Coating composition for photoresist underlayer

US11762294B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11762294-B2
Application numberUS-202017007877-A
CountryUS
Kind codeB2
Filing dateAug 31, 2020
Priority dateAug 31, 2020
Publication dateSep 19, 2023
Grant dateSep 19, 2023

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A photoresist underlayer composition, comprising a polymer comprising a repeating unit of formula (1): wherein Ar is a monocyclic or polycyclic C 5-60 aromatic group, wherein the aromatic group comprises one or more aromatic ring heteroatoms, a substituent group comprising a heteroatom, or a combination thereof; R 1 is hydrogen, substituted or unsubstituted C 1-30 alkyl, substituted or unsubstituted C 1-30 heteroalkyl, substituted or unsubstituted C 3-30 cycloalkyl, substituted or unsubstituted C 2-30 heterocycloalkyl, substituted or unsubstituted C 2-30 alkenyl, substituted or unsubstituted C 2-30 alkynyl, substituted or unsubstituted C 6-30 aryl, substituted or unsubstituted C 7-30 arylalkyl, substituted or unsubstituted C 7-30 alkylaryl, substituted or unsubstituted C 3-30 heteroaryl, or substituted or unsubstituted C 4-30 heteroarylalkyl; and R 2 is substituted or unsubstituted C 1-30 alkyl, substituted or unsubstituted C 1-30 heteroalkyl, substituted or unsubstituted C 3-30 cycloalkyl, substituted or unsubstituted C 2-30 heterocycloalkyl, substituted or unsubstituted C 2-30 alkenyl, substituted or unsubstituted C 2-30 alkynyl, substituted or unsubstituted C 6-30 aryl, substituted or unsubstituted C 7-30 arylalkyl, substituted or unsubstituted C 7-30 alkylaryl, substituted or unsubstituted C 3-30 heteroaryl, or substituted or unsubstituted C 4-30 heteroarylalkyl, wherein R 1 and R 2 can be optionally taken together to form a ring.

First claim

Opening claim text (preview).

