Semiconductor light emitting device

Patent metadata

Field	Value
Publication number	US-11848401-B2
Application number	US-202318096628-A
Country	US
Kind code	B2
Filing date	Jan 13, 2023
Priority date	Jul 31, 2017
Publication date	Dec 19, 2023
Grant date	Dec 19, 2023

Abstract

A semiconductor light emitting device includes a multi-quantum-well structure, a first capping layer, a second capping layer, and an electron barrier layer stacked in order. The multi-quantum-well structure includes a plurality of alternately-stacked potential barrier layers and potential well layers. The first capping layer is a semiconductor layer, and the second capping layer is a p-doped semiconductor layer. Each of the first and second capping layers has an aluminum mole fraction larger than that of each of the potential barrier layers, and the aluminum mole fraction of the first capping layer is larger than that of at least a portion of the electron barrier layer. A method for preparing the semiconductor light emitting device is also provided.

First claim

What is claimed is:

1. A semiconductor light emitting device, comprising:
an n-type semiconductor layer, a multi-quantum-well structure, a first capping layer, a second capping layer, an electron barrier layer, a p-type semiconductor layer, and a p-type contact layer stacked in order,
wherein said multi-quantum-well structure includes a plurality of alternately-stacked potential barrier layers and potential well layers;
wherein said first capping layer is one of an undoped semiconductor layer and a p-doped semiconductor layer, said second capping layer being a p-doped semiconductor layer;
wherein said first capping layer has an aluminum mole fraction larger than that of each of said potential barrier layers; and
wherein said electron barrier layer includes a first electron barrier sublayer and a second electron barrier sublayer, and the aluminum mole fraction of said first capping layer being larger than that of said second electron barrier sublayer.

2. The semiconductor light emitting device as claimed in claim 1 , wherein said first electron barrier sublayer and said second electron barrier sublayer are sequentially formed on said second capping layer in such order.

3. The semiconductor light emitting device as claimed in claim 1 , wherein said second electron barrier sublayer and said first electron barrier sublayer are sequentially formed on said second capping layer in such order.

4. The semiconductor light emitting device as claimed in claim 3 , wherein said first electron barrier sublayer has a thickness less than that of said second electron barrier sublayer.

5. The semiconductor light emitting device as claimed in claim 1 , wherein said electron barrier layer further includes a third electron barrier sublayer formed on said second electron barrier sublayer opposite to said first electron barrier sublayer.

6. The semiconductor light emitting device as claimed in claim 5 , wherein each of said first and third electron barrier sublayers has a thickness less than that of said second electron barrier sublayer.

7. The semiconductor light emitting device as claimed in claim 1 , wherein said second electron barrier sublayer has a thickness larger than that of said first electron barrier sublayer.

8. The semiconductor light emitting device as claimed in claim 1 , wherein said electron barrier layer has an aluminum mole fraction not less than that of said second capping layer.

9. The semiconductor light emitting device as claimed in claim 1 , wherein the aluminum mole fraction of said first capping layer is larger than that of said second capping layer.

10. The semiconductor light emitting device as claimed in claim 1 , wherein said second capping layer has a thickness larger than that of each of said potential well layers of said multi-quantum-well structure.

11. The semiconductor light emitting device as claimed in claim 1 , wherein said second capping layer has a p-type doping concentration higher than that of said p-type semiconductor layer and lower than that of said p-type contact layer.

12. The semiconductor light emitting device as claimed in claim 1 , wherein said second capping layer has a p-type doping concentration between 1× 19 cm −3 and 5×10 20 cm −3 .

13. The semiconductor light emitting device as claimed in claim 1 , wherein said second capping layer has a thickness less than 40 nm.

14. The semiconductor light emitting device as claimed in claim 1 , wherein said second capping layer is an aluminum gallium indium nitride (AlGaInN)-containing layer.

15. The semiconductor light emitting device as claimed in claim 14 , wherein said second capping layer has an aluminum mole fraction not larger than that of said electron barrier layer.

16. The semiconductor light emitting device as claimed in claim 1 , further comprising a growth substrate formed on said n-type semiconductor layer opposite to said multi-quantum-well structure.

17. The semiconductor light emitting device as claimed in claim 1 , wherein each of said potential barrier layers is one of an undoped semiconductor layer and an n-doped semiconductor layer.

18. The semiconductor light emitting device as claimed in claim 1 , wherein said electron barrier layer further includes a third electron barrier sublayer formed on said second electron barrier sublayer opposite to said first electron barrier sublayer, at least one of said first and third electron barrier sublayers having a thickness less than 5 nm.

19. The semiconductor light emitting device as claimed in claim 16 , further comprising a buffer layer formed between said n-type semiconductor layer and said growth substrate, said buffer layer being made from a material selected from the group consisting of AlN, gallium nitride (GaN), AlGaN, aluminum indium gallium nitride (AlInGaN), indium nitride (InN), indium gallium nitride (InGaN) and combinations thereof.

Assignees

• Xiamen Sanan Optoelectronics Co Ltd

Inventors

• Lan Yung-Ling
• LING Chan-Chan
• Tsai Chi-Ming
• Chang Chia-Hung

Classifications

• H10H20/815

  having stress relaxation structures, e.g. buffer layers · CPC title

• H10H20/812 Primary

  within the light-emitting regions, e.g. having quantum confinement structures · CPC title

• H10H20/825

  containing nitrogen, e.g. GaN · CPC title

• H10H20/816 Primary

  having carrier transport control structures, e.g. highly-doped semiconductor layers or current-blocking structures · CPC title

• H10H20/811

  having quantum effect structures or superlattices, e.g. tunnel junctions · CPC title