Dual range micro-resistivity measurement method

US11747506B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11747506-B2
Application numberUS-202117392851-A
CountryUS
Kind codeB2
Filing dateAug 3, 2021
Priority dateAug 3, 2021
Publication dateSep 5, 2023
Grant dateSep 5, 2023

How to read this patent

A practical reading order for non-experts. Skip the full description unless you need deep technical detail.

  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

    Who owns or filed the patent and who is credited as inventor.

  4. Key dates

    Filing, priority, publication, and grant dates set the timeline.

  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

    Prior art links and similar publications in this corpus.

Abstract

Official abstract text for this publication.

A resistivity imaging device and a method of operating the resistivity imaging device in a wellbore. The resistivity imaging device includes a first electrode, a second electrode, and a circuit electrically coupled to the first electrode and the second electrode. An impedance is measured of a formation surrounding the wellbore. Based on the impedance, the circuit is configured into one of a first circuit configuration for operating the resistivity imaging device in a first mode and a second circuit configuration for operating the resistivity imaging device in a second mode. The resistivity imaging device is operated using the circuit in the one of the first circuit configuration and the second circuit configuration.

First claim

Opening claim text (preview).

What is claimed is: 1. A method of operating a resistivity imaging device in a wellbore, comprising: measuring an impedance of a formation surrounding the wellbore; configuring a circuit of the resistivity imaging device into one of a first circuit configuration for operating the resistivity imaging device in a first mode and a second circuit configuration for operating the resistivity imaging device in a second mode, based on the impedance of the formation, wherein the circuit further comprises a first switch and a second switch and configuring the circuit into the first circuit configuration comprises closing the first switch and opening the second switch to place a button electrode of the resistivity imaging device at a reference voltage and a plate electrode of the resistivity imaging device at ground and configuring the circuit into the second circuit configuration further comprises opening the first switch and closing the second switch to place the button electrode at ground and the plate electrode at the reference voltage; and operating the resistivity imaging device using the circuit in the one of the first circuit configuration and the second circuit configuration. 2. The method of claim 1 , wherein the circuit includes a transformer, wherein closing the second switch shorts a primary winding of the transformer. 3. The method of claim 1 , further comprising measuring a phase of the impedance of the formation and placing the circuit in the first circuit configuration when the phase of the impedance of the formation is between about 75 degrees and about 90 degrees. 4. The method of claim 1 , further comprising measuring the impedance of the formation with the resistivity imaging device operating in one of the first mode and the second mode. 5. A resistivity imaging device, comprising: a first electrode; a second electrode; a circuit including a first switch and a second switch, the circuit electrically coupled to the first electrode and the second electrode, wherein the circuit is configurable based on an impedance of a formation surrounding the resistivity imaging device into one of a first circuit configuration for operating the first electrode and the second electrode in a first mode and a second circuit configuration for operating the first electrode and the second electrode in a second mode; and a processor configured to close the first switch and open the second switch to place the first electrode at a reference voltage and the second electrode at ground in the first mode and to open the first switch and close the second switch to place the first electrode at ground and the second electrode at a reference voltage in the second mode. 6. The resistivity imaging device of claim 5 , wherein the circuit includes a transformer, wherein closing the second switch shorts a primary winding of the transformer. 7. The resistivity imaging device of claim 5 , wherein the processor is further configured to place the circuit in the first circuit configuration when a phase of the impedance of the formation is between about 75 degrees and about 90 degrees. 8. The resistivity imaging device of claim 5 , wherein the first electrode is a button electrode and the second electrode is a plate electrode.

Assignees

Inventors

Classifications

  • G01V3/24Primary

    using AC · CPC title

  • Processing data, e.g. for analysis, for interpretation, for correction · CPC title

  • specially adapted for well-logging · CPC title

  • generating an image of the borehole wall using down-hole measurements, e.g. acoustic or electric · CPC title

  • using induction coils · CPC title

Patent family

Related publications grouped by family.

External sources

Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US11747506B2 cover?
A resistivity imaging device and a method of operating the resistivity imaging device in a wellbore. The resistivity imaging device includes a first electrode, a second electrode, and a circuit electrically coupled to the first electrode and the second electrode. An impedance is measured of a formation surrounding the wellbore. Based on the impedance, the circuit is configured into one of a fir…
Who is the assignee on this patent?
Boulaknadal Youssef, Forgang Stanislav, Withers Peter, and 1 more
What technology area does this patent fall under?
Primary CPC classification G01V3/24. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Sep 05 2023 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).