Component concentration measurement device and component concentration measurement method

Patent metadata

Field	Value
Publication number	US-11839468-B2
Application number	US-201917048343-A
Country	US
Kind code	B2
Filing date	Apr 11, 2019
Priority date	Apr 20, 2018
Publication date	Dec 12, 2023
Grant date	Dec 12, 2023

Abstract

A component concentration measuring apparatus includes: a dielectric spectroscopy portion that irradiates a measurement subject with electromagnetic waves and measures a complex permittivity, thereby acquiring a dielectric spectroscopy spectrum; a temperature measurement portion that measures a temperature of the measurement subject; a signal processing portion that corrects the dielectric spectroscopy spectrum according to the temperature measured by the temperature measurement portion; and a calculating portion that applies a calibration model generated in advance from a dielectric spectroscopy spectrum of a sample whose component concentration is known, to the dielectric spectroscopy spectrum corrected by the signal processing portion, thereby calculating a component concentration of the measurement subject. A dielectric spectroscopy sensor that transmits and receives electromagnetic waves and a temperature sensor that outputs a signal that changes in accordance with a temperature are fixed to the measurement probe such that a certain distance is interposed between the sensors.

First claim

The invention claimed is:

1. A component concentration measuring apparatus comprising:
a dielectric spectroscopy portion that irradiates a measurement subject with first electromagnetic waves and measures a complex permittivity to acquire a dielectric spectroscopy spectrum;
a temperature measurement portion that measures a temperature of the measurement subject;
a correcting portion that corrects the dielectric spectroscopy spectrum according to the temperature measured by the temperature measurement portion and a temperature correction coefficient, the temperature correction coefficient being determined in advance from a sample dielectric spectroscopy spectrum of a sample, wherein the sample dielectric spectroscopy spectrum of the sample is acquired by irradiating the sample while changing a temperature of the sample and while irradiating the sample with electromagnetic waves across a plurality of wavelengths; and
a calculator that applies a calibration model to the dielectric spectroscopy spectrum corrected by the correcting portion to calculate a component concentration of the measurement subject, wherein the calibration model is generated in advance from a dielectric spectroscopy spectrum of a sample with a known component concentration.

2. The component concentration measuring apparatus according to claim 1 , further comprising:
a measurement probe, wherein a dielectric spectroscopy sensor that transmits and receives electromagnetic waves and a temperature sensor that outputs a signal that changes in accordance with a temperature are fixed to the measurement probe such that a certain distance is interposed between the dielectric spectroscopy sensor and the temperature sensor, wherein the dielectric spectroscopy portion irradiates the measurement subject with the first electromagnetic waves via the dielectric spectroscopy sensor and receives second electromagnetic waves from the measurement subject via the dielectric spectroscopy sensor to acquire the dielectric spectroscopy spectrum, and wherein the temperature measurement portion converts a signal output from the temperature sensor into a temperature value.

3. The component concentration measuring apparatus according to claim 2 , wherein the measurement probe is placed in direct contact with the measurement subject.

4. The component concentration measuring apparatus according to claim 2 , wherein the measurement probe is physically separated from the measurement subject.

5. The component concentration measuring apparatus according to claim 1 , wherein the correcting portion corrects the dielectric spectroscopy spectrum acquired by the dielectric spectroscopy portion, according to a time-series change in the temperature, the time-series change in the temperature being from a time when measurement of the component concentration is started.

6. The component concentration measuring apparatus according to claim 1 , wherein the sample is made of the same material as a measurement subject, and wherein a component concentration of the sample is known.

7. The component concentration measuring apparatus according to claim 1 , wherein irradiating the sample with the electromagnetic waves across the plurality of wavelengths comprises irradiating the sample with electromagnetic waves in microwave to millimeter-wave bands.

8. A component concentration measuring method comprising:
irradiating a measurement subject with electromagnetic waves;
measuring a complex permittivity to acquire a dielectric spectroscopy spectrum of the measurement subject;
measuring a temperature of the measurement subject;
correcting the dielectric spectroscopy spectrum according to the temperature of the measurement subject and a temperature correction coefficient, the temperature correction coefficient being determined in advance from a sample dielectric spectroscopy spectrum of a sample, wherein the sample dielectric spectroscopy spectrum of the sample is acquired by irradiating the sample while changing a temperature of the sample and while irradiating the sample with electromagnetic waves across a plurality of wavelengths; and
applying a calibration model to the dielectric spectroscopy spectrum corrected according to the temperature of the measurement subject to calculate a component concentration of the measurement subject, wherein the calibration model is generated in advance from a dielectric spectroscopy spectrum of a sample having a known component concentration.

9. The component concentration measuring method according to claim 8 , wherein irradiating the measurement subject with the electromagnetic waves and measuring the temperature of the measurement subject comprises using a measurement probe, to which a dielectric spectroscopy sensor that transmits and receives electromagnetic waves and a temperature sensor that outputs a signal that changes in accordance with a temperature are fixed such that a certain distance is interposed between the dielectric spectroscopy sensor and the temperature sensor.

10. The component concentration measuring method according to claim 9 , measuring the complex permittivity to acquire the dielectric spectroscopy spectrum of the measurement subject comprises receiving electromagnetic waves from the measurement subject via the dielectric spectroscopy sensor.

11. The component concentration measuring method according to claim 9 , wherein measuring the temperature of the measurement subject comprises converting a signal output from the temperature sensor into a temperature value.

12. The component concentration measuring method according to claim 9 , wherein the measurement probe is placed in direct contact with the measurement subject while irradiating the measurement subject with the electromagnetic waves and measuring the temperature of the measurement subject.

13. The component concentration measuring method according to claim 9 , wherein the measurement probe is placed is physically separated from the measurement subject while irradiating the measurement subject with the electromagnetic waves and measuring the temperature of the measurement subject.

14. The component concentration measuring method according to claim 8 , wherein correcting the dielectric spectroscopy spectrum comprises correcting the dielectric spectroscopy spectrum according to a time-series change in the temperature, the time-series change in the temperature being from a time when measurement of the component concentration is started.

15. The component concentration measuring method according to claim 8 , wherein the sample is made of the same material as a measurement subject, and wherein a component concentration of the sample is known.

16. The component concentration measuring method according to claim 8 , wherein irradiating the sample with the electromagnetic waves across the plurality of wavelengths comprises irradiating the sample with electromagnetic waves in microwave to millimeter-wave bands.

Assignees

• Nippon Telegraph & Telephone

Inventors

• Nakamura Masahito
• Tajima Takuro
• Seyama Michiko

Classifications

• A61B5/1455 Primary

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• A61B5/1495

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• A61B5/14532

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• A61B5/4875

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• A61B2562/0271

  Thermal or temperature sensors · CPC title