Optical environmental oscillation detecting system and optical measuring method using the same

Patent metadata

Field	Value
Publication number	US-11829013-B2
Application number	US-202117186634-A
Country	US
Kind code	B2
Filing date	Feb 26, 2021
Priority date	Jan 19, 2021
Publication date	Nov 28, 2023
Grant date	Nov 28, 2023

Abstract

An optical environment oscillation detection system and an optical measurement method using the same are provided. This system includes a laser light source, a polarizer, a liquid crystal (LC) element, an analyzer, and an optical sensor arranged in sequence. A polarization axis of the polarizer and that of the analyzer are respectively parallel to a first and a second axis direction being perpendicular to each other. When there is no environmental disturbance, the alignment of LC cells in the LC element has an original pretilt angle, and the optical sensor senses a first scattered light intensity of the laser beam outputted from the analyzer. When there is environmental disturbance, the alignment of the LC cells has a changed pretilt angle in relative to the original pretilt angle, and the optical sensor senses a second scattered light intensity of the laser beam outputted from the analyzer.

First claim

What is claimed is:

1. An optical environmental oscillation detecting system, comprising:
a laser light source, arranged to provide a laser beam;
a polarizer, arranged on one side of the laser light source that outputs the laser beam, wherein the polarizer is arranged to receive the laser beam, and a polarization axis of the polarizer is parallel to a first axial direction;
an analyzer, arranged on one side of the polarizer that is deviates from the laser light source, wherein a polarization axis of the analyzer is parallel to a second axial direction, and the second axial direction is perpendicular to the first axial direction;
a liquid crystal (LC) element, arranged between the polarizer and the analyzer, wherein the LC element is arranged to receive the laser beam from the polarizer, and output the laser beam to the analyzer; and
an optical sensor, arranged on one side of the analyzer that deviates from the LC element, to receive the laser beam outputted from the analyzer;
wherein when there is no environmental disturbance, an alignment of LC cells in the LC element has an original pretilt angle, and when the LC element is in the dark mode, the optical sensor senses a first scattered light intensity of the laser beam outputted from the analyzer; and
when there is environmental disturbance, the alignment of the LC cells has a changed pretilt angle in relative to the original pretilt angle, and when the LC element is in the dark mode, the optical sensor senses a second scattered light intensity of the laser beam outputted from the analyzer.

2. The optical environmental oscillation detecting system according to claim 1 , further comprising an analysis device, wherein the optical sensor is coupled to the analysis device, and the analysis device is arranged to receive the first scattered light intensity and the second scattered light intensity, in order to calculate at least one environmental oscillation factor according to variations of the first scattered light intensity and the second scattered light intensity.

3. The optical environmental oscillation detecting system according to claim 2 , wherein the analysis device is further coupled to a measuring instrument, and the measuring instrument is arranged to receive said at least one environmental oscillation factor, in order to deduct said at least one environmental oscillation factor from measurement statistics of the measuring instrument, for performing interference source corrections.

4. The optical environmental oscillation detecting system according to claim 1 , wherein when the LC element is operated in an extraordinary light state, an optical axis of the LC element is parallel to the first axial direction.

5. The optical environmental oscillation detecting system according to claim 4 , wherein when the LC element is operated in the extraordinary light state, the first axial direction is an X-axis direction, the second axial direction is a Y-axis direction, and a scattered light intensity of the LC element under the dark mode meets the following equation:

I
scattered
e

⁡

(

θ
ref

)

=

π
2

λ
4

⁢

k
0
2

⁢

(
Δɛ
)

2

⁢

k
B

⁢
T
⁢

{

(

n
o

⁢
sin
⁢

⁢

θ
f

)

2

K
11

⁢

{

(

n
o

⁢
cos
⁢

⁢

θ
f

-

n
eff

)

2

+

(

n
o

⁢
sin
⁢

⁢

θ
f

)

2

}

2

+

(

Assignees

• Interface Tech Chengdu Co Ltd
• Interface Optoelectronics Shenzhen Co Ltd
• Interface Optoelectronics Wuxi Co Ltd
• General Interface Solution Ltd

Inventors

• Chiang Che Wen

Classifications

• G02F1/1309 Primary

  Repairing; Testing · CPC title

• G01N21/21 Primary

  Polarisation-affecting properties (G01N21/19 takes precedence) · CPC title

• G01N21/49

  within a body or fluid · CPC title

• G01N2201/0231

  Thermostating · CPC title

• G01N2201/121

  Correction signals · CPC title