Sensor element and device for measuring process parameters in a sintering plant

US11828622B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11828622-B2
Application numberUS-202017638847-A
CountryUS
Kind codeB2
Filing dateJun 26, 2020
Priority dateAug 29, 2019
Publication dateNov 28, 2023
Grant dateNov 28, 2023

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

Various embodiments of the teachings herein include a sensor element for recording process parameters at a measurement point in a sintering press/sintering plant. The sensor element comprises: a first temperature sensor; and a force sensor. A force and a temperature are recorded at the measurement point at which the sensor element is arranged.

First claim

Opening claim text (preview).

What is claimed is: 1. A sensor element for recording process parameters at a measurement point in a sintering press/sintering plant, the sensor element comprising: a first temperature sensor; and a force sensor; wherein a force and a temperature are recorded at the measurement point at which the sensor element is arranged. 2. The sensor element as claimed in claim 1 , a second temperature sensor arranged on an opposite side of the sensor element from the first temperature sensor. 3. The sensor element as claimed in claim 1 , further comprising a distance compensation element compensating for height differences between at least one of the temperature sensors and a surface to be measured. 4. The sensor element as claimed in claim 1 , wherein the force sensor is arranged between the first temperature sensor and a second temperature sensor. 5. The sensor element as claimed in claim 1 , further comprising a travel sensor detecting when a surface to be measured approaches the sensor element. 6. The sensor element as claimed in claim 1 , further comprising an oxygen sensor. 7. The sensor element as claimed in claim 1 , further comprising a signal interface. 8. A device for recording process parameters at measurement points in a sintering plant, the device comprising: a plurality of sensor elements; and a recording module record the process parameters at the measurement points at which the sensor elements are arranged; wherein each sensor element comprises: a first temperature sensor; and a force sensor; wherein a force and a temperature are recorded at the measurement point at which the sensor element is arranged. 9. The device as claimed in claim 8 , wherein the recording module evaluates signals from each of the sensor elements. 10. The device as claimed in claim 8 , wherein at least some of the plurality of sensor elements differ from one another. 11. The device as claimed in claim 8 , further comprising a base unit accommodating the sensor elements. 12. The device as claimed in claim 8 , further comprising a base unit making electrical contact with the sensor elements. 13. The device as claimed in claim 8 , further comprising an energy supply device. 14. The device as claimed in claim 8 , further comprising a communication interface.

Assignees

Inventors

Classifications

  • G01D21/02Primary

    Measuring two or more variables by means not covered by a single other subclass · CPC title

  • Measuring or testing not otherwise provided for · CPC title

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Frequently asked questions

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What does patent US11828622B2 cover?
Various embodiments of the teachings herein include a sensor element for recording process parameters at a measurement point in a sintering press/sintering plant. The sensor element comprises: a first temperature sensor; and a force sensor. A force and a temperature are recorded at the measurement point at which the sensor element is arranged.
Who is the assignee on this patent?
Siemens Ag
What technology area does this patent fall under?
Primary CPC classification G01D21/02. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Nov 28 2023 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).