Dual-optical displacement sensor alignment using knife edges

Patent metadata

Field	Value
Publication number	US-11740356-B2
Application number	US-202117229537-A
Country	US
Kind code	B2
Filing date	Apr 13, 2021
Priority date	Jun 5, 2020
Publication date	Aug 29, 2023
Grant date	Aug 29, 2023

Abstract

A dual-optical displacement sensor system includes a scanner including a first and second scanner head including optical displacement sensors providing a first and second beam having a first optical axis (OA) and a second OA. A computing device or programmed circuit is coupled to receive time versus position data from measurements involving alignment target(s) including at least one knife edge pair including a first and second knife edge oriented in a first plane of the alignment target that is essentially perpendicular to the OAs positioned between the scanner heads for interacting with the beams, and implement at least one equation to analyze the data for determining a degree of alignment of the first and second OA. Using the degree of alignment, an algorithm is for automatic alignment of the OAs or assist instructions for a user alignment of the OAs that provides guiding steps for the user for the alignment.

First claim

The invention claimed is:

1. An optical alignment system for a dual-optical displacement sensor including a scanner comprising a first scanner head including a first optical displacement sensor for providing a first beam having a first optical axis (OA) extending substantially in a first direction and a second scanner head including a second optical displacement sensor for providing a second beam having a second OA extending substantially in the first direction, comprising:
at least one alignment target, each alignment target comprising an integrally-formed knife edge pair including a first knife edge and a second knife edge offset from the first knife edge in the first direction, wherein the at least one alignment target is oriented along a first plane that is essentially perpendicular to the first direction and positioned between the first scanner head and the second scanner head for interacting with the first beam and the second beam;
a photodetector in at least one of the first and second scanner head for collecting time versus position data comprising from measurements involving the alignment target in a path of the first beam and measurements involving the alignment target in a path of the second beam path, and
a computing device or a programmed circuit implementing at least one equation coupled to receive and analyze the time versus position data for determining a degree of alignment of the first OA relative to the second OA.

2. The optical alignment system of claim 1 , wherein the at least one alignment target comprises a first alignment target and a second alignment target that are both one-piece structures which are both oriented along different parallel planes that are each parallel to the first plane, and wherein the first alignment target and the second alignment target each include the knife edge pair, and wherein the first knife edge and the second knife edge for the knife edge pairs are both angled between 50 and 125 degrees relative to one another.

3. The optical alignment system of claim 1 , wherein the optical alignment system is configured for automatically implementing adjusting a position of at least one of the first scanner head and the second scanner head so that the first OA and the second OA become more co-linear.

4. The optical alignment system of claim 1 , wherein the optical alignment system is configured for providing instructions for a user adjusting a position of at least one of the first scanner head and the second scanner head so that the first OA and the second OA become more co-linear.

5. The optical alignment system of claim 1 , wherein the first and the second optical displacement sensors both comprise chromatic confocal sensors, and wherein the measurements are reflection measurements.

6. The optical alignment system of claim 1 , wherein the first and the second optical displacement sensors both comprise laser triangulation sensors.

7. The optical alignment system of claim 1 , wherein the essentially perpendicular comprises an angle is between 85 degrees and 95 degrees relative to the first and the second OA.

8. A method of aligning a dual-optical displacement sensor system including a scanner comprising a first scanner head including a first optical displacement sensor for providing a first beam having a first optical axis (OA) extending substantially in a first direction, and a second scanner head including a second optical displacement sensor for providing a second beam having a second OA extending substantially in the first direction, comprising:
positioning at least one alignment target providing an integrally-formed first knife edge pair including a first knife edge and a second knife edge offset from the first knife edge in the first direction, the at least one alignment target oriented along a first plane that is essentially perpendicular to the first OA and the second OA and positioned between the first scanner head and the second scanner head for interacting with the first beam and the second beam;
collecting time versus position data by performing first measurements involving the at least one alignment target in a beam path along the first OA and second measurements involving the at least one alignment target in a second beam path along the second OA;
from the time versus position data using at least one equation, determining a degree of alignment of the first OA relative to the second OA, and
adjusting a position of at least one of the first scanner head and the second scanner head so that the first OA and the second OA become more co-linear.

9. The method of claim 8 , further comprising periodically performing the method to redetermine the degree of alignment, and then repeating the adjusting.

10. The method of claim 8 , wherein the adjusting comprises a computing device or a programmed circuit automatically implementing the alignment.

11. The method of claim 8 , wherein the at least one alignment target comprises a first alignment target and a second alignment target that are both one-piece structures which are oriented along different parallel planes that are each oriented in the first plane, and wherein the first alignment target and the second alignment target each include a knife edge pair, and wherein including the first knife edge and the second knife edge for the knife edge pairs that are at an angle between 50 and 125 degrees relative to one another.

12. The method of claim 8 , further comprising:
removing the alignment target from between the first and the second scanner heads,
the scanner moving the first and the second scanner heads over a coated sheet material comprising a coating layer on a metal substrate, and
measuring at least one thickness for the coated sheet material.

13. The method of claim 8 , wherein the coating layer includes a top coating layer and a bottom coating layer, and wherein the first scanner head is positioned to be a top head for measuring a thickness of the top coating layer and the second scanner is positioned to be a bottom head for measuring a thickness of the bottom coating layer.

14. The method of claim 8 , wherein the adjusting comprises instructions for the alignment that guides steps for a user for manually implementing the alignment.

15. The method of claim 8 , wherein the at least one alignment target consists of a single alignment target providing the first knife edge pair, further comprising repositioning the single alignment target in a direction along the first OA and the second OA to provide an effect of having both a first knife edge pair and a second knife edge pair.

16. The method of claim 8 , wherein the first head includes a first grid including a first plurality of pinholes and the second head includes a second grid including a second plurality of pinholes, the first and second grids for providing a plurality of separate beams, and wherein the method further comprises generating information in a single pass to direct rotating one of the first scanner head and the second scanner head about its OA such that the first grid aligns with the second grid, and wherein the adjusting the position further comprises rotationally aligning the first grid to the second grid.

17. The method of claim 8 , wherein during the collecting time versus position data at certain times the first beam is on while the second beam is off, and during other times the second beam is on while the first beam is off.

18. A dual-optical displacement sensor system, comprising:
a scanner comprising a first scanner head including a first optical displacement sensor for providing a first beam ha

Assignees

• Honeywell Int Inc

Inventors

• Hughes Michael Kon Yew
• Thalore Sudhir
• Baron Ian Charles
• Kalra Mayank
• Katz Tal

Classifications

• G01S17/48 Primary

  Active triangulation systems, i.e. using the transmission and reflection of electromagnetic waves other than radio waves · CPC title

• G01B9/02036

  by using chromatic effects, e.g. a wavelength dependent focal point · CPC title

• G01B11/27

  for testing the alignment of axes {(means for centering or aligning a light guide within a ferrule G02B6/3834)} · CPC title

• G01S7/4817

  relating to scanning · CPC title

• G01S7/4972

  Alignment of sensor · CPC title