Observation container and microparticle measurement device
US-2020096435-A1 · Mar 26, 2020 · US
Fine particle measurement device
US11768146B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-11768146-B2 |
| Application number | US-202017023566-A |
| Country | US |
| Kind code | B2 |
| Filing date | Sep 17, 2020 |
| Priority date | Mar 20, 2018 |
| Publication date | Sep 26, 2023 |
| Grant date | Sep 26, 2023 |
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- Title
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Abstract
Official abstract text for this publication.
A fine particle measurement device includes a support stand ( 20 ) that has a groove (F) extending in a predetermined direction and is configured to support in the groove an observation container ( 10 ), which has an elongate shape and accommodates a liquid sample containing a fine particle therein such that an extending direction of the groove (F) coincides with a longitudinal direction of the observation container ( 10 ); and an imaging unit ( 40 ) that is configured to capture an image of the fine particle in the observation container ( 10 ) at a position where the support stand is out of a field of view, the observation container ( 10 ) being supported by the support stand ( 20 ).
First claim
Opening claim text (preview).
The invention claimed is: 1. A fine particle measurement device comprising: a support stand that has a groove extending in a predetermined direction and is configured to support in the groove an observation container, which has an elongate shape and accommodates a liquid sample containing a fine particle therein, such that an extending direction of the groove coincides with a longitudinal direction of the observation container; and a plurality of imaging units each configured to capture an image of the fine particle in the observation container at a position where the support stand is out of a field of view, the observation container being supported by the support stand, wherein the observation container has two bottom walls made of two plate-shaped members, which are combined to form a bottom surface having a corner, and wherein the image units are configured to capture images of the same imaging target at the same time, so that one imaging target in the observation container can be identified from different directions. 2. The fine particle measurement device according to claim 1 , wherein the groove of the support stand has a V shape. 3. The fine particle measurement device according to claim 1 , further comprising: an outer packaging in which the support stand and the imaging units are installed. 4. The fine particle measurement device according to claim 1 , wherein each of the imaging units includes a detector in which a plurality of pixels are two-dimensionally arranged, the detector converting light received by the pixels to intensity information. 5. The fine particle measurement device according to claim 1 , wherein each of the imaging units includes at least one of a CMOS, a CCD, an InGaAs detector, a mercury cadmium tellurium (MCT) detector, and a hyperspectral sensor. 6. The fine particle measurement device according to claim 1 , wherein the plurality of imaging units include three or more imaging units.
Assignees
Inventors
Classifications
- G01N15/1434Primary
Optical arrangements · CPC title
Investigating dispersion of liquids · CPC title
Imaging characterised by its optical setup · CPC title
Adjustment of focus; Alignment · CPC title
the analysis being performed on a sample stream · CPC title
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Frequently asked questions
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- What does patent US11768146B2 cover?
- A fine particle measurement device includes a support stand ( 20 ) that has a groove (F) extending in a predetermined direction and is configured to support in the groove an observation container ( 10 ), which has an elongate shape and accommodates a liquid sample containing a fine particle therein such that an extending direction of the groove (F) coincides with a longitudinal direction of the…
- Who is the assignee on this patent?
- Sumitomo Electric Industries
- What technology area does this patent fall under?
- Primary CPC classification G01N15/1434. Mapped technology areas include Physics.
- When was this patent published?
- Publication date Tue Sep 26 2023 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 4 related publications on this page (citations in our corpus or others sharing the same primary CPC).