Test system for an intelligent electronic device in an electric sub-station

Patent metadata

Field	Value
Publication number	US-11761995-B2
Application number	US-202017607608-A
Country	US
Kind code	B2
Filing date	Apr 29, 2020
Priority date	Apr 29, 2019
Publication date	Sep 19, 2023
Grant date	Sep 19, 2023

Abstract

Test system for an intelligent electronic device in an electric sub-station. Examples of a test switch unit are described. Each test switch unit may be utilized for opening of the trip circuit, the shorting of the CT and subsequently isolation of the VT circuits, respectively. Once the trip circuits have been opened, and the CT/VT circuits have been shorted and isolated, respectively, the IED may be tested by providing the appropriate test signals.

First claim

The invention claimed is:

1. A test system for an intelligent electronic device installed in an electric substation, wherein the test system comprises:
a shaft;
a lever coupled to the shaft;
a first test switch unit coupled to a trip circuit, wherein the first test switch unit comprises:
a first relay lead adapted to be communicatively coupled to the intelligent electronic device and the trip circuit;
a first field lead operable to receive an input current;
a first test signal lead;
a first conducting element, wherein the first conducting element electrically couples the first relay lead to the first test signal lead;
a trip contact element, having two ends, where one end of the trip contact element is connected to the first field lead, and the other end of the trip contact element is configured to abut against the first conducting element to complete an electrical path between the first field lead and the first relay lead; and
a first cam mounted on the shaft and adapted to rotate about its axis and to engage with the trip contact element to decouple the other end of the trip contact element from the first conducting element;

a second test switch unit coupled to a current transformer (CT) circuit, wherein the second test switch unit comprises:
a second relay lead adapted to be communicatively coupled to the intelligent electronic device and the CT circuit;
a second field lead for receiving an input field current;
a second test signal lead;
a second connecter port with a short-circuit element connected to the second connector port;
a second conducting element wherein the second conducting element electrically couples the second relay lead to the second test signal lead;
a primary contact element, having two ends, wherein one end of the primary contact element is connected to the second field lead, and the other end of the primary contact element is configured to abut against the second conducting element thereby completing an electrical path from the second field lead to the second relay lead;
a secondary contact element, having two ends, wherein one end of the secondary contact element is connected to the second field lead, and the other end of the secondary contact element extends away from the second field lead, and further wherein the secondary contact element is not in contact with the connector port; and
a second cam mounted on the shaft and adapted to rotate about its axis, comprising a leading profiled element and a trailing profiled element, wherein the leading profiled element and the trailing profiled element are leading and trailing with regard to the rotation direction of the second cam, respectively, and wherein the leading profiled element is configured to engage with the secondary contact element to allow an end of the secondary contact element to come into contact with the short-circuit element and the trailing profiled element is configured to engage with the primary contact element to decouple the other end of the primary contact element from the second conducting element;

a third test switch unit coupled to a voltage transformer (VT) circuit, wherein the third test switch unit comprises:
a third relay lead adapted to be communicatively coupled to the intelligent electronic device and the VT circuit;
a third field lead for receiving an input current;
a third test signal lead;
a third conducting element wherein the third conducting element electrically couples the third relay lead to the third test signal lead;
a VT contact element, having two ends, where one end of the VT contact element is connected to the third field lead, and the other end of the VT contact element is configured to abut against the third conducting element to complete an electrical path between the third field lead and the third relay lead; and
a third cam mounted on the shaft and adapted to rotate about its axis and engage with the VT contact element to decouple the other end of the VT contact element from the third conducting element.

2. The test system as claimed in claim 1 , wherein the axis of the cams coincides with the axis of the shaft.

3. The test system as claimed in claim 1 , wherein the shaft extends through the first test switch unit, the second test switch unit and the third test switch unit such that the movement of the shaft affects rotation of the cams in the first test switch unit, second test switch unit and the third test switch unit.

4. The test system as claimed in claim 1 , wherein the test system is configured to test the intelligent electronic device upon the trip circuit being opened by the first test switch unit, the current transformer (CT) circuit being shorted by the second test switch unit, and the voltage transformer (VT) circuit being isolated by the third test switch unit.

5. The test system as claimed in claim 1 , wherein the lever is moveable in a plane orthogonal to the axis of the shaft.

6. The test system as claimed in claim 1 , wherein the first conducting element comprises a second secondary contact element and a second conducting element, with the second secondary contact element manufactured from an electrically conducting and flexible material having one end connected with the first relay lead and another end being moveable, and wherein the other end of the second secondary contact element is moveable in response to the rotation of the first cam and is to come into contact with the second conducting element.

7. The test system as claimed in claim 1 , wherein the second conducting element further comprises:
a second primary contact element having one end connected with the first relay lead and a moveable end;
a third secondary contact element having one end connected with the first relay lead and another moveable end; and
a fourth conducting element;
wherein in response to the rotation of the first cam:
the moveable end of the second primary contact element being initially in contact with the fourth conducting element, is configured to disengage and move away from the fourth conducting element; and
the other moveable end is configured to come into contact with the fourth conducting element.

8. The test system as claimed in claim 7 , wherein the first cam further comprises additional profiled elements which are configured to move the second primary contact element and the third secondary contact element.

9. The test system as claimed in claim 1 , wherein the third conducting element comprises a fourth secondary contact element and a fourth conducting element, with the fourth secondary contact element manufactured from an electrically conducting and flexible material having one end connected with the third relay lead and another end being moveable, and wherein the other end of the fourth secondary contact element is moveable in response to the rotation of the third cam to come into contact with the fourth conducting element.

10. A method for operating the test system as claimed in claim 1 , wherein the method comprises:
engaging the lever to rotate the cams about the axis with the lever being coupled to the cams, wherein rotation of the cams leads to:
open the trip circuit coupled to the first test switch unit when the first cam engages with the first trip contact element;
short the CT circuit coupled to the second test switch unit when the leading profiled element of the second cam engages with the secondary contact element and the trailing profiled element of the second cam engages with the primary contact element; and
isolate the VT circuit coupled to the third test switch unit when the third cam engages with the VT contact element.

11. A test system for an intelligent electronic device installed in an electric substation

Assignees

• Hitachi Energy Switzerland Ag

Inventors

• V Loganadhan
• Ramachandra Mahesh
• Aj Manjunath
• S Shambhulingappa

Classifications

• G01R19/2513 Primary

  Arrangements for monitoring electric power systems, e.g. power lines or loads; Logging · CPC title

• G01R35/00

  Testing or calibrating of apparatus covered by the other groups of this subclass · CPC title

• G01R1/20

  Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments · CPC title