternary ammonium salt using a supercritical fluid. 12. The method for producing the silica particles according to claim 11 , further comprising: surface-treating the powder with an organosilicon compound in the supercritical fluid after the mixing.

Assignees

Inventors

Classifications

  • C01B33/18Primary

    Preparation of finely divided silica neither in sol nor in gel form; After-treatment thereof (preparation of aerogels by dehydrating gels C01B33/158; treatment to enhance the pigmenting or filling properties C09C) · CPC title

  • Coating · CPC title

  • Treatment with organo-silicon compounds · CPC title

  • Nanometer sized, i.e. from 1-100 nanometer · CPC title

  • Pore diameter · CPC title

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What does patent US11866340B2 cover?
A silica particle includes: a quaternary ammonium salt, in which the following expressions are satisfied, 0.90≤F BEFORE /F AFTER ≤1.10, and 5≤F SINTERING /F BEFORE ≤20, in which F BEFORE represents a maximum frequency value of a pore diameter of 2 nm or less in the silica particles before washing, which is obtained from a pore distribution curve in a nitrogen gas adsorption method, F AFTER re…
Who is the assignee on this patent?
Fujifilm Business Innovation Corp
What technology area does this patent fall under?
Primary CPC classification C01B33/18. Mapped technology areas include Chemistry & Metallurgy.
When was this patent published?
Publication date Tue Jan 09 2024 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).