Photovoltaic devices and method of making
US-10784397-B2 · Sep 22, 2020 · US
US11769844B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-11769844-B2 |
| Application number | US-202117505291-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 19, 2021 |
| Priority date | Feb 1, 2013 |
| Publication date | Sep 26, 2023 |
| Grant date | Sep 26, 2023 |
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A photovoltaic device includes a substrate structure and a p-type semiconductor absorber layer. A photovoltaic device may include a CdSeTe layer. A process for manufacturing a photovoltaic device includes forming a CdSeTe layer over a substrate. The process includes forming a p-type cadmium selenide telluride absorber layer.
Opening claim text (preview).
What is claimed is: 1. A method for forming a photovoltaic structure, comprising: providing a substrate structure comprising a transparent conductive oxide (TCO) layer; forming a CdSeTe layer over the substrate structure; alloying the CdSeTe layer whereby an absorber layer is formed over the substrate structure, wherein: the absorber layer comprises a p-type cadmium selenide telluride layer, the p-type cadmium selenide telluride layer is composed of a CdSe x Te 1−x compound, wherein a value of x is between 0 and 1; and forming a back contact over the absorber layer; wherein: the absorber layer has a compositional profile having a gradient of selenium, wherein a concentration of Se is greater adjacent the TCO layer than adjacent the back contact; and the step of forming the CdSeTe layer includes sequentially depositing a CdSe layer followed by depositing a CdTe layer. 2. The method of claim 1 , wherein the step of forming the CdSeTe layer comprises depositing multiple layers by vapor transport deposition. 3. The method of claim 1 , wherein the CdSe x Te 1−x layer, has a compositional gradient wherein x varies across a thickness of the CdSe x Te 1−x layer, and wherein x has a value within a range of 0.01 to 0.25. 4. The method of claim 1 , further comprising depositing a CdTe layer over the CdSeTe layer, wherein a thickness of the CdTe layer is between about 250 nm to about 3500 nm. 5. The method of claim 1 , wherein a thickness of the absorber layer is between 1000 nm to 3500 nm. 6. The method of claim 1 , wherein the CdSe x Te 1−x compound has a compositional profile such that x varies in value through a thickness of the cadmium selenide telluride layer, and the value of x is in a range of 0.01 to 0.40. 7. The method of claim 1 , further comprising incorporating a dopant into the absorber layer. 8. The method of claim 1 , wherein the alloying step occurs concurrently with the step of depositing the CdSeTe layer over the substrate structure. 9. The method of claim 1 , wherein the alloying step occurs after the step of depositing the CdSeTe layer over the substrate structure. 10. The method of claim 1 , wherein the p-type cadmium selenide telluride layer of the absorber layer forms a p-n junction with the substrate structure, wherein the substrate structure does not include a window layer comprising CdS, and wherein the substrate structure does not include a window layer comprising CdSSe. 11. The method of claim 1 , wherein the alloying step further comprises: annealing with a CdCl 2 flux at a temperature in a range from 420° C. to 460° C. for a duration in a range from five minutes to sixty minutes. 12. The method of claim 1 , further comprising an activation step of contacting a material containing chlorine to the CdSeTe layer, and annealing the absorber layer. 13. The method of claim 12 , wherein the material containing chlorine comprises an aqueous solution of CdCl 2 , wherein the aqueous solution has a concentration in a range of 50 g/L to 500 g/L. 14. The method of claim 12 , wherein the activation step comprises contacting the CdSeTe layer with CdCl 2 and another material containing chlorine. 15. The method of claim 12 , wherein the activation step comprises contacting the CdSeTe layer with CdCl 2 and another material containing chlorine selected from the group consisting of: MnCl 2 , MgCl 2 , NHCl 2 , ZnCl 2 , or TeCl 2 . 16. The method of claim 1 , wherein the back contact comprises an ohmic electrode comprising an electrically conductive material. 17. A method for forming a photovoltaic structure, comprising: providing a substrate structure comprising a transparent conductive oxide (TCO) layer; forming a CdSeTe layer over the substrate structure; alloying the CdSeTe layer whereby an absorber layer is formed over the substrate structure, wherein: the absorber layer comprises a p-type cadmium selenide telluride layer, the p-type cadmium selenide telluride layer is composed of a CdSe x Te 1−x compound, wherein a value of x is between 0 and 1; and forming a back contact over the absorber layer; wherein: the absorber layer has a compositional profile having a gradient of selenium, wherein a concentration of Se is greater adjacent the TCO layer than adjacent the back contact; and wherein the step of depositing the CdSeTe layer includes sequentially depositing a CdSe layer over the substrate structure, followed by depositing a CdTe layer, and wherein the alloying step occurs after the step of depositing the CdTe layer over the CdSe layer. 18. The method of claim 17 , wherein the step of forming the CdSeTe layer comprises depositing multiple layers by vapor transport deposition. 19. The method of claim 17 , wherein the CdSe x Te 1−x layer, has a compositional gradient wherein x varies across a thickness of the CdSe x Te 1−x layer, and wherein x has a value within a range of 0.01 to 0.25. 20. The method of claim 17 , further comprising depositing a CdTe layer over the CdSeTe layer, wherein a thickness of the CdTe layer is between about 250 nm to about 3500 nm. 21. The method of claim 17 , wherein a thickness of the absorber layer is between 1000 nm to 3500 nm. 22. The method of claim 17 , wherein the CdSe x Te 1−x compound has a compositional profile such that x varies in value through a thickness of the cadmium selenide telluride layer, and the value of x is in a range of 0.01 to 0.40. 23. The method of claim 17 , further comprising incorporating a dopant into the absorber layer. 24. The method of claim 17 , wherein the alloying step occurs concurrently with the step of depositing the CdSeTe layer over the substrate structure. 25. The method of claim 17 , wherein the alloying step occurs after the step of depositing the CdSeTe layer over the substrate structure. 26. The method of claim 17 , wherein the p-type cadmium selenide telluride layer of the absorber layer forms a p-n junction with the substrate structure, wherein the substrate structure does not include a window layer comprising CdS, and wherein the substrate structure does not include a window layer comprising CdSSe. 27. The method of claim 17 , wherein the alloying step further comprises: annealing with a CdCl 2 flux at a temperature in a range from 420° C. to 460° C. for a duration in a range from five minutes to sixty minutes. 28. The method of claim 17 , further comprising an activation step of contacting a material containing chlorine to the CdSeTe layer, and annealing the absorber layer. 29. The method of claim 28 , wherein the material containing chlorine comprises an aqueous solution of CdCl 2 , wherein the aqueous solution has a concentration in a range of 50 g/L to 500 g/L. 30. The method of claim 28 , wherein the activation step comprises contacting the CdSeTe layer with CdCl 2 and another material containing chlorine. 31. The method of claim 28 , wherein the activation step comprises contacting the CdSeTe layer with CdCl 2 and another material containing chlorine selected from the group consisting of: MnCl 2 , MgCl 2 , NHCl 2 , ZnCl 2 , or TeCl 2 . 32. The method of claim 17 , wherein the back contact comprises an ohmic electrode comprising an electrically conductive material.
comprising at least three elements, e.g. HgCdTe · CPC title
Annealing · CPC title
comprising only Group II-VI materials, e.g. CdS/CdTe photovoltaic cells · CPC title
having at least three elements, e.g. HgCdTe · CPC title
Electricity · mapped topic
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