Photovoltaic device including a p-n junction and method of manufacturing

US11769844B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11769844-B2
Application numberUS-202117505291-A
CountryUS
Kind codeB2
Filing dateOct 19, 2021
Priority dateFeb 1, 2013
Publication dateSep 26, 2023
Grant dateSep 26, 2023

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A photovoltaic device includes a substrate structure and a p-type semiconductor absorber layer. A photovoltaic device may include a CdSeTe layer. A process for manufacturing a photovoltaic device includes forming a CdSeTe layer over a substrate. The process includes forming a p-type cadmium selenide telluride absorber layer.

First claim

Opening claim text (preview).

What is claimed is: 1. A method for forming a photovoltaic structure, comprising: providing a substrate structure comprising a transparent conductive oxide (TCO) layer; forming a CdSeTe layer over the substrate structure; alloying the CdSeTe layer whereby an absorber layer is formed over the substrate structure, wherein: the absorber layer comprises a p-type cadmium selenide telluride layer, the p-type cadmium selenide telluride layer is composed of a CdSe x Te 1−x compound, wherein a value of x is between 0 and 1; and forming a back contact over the absorber layer; wherein: the absorber layer has a compositional profile having a gradient of selenium, wherein a concentration of Se is greater adjacent the TCO layer than adjacent the back contact; and the step of forming the CdSeTe layer includes sequentially depositing a CdSe layer followed by depositing a CdTe layer. 2. The method of claim 1 , wherein the step of forming the CdSeTe layer comprises depositing multiple layers by vapor transport deposition. 3. The method of claim 1 , wherein the CdSe x Te 1−x layer, has a compositional gradient wherein x varies across a thickness of the CdSe x Te 1−x layer, and wherein x has a value within a range of 0.01 to 0.25. 4. The method of claim 1 , further comprising depositing a CdTe layer over the CdSeTe layer, wherein a thickness of the CdTe layer is between about 250 nm to about 3500 nm. 5. The method of claim 1 , wherein a thickness of the absorber layer is between 1000 nm to 3500 nm. 6. The method of claim 1 , wherein the CdSe x Te 1−x compound has a compositional profile such that x varies in value through a thickness of the cadmium selenide telluride layer, and the value of x is in a range of 0.01 to 0.40. 7. The method of claim 1 , further comprising incorporating a dopant into the absorber layer. 8. The method of claim 1 , wherein the alloying step occurs concurrently with the step of depositing the CdSeTe layer over the substrate structure. 9. The method of claim 1 , wherein the alloying step occurs after the step of depositing the CdSeTe layer over the substrate structure. 10. The method of claim 1 , wherein the p-type cadmium selenide telluride layer of the absorber layer forms a p-n junction with the substrate structure, wherein the substrate structure does not include a window layer comprising CdS, and wherein the substrate structure does not include a window layer comprising CdSSe. 11. The method of claim 1 , wherein the alloying step further comprises: annealing with a CdCl 2 flux at a temperature in a range from 420° C. to 460° C. for a duration in a range from five minutes to sixty minutes. 12. The method of claim 1 , further comprising an activation step of contacting a material containing chlorine to the CdSeTe layer, and annealing the absorber layer. 13. The method of claim 12 , wherein the material containing chlorine comprises an aqueous solution of CdCl 2 , wherein the aqueous solution has a concentration in a range of 50 g/L to 500 g/L. 14. The method of claim 12 , wherein the activation step comprises contacting the CdSeTe layer with CdCl 2 and another material containing chlorine. 15. The method of claim 12 , wherein the activation step comprises contacting the CdSeTe layer with CdCl 2 and another material containing chlorine selected from the group consisting of: MnCl 2 , MgCl 2 , NHCl 2 , ZnCl 2 , or TeCl 2 . 16. The method of claim 1 , wherein the back contact comprises an ohmic electrode comprising an electrically conductive material. 