Adjustment method for adaptive optics system, adaptive optics system, and storage medium storing program for adaptive optics system
US-2016131901-A1 · May 12, 2016 · US
US11754449B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-11754449-B2 |
| Application number | US-202017310393-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jan 21, 2020 |
| Priority date | Jan 31, 2019 |
| Publication date | Sep 12, 2023 |
| Grant date | Sep 12, 2023 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
Systems for inspecting a surface of an optical wave originating from an optical device are provided. The optical device includes an exit pupil, and the inspection system includes an optical measuring head and a computer for processing the images from said optical measuring head. The optical measuring head includes a density gradient filter, the density varying periodically in the two directions in space, a matrix frame having at least four identical lenses of square shape of the same focal length and being arranged symmetrically, and a photodetector array, each of the four lenses forming an image of the pupil in the plane of this array. The image processing computer includes computing means for computing the partial derivatives ∂ Δ ∂ x ( x , y ) and ∂ Δ ∂ y ( x , y ) of the wave surface Δ(x, y) in the plane of the exit pupil.
Opening claim text (preview).
The invention claimed is: 1. A system for inspecting a surface of an optical wave originating from an optical device, said optical device comprising an exit pupil, said inspection system comprising an optical measuring head and a computer for processing the images from said optical measuring head, wherein: the optical measuring head comprises: a density gradient filter, in a plane referenced (x′, y′) perpendicular to the optical axis of the optical measuring head, the transmission T(x′, y′) of said filter being governed by the equation: T ( x ′ , y ′ ) = 1 + sin ( 2 2 π ( x ′ - y ′ ) / p x ) sin ( 2 2 π ( x ′ + y ′ ) / p y ) 2 p x and p y representing the periods of the two sinusoidal functions dependent respectively on (x′−y′) and (x′+y′); a matrix frame of identical lenses of square shape and of the same focal length, said matrix frame comprising at least four lenses, each center of one of the four lenses being arranged on an axis passing through the center of the exit pupil and a point O′M′(i, j) of the density gradient filter such that, in the plane referenced (x′, y′), O ′ M i , j ′ = [ i ( m + 0.25 ) p x / 2 j ( n + 0.25 ) p y / 2 ] i and j being able to adopt the values −1 and +1, m and n being positive integers; and a photodetector array, each of the four lenses forming an image of the pupil in the plane of this array, these images being referenced I″ k (x, y), k varying from 1 to 4; and the image processing computer comprises computing means for computing the partial derivatives ∂ Δ ∂ x ( x , y ) and ∂ Δ ∂ y ( x , y ) of the wave surface Δ(x, y) in the plane (x, y) of the exit pupil, these partial derivatives being equal to ∂ Δ ∂ x
Related publications grouped by family.
Answers are generated from the same data shown on this page.