Apparatus for detecting stacking direction of internal electrode of multilayer capacitor and detecting method thereof

Patent metadata

Field	Value
Publication number	US-11733315-B2
Application number	US-202217745207-A
Country	US
Kind code	B2
Filing date	May 16, 2022
Priority date	Oct 6, 2021
Publication date	Aug 22, 2023
Grant date	Aug 22, 2023

Abstract

An apparatus for detecting a stacking direction of internal electrodes of a multilayer capacitor includes a capacitor moving unit having a supply unit in which a plurality of multilayer capacitors are continuously supplied ad moving the supplied multilayer capacitors in one direction, a sensor unit including a coil, installed on the capacitor moving unit, and detecting inductance of the coil when each of the multilayer capacitors approaches the coil to determine a stacking direction of internal electrodes of the multilayer capacitor based on the detected inductance of the coil, and a separating unit installed on the capacitor moving unit and separating a multilayer capacitor selected as an unsuitable multilayer capacitor by the sensor unit.

First claim

What is claimed is:

1. An apparatus for detecting a stacking direction of internal electrodes of a multilayer capacitor, the apparatus comprising:
a capacitor moving unit having a supply unit in which a plurality of multilayer capacitors are continuously supplied and moving the supplied multilayer capacitors in one direction;
a sensor unit including a coil, installed on the capacitor moving unit, and configured to detect inductance of the coil when each of the multilayer capacitors approaches the coil and to determine a stacking direction of internal electrodes of the corresponding multilayer capacitor based on the detected inductance of the coil; and
a separating unit installed on the capacitor moving unit and configured to separate a multilayer capacitor selected as an unsuitable multilayer capacitor by the sensor unit.

2. The apparatus of claim 1 , further comprising:
a magnetic member disposed in a position opposing the sensor unit with the corresponding multilayer capacitor interposed therebetween.

3. The apparatus of claim 2 , wherein
a magnetic permeability of the magnetic member ranges from 100 to 5000.

4. The apparatus of claim 1 , further comprising:
an interval maintaining member disposed between the sensor unit and the corresponding multilayer capacitor and disposed to be in contact with one surface of the multilayer capacitor, wherein an interval between the sensor unit and the multilayer capacitor is uniform.

5. The apparatus of claim 4 , wherein
the interval maintaining member includes a non-magnetic material.

6. The apparatus of claim 1 , wherein,
in the sensor unit, an inner diameter of the coil is 3.0 times or less of a length of the corresponding multilayer capacitor in a length direction, and the number of turns of the coil satisfies Equation 1 below:
the number of turns ( N )≥20/(length of multilayer capacitor×inner diameter of coil).  [Equation 1]

7. The apparatus of claim 1 , wherein the sensor unit determines the stacking direction of the internal electrodes of the corresponding multilayer capacitor by comparing an inductance value of the coil to a preset reference inductance value, which is defined as an inductance value measured in the coil when there is no multilayer capacitor, and determining a difference (ΔL) between the inductance value of the coil and the preset reference inductance value.

8. A method for detecting a stacking direction of internal electrodes of a multilayer capacitor, the method comprising:
allowing a sensor unit including a coil to approach a multilayer capacitor to determine an inductance value of the coil according to a stacking direction of the internal electrodes included in the multilayer capacitor and comparing the determined inductance value with a preset reference inductance value to detect the stacking direction of the internal electrodes of the multilayer capacitor.

9. The method of claim 8 , wherein
a measurement frequency of inductance ranges from 50 kHz to 5 Mhz.

10. The method of claim 8 , wherein
a magnetic member is disposed in a position opposing the sensor unit with the multilayer capacitor interposed therebetween to increase a change in inductance of the coil generated by an eddy current.

11. The method of claim 10 , wherein
a magnetic permeability of the magnetic member ranges from 100 to 5000.

12. The method of claim 8 , wherein
an interval maintaining member including a non-magnetic material is disposed between the sensor unit and the multilayer capacitor, and is disposed to be in contact with one surface of the multilayer capacitor so that an interval between the sensor unit and the multilayer capacitor is uniformly maintained.

13. The method of claim 8 , wherein the allowing a sensor unit including a coil to approach a multilayer capacitor to determine an inductance value of the coil comprises
determining the stacking direction of the internal electrodes of the multilayer capacitor by determining a difference (ΔL) between the inductance value of the coil and the preset reference inductance value, which is defined as an inductance value measured in the coil when there is no multilayer capacitor.

Assignees

• Samsung Electro Mech

Inventors

• Son Soo Hwan
• Park Se Hun
• Moon Byeong Cheol
• Ahn Young Ghyu

Classifications

• G01R31/64 Primary

  Testing of capacitors · CPC title

• G01R27/2611

  Measuring inductance · CPC title

• H01G4/30

  Stacked capacitors (H01G4/33 takes precedence) · CPC title

• H01G13/00 Primary

  Apparatus specially adapted for manufacturing capacitors; Processes specially adapted for manufacturing capacitors not provided for in groups H01G4/00 - H01G11/00 · CPC title

• G01R31/016 Primary

  Testing of capacitors (measuring capacitance G01R27/2605) · CPC title