17. A method for forming a photovoltaic structure, comprising: providing a substrate structure comprising a transparent conductive oxide (TCO) layer; forming a CdSeTe layer over the substrate structure; alloying the CdSeTe layer whereby an absorber layer is formed over the substrate structure, wherein: the absorber layer comprises a p-type cadmium selenide telluride layer, the p-type cadmium selenide telluride layer is composed of a CdSe x Te 1−x compound, wherein a value of x is between 0 and 1; and forming a back contact over the absorber layer; wherein: the absorber layer has a compositional profile having a gradient of selenium, wherein a concentration of Se is greater adjacent the TCO layer than adjacent the back contact; and wherein the step of depositing the CdSeTe layer includes sequentially depositing a CdSe layer over the substrate structure, followed by depositing a CdTe layer, and wherein the alloying step occurs after the step of depositing the CdTe layer over the CdSe layer. 18. The method of claim 17 , wherein the step of forming the CdSeTe layer comprises depositing multiple layers by vapor transport deposition. 19. The method of claim 17 , wherein the CdSe x Te 1−x layer, has a compositional gradient wherein x varies across a thickness of the CdSe x Te 1−x layer, and wherein x has a value within a range of 0.01 to 0.25. 20. The method of claim 17 , further comprising depositing a CdTe layer over the CdSeTe layer, wherein a thickness of the CdTe layer is between about 250 nm to about 3500 nm. 21. The method of claim 17 , wherein a thickness of the absorber layer is between 1000 nm to 3500 nm. 22. The method of claim 17 , wherein the CdSe x Te 1−x compound has a compositional profile such that x varies in value through a thickness of the cadmium selenide telluride layer, and the value of x is in a range of 0.01 to 0.40. 23. The method of claim 17 , further comprising incorporating a dopant into the absorber layer. 24. The method of claim 17 , wherein the alloying step occurs concurrently with the step of depositing the CdSeTe layer over the substrate structure. 25. The method of claim 17 , wherein the alloying step occurs after the step of depositing the CdSeTe layer over the substrate structure. 26. The method of claim 17 , wherein the p-type cadmium selenide telluride layer of the absorber layer forms a p-n junction with the substrate structure, wherein the substrate structure does not include a window layer comprising CdS, and wherein the substrate structure does not include a window layer comprising CdSSe. 27. The method of claim 17 , wherein the alloying step further comprises: annealing with a CdCl 2 flux at a temperature in a range from 420° C. to 460° C. for a duration in a range from five minutes to sixty minutes. 28. The method of claim 17 , further comprising an activation step of contacting a material containing chlorine to the CdSeTe layer, and annealing the absorber layer. 29. The method of claim 28 , wherein the material containing chlorine comprises an aqueous solution of CdCl 2 , wherein the aqueous solution has a concentration in a range of 50 g/L to 500 g/L. 30. The method of claim 28 , wherein the activation step comprises contacting the CdSeTe layer with CdCl 2 and another material containing chlorine. 31. The method of claim 28 , wherein the activation step comprises contacting the CdSeTe layer with CdCl 2 and another material containing chlorine selected from the group consisting of: MnCl 2 , MgCl 2 , NHCl 2 , ZnCl 2 , or TeCl 2 . 32. The method of claim 17 , wherein the back contact comprises an ohmic electrode comprising an electrically conductive material.

Assignees

Inventors

Classifications

  • comprising at least three elements, e.g. HgCdTe · CPC title

  • Annealing · CPC title

  • comprising only Group II-VI materials, e.g. CdS/CdTe photovoltaic cells · CPC title

  • having at least three elements, e.g. HgCdTe · CPC title

  • Electricity · mapped topic

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What does patent US11769844B2 cover?
A photovoltaic device includes a substrate structure and a p-type semiconductor absorber layer. A photovoltaic device may include a CdSeTe layer. A process for manufacturing a photovoltaic device includes forming a CdSeTe layer over a substrate. The process includes forming a p-type cadmium selenide telluride absorber layer.
Who is the assignee on this patent?
First Solar Inc
What technology area does this patent fall under?
Primary CPC classification H10F77/1237. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Sep 26 2023 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 12 related publications on this page (citations in our corpus or others sharing the same primary CPC).