Determination of an item of position information relating to a position of a magnetic field transducer relative to a position sensor

US11788864B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11788864-B2
Application numberUS-202017247146-A
CountryUS
Kind codeB2
Filing dateDec 1, 2020
Priority dateDec 2, 2019
Publication dateOct 17, 2023
Grant dateOct 17, 2023

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  1. Title

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  2. Abstract

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

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An apparatus for determining an item of position information relating to a position of a magnetic field transducer relative to a position sensor. The position sensor is designed to generate at least one periodic measurement signal when the magnetic field transducer moves relative to the position sensor. A processing unit of the apparatus is designed to determine the position information based on a respective measurement signal value of a respective periodic measurement signal using a calibration function assigned to the respective periodic measurement signal. The assigned calibration function represents the respective periodic measurement signal using a Fourier series having a respective plurality of Fourier coefficients which differ from zero and are of an order greater than zero. The processing unit is designed to at least approximately solve the assigned calibration function for the respective measurement signal value in order to determine the position information.

First claim

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The invention claimed is: 1. An apparatus comprising apparatus, comprising: a processing unit configured to: determine an item of position information relating to a position of a magnetic field transducer relative to a position sensor, wherein the position sensor is configured to generate at least one periodic measurement signal when the magnetic field transducer moves relative to the position sensor, wherein the position information is determined based on a respective measurement signal value of a respective periodic measurement signal using a calibration function assigned to the respective periodic measurement signal, wherein the assigned calibration function represents the respective periodic measurement signal using a Fourier series having a respective plurality of Fourier coefficients which differ from zero and are of an order greater than zero, and wherein the Fourier coefficients are determined based on a respective multiplicity of measurement signal values of the respective periodic measurement signal, and solve the assigned calibration function for the respective measurement signal value in order to determine the position information. 2. The apparatus as claimed in claim 1 , wherein the processing unit is configured to use a previous position information to determine the position information using the assigned calibration function. 3. The apparatus as claimed in claim 2 , wherein the processing unit is configured to iteratively adapt a respective estimated value based on the previous position information in order to reduce a distance between the respective measurement signal value and a respective value of the assigned calibration function at the position of the respective estimated value and to determine the position information based on the respective estimated value. 4. The apparatus as claimed in claim 3 , wherein the processing unit is configured to adapt the respective estimated value according to a Newton method or another approximation method. 5. The apparatus as claimed in claim 1 , wherein the assigned calibration function comprises the Fourier series in a representation simplified using trigonometric methods. 6. The apparatus as claimed in claim 1 , wherein the at least one periodic measurement signal comprises a first periodic measurement signal and a second periodic measurement signal, wherein the first periodic measurement signal and the second periodic measurement signal have a standard period length, and wherein a phase of the second periodic measurement signal is shifted with respect to a phase of the first periodic measurement signal. 7. The apparatus as claimed in claim 6 , wherein the processing unit is configured to: iteratively adapt a first estimated value and a second estimated value based on previous position information in order to reduce a distance between the respective measurement signal value and a respective value of the assigned calibration function for the respective estimated value, and weight the first estimated value and the second estimated value in order to determine the position information. 8. The apparatus as claimed in claim 7 , wherein the processing unit is configured to weight the first estimated value and the second estimated value based on a respective gradient of the assigned calibration function at the position of the respective estimated value, wherein the greater respective gradient, the greater a respective weighting is for the first estimated value and the second estimated value. 9. The apparatus as claimed in claim 7 , wherein the processing unit is configured to determine the previous position information based on a first measurement signal value of the first periodic measurement signal and based on a second measurement signal value of the second periodic measurement signal using an arc tangent function when the apparatus is switched on. 10. The apparatus as claimed in claim 9 , wherein the processing unit is configured to use the position information determined last as the previous position information after the apparatus has been switched on. 11. The apparatus as claimed in claim 1 , further comprising: a calibration unit, wherein the calibration unit is configured to determine the Fourier coefficients of the assigned calibration function based on the respective multiplicity of measurement signal values of the respective periodic measurement signals. 12. The apparatus as claimed in claim 11 , wherein the calibration unit is configured to also determine the Fourier coefficients of the assigned calibration function based on a multiplicity of reference position values, wherein a reference position value is respectively assigned to a measurement signal value of the multiplicity of measurement signal values of one or more of the at least one periodic measurement signal. 13. The apparatus as claimed in claim 12 , wherein the calibration unit is configured to determine the multiplicity of reference position values based on information relating to a speed of a relative movement and based on an evaluation of a period length of the at least one periodic measurement signal. 14. The apparatus as claimed in claim 12 , wherein the calibration unit is configured to determine the multiplicity of reference position values using reference position information provided by a decoder, wherein the decoder is configured to determine the reference position information based on a relative movement. 15. The apparatus as claimed in claim 11 , wherein the calibration unit is configured to determine the Fourier coefficients of the assigned calibration function using a discrete Fourier analysis. 16. A position sensor comprising: a measurement unit configured to generate at least one periodic measurement signal when a magnetic field transducer moves relative to the position sensor, and an apparatus for determining the position information as claimed in claim 1 in order to determine the position information based on the at least one periodic measurement signal. 17. The position sensor as claimed in claim 16 , wherein the position sensor has an integrated circuit, and wherein the integrated circuit comprises the measurement unit and the apparatus for determining the position information. 18. The position sensor as claimed in claim 16 , wherein a first integrated circuit comprises the measurement unit, and wherein a second integrated circuit comprises the apparatus for determining the position information. 19. The position sensor as claimed in claim 16 , wherein the magnetic field transducer has a magnetic ring which is arranged around an axis of rotation and has magnetic poles which alternate in a radial direction, and wherein the measurement unit has a magnetic field sensor which is stationary with respect to a rotation of the magnetic ring around the axis of rotation. 20. A method for determining position information relating to a position of a magnetic field transducer relative to a position sensor, wherein the position sensor is configured to generate at least one periodic measurement signal when the magnetic field transducer moves relative to the position sensor, wherein the method comprises: determining the position information based on a respective measurement signal value of a respective periodic measurement signal using a calibration function assigned to the respective periodic measurement signal, wherein the assigned calibration function represents the respective periodic measurement signal using a Fourier series having a respective plurality of Fourier coeffic

Assignees

Inventors

Classifications

  • G01D5/145Primary

    influenced by the relative movement between the Hall device and magnetic fields (see G01R33/06) · CPC title

  • Signal processing (G01D5/2448 - G01D5/24495 take precedence) · CPC title

  • using previous values · CPC title

  • Calibrating encoders · CPC title

  • G01D5/2449Primary

    using hard-stored calibration data · CPC title

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What does patent US11788864B2 cover?
An apparatus for determining an item of position information relating to a position of a magnetic field transducer relative to a position sensor. The position sensor is designed to generate at least one periodic measurement signal when the magnetic field transducer moves relative to the position sensor. A processing unit of the apparatus is designed to determine the position information based o…
Who is the assignee on this patent?
Infineon Technologies Ag
What technology area does this patent fall under?
Primary CPC classification G01D5/145. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Oct 17 2023 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).