What is claimed is: 1. A photoresist underlayer composition, comprising: a polymer comprising a repeating unit of formula (1); and a crosslinking agent: wherein Ar is a monocyclic or polycyclic C 5-60 aromatic group, wherein the C 5-60 aromatic group comprises one or more aromatic ring heteroatoms, a substituent group comprising a heteroatom, or a combination thereof; R 1 is hydrogen, substituted or unsubstituted C 1-30 alkyl, substituted or unsubstituted C 1-30 heteroalkyl, substituted or unsubstituted C 3-30 cycloalkyl, substituted or unsubstituted C 2-30 heterocycloalkyl, substituted or unsubstituted C 2-30 alkenyl, substituted or unsubstituted C 2-30 alkynyl, substituted or unsubstituted C 6-30 aryl, substituted or unsubstituted C 7-30 arylalkyl, substituted or unsubstituted C 7-30 alkylaryl, substituted or unsubstituted C 3-30 heteroaryl, or substituted or unsubstituted C 4-30 heteroarylalkyl; and R 2 is substituted or unsubstituted C 1-30 alkyl, substituted or unsubstituted C 1-30 heteroalkyl, substituted or unsubstituted C 3-30 cycloalkyl, substituted or unsubstituted C 2-30 heterocycloalkyl, substituted or unsubstituted C 2-30 alkenyl, substituted or unsubstituted C 2-30 alkynyl, substituted or unsubstituted C 6-30 aryl, substituted or unsubstituted C 7-30 arylalkyl, substituted or unsubstituted C 7-30 alkylaryl, substituted or unsubstituted C 3-30 heteroaryl, or substituted or unsubstituted C 4-30 heteroarylalkyl, wherein R 1 and R 2 can be optionally taken together to form a ring, wherein the photoresist underlayer composition is free of a photoacid generator. 2. The photoresist underlayer composition of claim 1 , wherein Ar is a monocyclic or polycyclic C 5-60 heteroarylene group or a monocyclic or polycyclic C 6-60 arylene group, optionally substituted with at least one of substituted or unsubstituted C 1-30 alkyl, substituted or unsubstituted C 1-30 haloalkyl, substituted or unsubstituted C 3-30 cycloalkyl, substituted or unsubstituted C 1-30 heterocycloalkyl, substituted or unsubstituted C 2-30 alkenyl, substituted or unsubstituted C 2-30 alkynyl, substituted or unsubstituted C 6-30 aryl, substituted or unsubstituted C 7-30 arylalkyl, substituted or unsubstituted C 7-30 alkylaryl, substituted or unsubstituted C 3-30 heteroaryl, substituted or unsubstituted C 4-30 heteroarylalkyl, halogen, —OR 11 , —SR 12 , or —NR 13 R 14 , wherein R 11 to R 14 are each independently hydrogen, substituted or unsubstituted C 1-30 alkyl, substituted or unsubstituted C 3-30 cycloalkyl, substituted or unsubstituted C 2-30 heterocycloalkyl, substituted or unsubstituted C 6-30 aryl, substituted or unsubstituted C 7-30 arylalkyl, substituted or unsubstituted C 3-30 heteroaryl, or substituted or unsubstituted C 4-30 heteroarylalkyl, provided that the monocyclic or polycyclic C 6-60 arylene group is substituted with at least one substituent group comprising a heteroatom. 3. The photoresist underlayer composition of claim 1 , wherein Ar comprises a group of formula (2): wherein, A1, A2, and A3 each may be present or absent, and each independently represents 1 to 3 fused aromatic rings; R 3 and R 4 are each independently substituted or unsubstituted C 1-30 alkyl, substituted or unsubstituted C 1-30 heteroalkyl, substituted or unsubstituted C 3-30 cycloalkyl, substituted or unsubstituted C 2-30 heterocycloalkyl, substituted or unsubstituted C 2-30 alkenyl, substituted or unsubstituted C 2-30 alkynyl, substituted or unsubstituted C 6-30 aryl, substituted or unsubstituted C 7-30 arylalkyl, substituted or unsubstituted C 7-30 alkylaryl, substituted or unsubstituted C 3-30 heteroaryl, or substituted or unsubstituted C 4-30 heteroarylalkyl, halogen, —OR 21 , —SR 22 , or —NR 23 R 24 ; and provided that at least one of R 3 or R 4 is —OR 21 , —SR 22 , or —NR 23 R 24 ; R 21 to R 24 are each independently hydrogen, substituted or unsubstituted C 1-30 alkyl, substituted or unsubstituted C 3-30 cycloalkyl, substituted or unsubstituted C 2-30 heterocycloalkyl, substituted or unsubstituted C 6-30 aryl, substituted or unsubstituted C 7-30 arylalkyl, substituted or unsubstituted C 3-30 heteroaryl, or substituted or unsubstituted C 4-30 heteroarylalkyl; m is an integer 0 to 4; n is an integer 0 to 4; and provided that the sum of m and n is an integer greater than 0. 4. The photoresist underlayer composition of claim 1 , wherein Ar comprises a group of formulae (3a), (3b), or (3c): wherein, A4 may be present or absent, and represents 1 to 3 fused aromatic rings; Z 1 and Z 2 are each independently C or N; each R 5 is independently substituted or unsubstituted C 1-30 alkyl, substituted or unsubstituted C 1-30 heteroalkyl, substituted or unsubstituted C 3-30 cycloalkyl, substituted or unsubstituted C 2-30 heterocycloalkyl, substituted or unsubstituted C 2-30 alkenyl, substituted or unsubstituted C 2-30 alkynyl, substituted or unsubstituted C 6-30 aryl, substituted or unsubstituted C 7-30 arylalkyl, substituted or unsubstituted C 7-30 alkylaryl, substituted or unsubstituted C 3-30 heteroaryl, or substituted or unsubstituted C 4-30 heteroarylalkyl; and p is an integer of 0 to 4, wherein A4 comprises at least one heteroaryl ring, at least one of Z 1 and Z 2 is N, or a combination thereof. 5. The photoresist underlayer composition of claim 1 , wherein Ar comprises a group of formula (4): wherein, L 1 is a single bond, —O—, —S—, —S(O)—, —SO 2 —, —C(O)—, —CR 41 R 42 —, —NR 43 —, or —PR 44 —; L 2 is absent, a single bond, —O—, —S—, —S(O)—, —SO 2 —, —C(O)—, substituted or unsubstituted C 1-2 alkylene, substituted or unsubstituted C 6-30 arylene, or substituted or unsubstituted C 5-30 heteroarylene; R 8 and R 9 are each independently substituted or unsubstituted C 1-30 alkyl, substituted or unsubstituted C 1-30 heteroalkyl, substituted or unsubstituted C 3-30 cycloalkyl, substituted or unsubstituted C 2-30 heterocycloalkyl, substituted or unsubstituted C 2-30 alkenyl, substituted or unsubstituted C 2-30 alkynyl, substituted or unsubstituted C 6-30 aryl, substituted or unsubstituted C 7-30 arylalkyl, substituted or unsubstituted C 7-30 alkylaryl, substituted or unsubstituted C 3-30 heteroaryl, or substituted or unsubstituted C 4-30 heteroarylalkyl, halogen, —OR 45 , —SR 46 , or —NR 47 R 48 ; R 41 to R 48 are each independently hydrogen, substituted or unsubstituted C 1-30 alkyl, substituted or unsubstituted C 1-30 heteroalkyl, substituted or unsubstituted C 3-30 cycloalkyl, substituted or unsubstituted C 2-30 heterocycloalkyl, substituted or unsubstituted C 6-30 aryl, substituted or unsubstituted C 7-30 arylalkyl, substituted or unsubstituted C 3-30 heteroaryl, or substituted or unsubstituted C 4-30 heteroarylalkyl; a is an integer of 0 to 4; and b is an integer of 0 to 4. 6. The photoresist underlayer composition of claim 1 , wherein the monocyclic or polycyclic C 5-60 aromatic group is a monocyclic or polycyclic C 6-60 arylene group substituted with hydroxyl. 7. The photoresist underlayer composition of claim 1 , wherein the polymer comprises a repeating unit of formula (6): wherein R 1 and R 2 are as defined in any one of clai

