Measuring device for measuring uneveness of a surface of an item

US11835336B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11835336-B2
Application numberUS-202117764618-A
CountryUS
Kind codeB2
Filing dateJan 22, 2021
Priority dateJan 24, 2020
Publication dateDec 5, 2023
Grant dateDec 5, 2023

How to read this patent

A practical reading order for non-experts. Skip the full description unless you need deep technical detail.

  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

    Who owns or filed the patent and who is credited as inventor.

  4. Key dates

    Filing, priority, publication, and grant dates set the timeline.

  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

    Prior art links and similar publications in this corpus.

Abstract

Official abstract text for this publication.

The present invention relates to a measuring device for characterising a shape of a surface of an item, such as a wind turbine blade fibre layup, wherein the measuring device comprises: a frame comprising a holding frame, a first set of two or more probes movably held in the holding frame, each probe having a respective probe end for contacting the surface of the item, and electronic sensing means configured to provide for each probe a respective electrical signal representative of a position of the probe relative to the holding frame. A method for calibrating such a device is provided. Further, a method for characterising a shape of a surface of an item is provided.

First claim

Opening claim text (preview).

The invention claimed is: 1. A measuring device ( 40 ) for characterizing a shape of a surface of an item, the measuring device comprising: a frame comprising a holding frame ( 44 ); a first set of three or more probes ( 41 a - 41 j ) movably held in the holding frame, each of the probes having a respective probe end ( 43 a - 43 j ) for contacting the surface of the item; and electronic sensing means configured to provide for each of the probes a respective electrical signal representative of a position of the probe relative to the holding frame, wherein the device is further configured to cause determination of an unevenness signal representative of an unevenness of the surface, the unevenness signal being representative of an angle between 1) a straight line through the probe end of a first probe of the first set of probes and the probe end of a second probe of the first set of probes and 2) a straight line through the probe end of the second probe and the probe end of a third probe of the first set of probes. 2. The measuring device in accordance with claim 1 , wherein each of the probes is connected to biasing means ( 42 a - 42 j ), such as a spring, configured to bias the probe to a corresponding neutral position relative to the holding frame. 3. The measuring device in accordance with claim 2 , wherein each of the probes is connected to corresponding biasing means and each biasing means is connected to a corresponding force sensor configured to provide a corresponding force sensor signal representative of a tension in the corresponding biasing means, and wherein the signal representative of the position of each of the probes is determined based at least in part on the corresponding force sensor signal. 4. The measuring device in accordance with claim 3 , configured to cause determining whether the signal representative of the unevenness of the surface meets an unevenness criterion, and in the affirmative, to cause provision of an unevenness indication. 5. The measuring device in accordance with claim 4 , wherein the unevenness indication comprises an audible signal and/or a visual signal and/or a vibration signal. 6. The measuring device in accordance with claim 1 , configured to cause determining of a signal representative of an unevenness of the surface based on the electrical signals representative of the position of at least two probes in the first set of probes. 7. The measuring device in accordance with claim 1 , configured to cause determining of a signal representative of an unevenness of the surface based at least on 1) the electrical signals representative of the positions of two of the probes relative to the holding frame and 2) a smallest distance between the probe ends of the two probes during measuring. 8. The measuring device in accordance with claim 1 , wherein at least a subset of the first set of probes is arranged in a one-dimensional array. 9. The measuring device in accordance with claim 1 , wherein at least a subset of the first set of probes is arranged in a two-dimensional array. 10. The measuring device in accordance with claim 1 , wherein each of the probes is movably maintained in a respective position by a frictional force exceeding a force corresponding to the standard acceleration of free fall, g0. 11. The measuring device in accordance with claim 1 , wherein the frame further comprises one or more fixed or fixable supporting legs ( 45 a , 45 b ) for supporting the measuring device on the surface of the item during obtaining of the electrical signals representative of the positions of the probes relative to the holding frame ( 44 ). 12. A method for calibrating a device in accordance with claim 11 , the method comprising: placing the device on the one or more supporting legs on a surface and storing reference information including storing a reference signal representative of the electrical signal provided by the electronic sensing means for each of the probes in a second set of one or more of the probes in the first set of probes, such as all the probes in the first set of probes, and during subsequent use, determining for at least one probe in the second set of probes, such as for each of all the probes in the second set of probes, a signal representative of a difference between the electrical signal measured during said use and the corresponding reference signal. 13. The measuring device in accordance with claim 1 , wherein the device is configured such that a weight of the frame exceeds a maximum total force that the first set of probes can exert on a first portion of a surface while the supporting legs are in contact with a second portion of said surface. 14. The measuring device in accordance with claim 1 , wherein the probe ends of two probes of the first set of probes are separated by a distance of at least 10 cm. 15. The measuring device in accordance with claim 1 , operable to communicate to an external device a signal representative of the electrical signals corresponding to at least two of the probes, and/or a signal representative of an unevenness of the surface of the item determined based on the electrical signals representative of the positions of at least two of the probes. 16. The measuring device in accordance with claim 1 , wherein the electrical signals corresponding to at least two of the probes are obtained using corresponding linear variable differential transformers or based on respective resistance measurements. 17. A method for characterizing a shape of a surface of an item, comprising: providing three or more probes movably held in a holding frame, each of the probes having a corresponding probe end for contacting the surface of the item; bringing at least three of the probe ends into contact with the surface of the item; obtaining electrical signals representative of corresponding positions of at least two of the probes relative to the holding frame; and determining an unevenness signal representative of an unevenness of the surface, the unevenness signal being representative of an angle between 1) a straight line through the probe end of a first probe of the first set of probes and the probe end of a second probe of the first set of probes and 2) a straight line through the probe end of the second probe and the probe end of a third probe of the first set of probes. 18. The method in accordance with claim 17 , further comprising obtaining the respective electrical signals at least when the holding frame is at a first position relative to the item and when the holding frame is at a second position relative to the item different from the first position. 19. The method in accordance with claim 18 , further comprising moving the holding frame from the first position to the second position while at least two of the probes are in contact with the surface of the item. 20. The method in accordance with claim 17 , further comprising: determining an unevenness signal representative of an unevenness of the surface of the item based on the electrical signals representative of the positions of at least two of the probes relative to the holding frame. 21. The method in accordance with claim 17 , further comprising determining whether the unevenness signal representative of an unevenness of the surface meets an unevenness criterion, and generating an unevenness indication when the unevenness signal meets the unevenness criterion. 22. The method in accordance with claim 21 , wherein the unevenness indication comp

Assignees

Inventors

Classifications

  • G01B5/207Primary

    using a plurality of fixed, simultaneously operating transducers (G01B5/213 - G01B5/22 take precedence) · CPC title

  • for controlling eveness · CPC title

  • Component parts, details or accessories; Auxiliary operations {, e.g. feeding or storage of prepregs or SMC after impregnation or during ageing} · CPC title

  • Wind turbine blades · CPC title

Patent family

Related publications grouped by family.

External sources

Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US11835336B2 cover?
The present invention relates to a measuring device for characterising a shape of a surface of an item, such as a wind turbine blade fibre layup, wherein the measuring device comprises: a frame comprising a holding frame, a first set of two or more probes movably held in the holding frame, each probe having a respective probe end for contacting the surface of the item, and electronic sensing me…
Who is the assignee on this patent?
Lm Wind Power As
What technology area does this patent fall under?
Primary CPC classification G01B5/207. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Dec 05 2023 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 5 related publications on this page (citations in our corpus or others sharing the same primary CPC).