Assignees

Inventors

Classifications

  • characterised by the processes involved to create the masks · CPC title

  • characterised by their composition, e.g. multilayer masks · CPC title

  • C09D165/00Primary

    Coating compositions based on macromolecular compounds obtained by reactions forming a carbon-to-carbon link in the main chain (C09D107/00 - C09D157/00, C09D161/00 take precedence); Coating compositions based on derivatives of such polymers · CPC title

  • G03F7/094Primary

    Multilayer resist systems, e.g. planarising layers · CPC title

  • C09D7/63Primary

    organic · CPC title

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What does patent US11762294B2 cover?
A photoresist underlayer composition, comprising a polymer comprising a repeating unit of formula (1): wherein Ar is a monocyclic or polycyclic C 5-60 aromatic group, wherein the aromatic group comprises one or more aromatic ring heteroatoms, a substituent group comprising a heteroatom, or a combination thereof; R 1 is hydrogen, substituted or unsubstituted C 1-30 …
Who is the assignee on this patent?
Rohm & Haas Elect Mat
What technology area does this patent fall under?
Primary CPC classification C09D165/00. Mapped technology areas include Chemistry & Metallurgy.
When was this patent published?
Publication date Tue Sep 19 2023 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 9 related publications on this page (citations in our corpus or others sharing the same primary CPC).