Part inspection method using computed tomography

Patent metadata

Field	Value
Publication number	US-11719651-B2
Application number	US-202117340902-A
Country	US
Kind code	B2
Filing date	Jun 7, 2021
Priority date	Aug 5, 2020
Publication date	Aug 8, 2023
Grant date	Aug 8, 2023

Abstract

A system and method of inspecting a plurality of objects using a computed tomography (CT) system is provided. The method includes acquiring an image of a fixture used for holding the plurality of objects with the CT system. A first electronic model of the fixture is generated. The objects are placed in the fixture. An image of the fixture and the objects is acquired with the CT system. A second electronic model of the fixture and the objects is generated. A third electronic model of the objects is defined based at least in part on subtracting the first electronic model from the second electronic model. Dimensions of the objects from the third electronic model are compared with a computer aided design (CAD) model. A report is output based at least in part on the comparison of the objects from the third electronic model with the CAD model.

First claim

What is claimed is:

1. A method of inspecting a plurality of objects using a computed tomography (CT) system, the method comprising:
acquiring an image of a fixture used for holding the plurality of objects with the CT system;
generating a first electronic model of the fixture;
placing the plurality of objects in the fixture;
acquiring an image of the fixture and the plurality of objects with the CT system;
generating a second electronic model of the fixture and the plurality of objects;
defining a third electronic model of the plurality objects based at least in part on subtracting the first electronic model from the second electronic model;
comparing dimensions of the objects from the third electronic model with a computer aided design (CAD) model; and
outputting a report based at least in part on the comparison of the objects from the third electronic model with the CAD model.

2. The method of claim 1 , further comprising defining a bounding box around each of the plurality of objects.

3. The method of claim 2 , wherein the defining of the bounding box includes generating a histogram of the third electronic model and determining a first peak and a second peak in the histogram.

4. The method of claim 3 , wherein the first peak represents the background of the third electronic model and the second peak represents the plurality of objects.

5. The method of claim 4 , further comprising defining a threshold, the threshold being between the first peak and the second peak.

6. The method of claim 5 , wherein the bounding box is defined by the threshold.

7. The method of claim 1 , wherein the subtraction of the first electronic model from the second electronic model is performed voxel by voxel.

8. The method of claim 7 , further comprising aligning a fixture portion of first electronic model with a fixture portion of the second electronic model.

9. The method of claim 8 , wherein the aligning is based on a best fit or an iterative closest point method.

10. The method of claim 8 , wherein the aligning is based on mechanical alignment of the fixture to a reproducible position within the CT system.

11. A system for inspecting a plurality of objects, the system comprising:
a x-ray source;
a detector arranged to receive x-rays from the x-ray source;
a placement stage disposed between the x-ray source and the detector; and
one or more processors configured to execute computer instructions when executed on the one or more processors to perform a method comprising:
acquiring a first image of a fixture used for holding a plurality of objects by emitting x-rays with the x-ray source, passing at least a first portion of the x-rays through the fixture, and receiving the first portion of the x-rays with the detector, the fixture being positioned on the placement stage;
generating a first electronic model of the fixture with the first image;
acquiring a second image of the fixture and the plurality of objects by emitting x-rays with the x-ray source, passing at least a second portion of the x-rays through the fixture and the plurality of objects, and receiving the second portion of the x-rays with the detector, the fixture and plurality of objects being positioned on the placement stage, the plurality of objects being supported by the fixture;
defining a third electronic model of the plurality of objects based at least in part on subtracting the first electronic model from the second electronic model;
comparing dimensions of the objects from the third electronic model with a computer aided design (CAD) model; and
outputting a report based at least in part on the comparison of the objects from the third electronic model with the CAD model.

12. The system of claim 11 , wherein the method further comprises defining a bounding box around each of the plurality of objects.

13. The system of claim 12 , wherein the defining of the bounding box includes generating a histogram of the third electronic model and determining a first peak and a second peak in the histogram.

14. The system of claim 13 , wherein the first peak represents the background of the third electronic model and the second peak represents the plurality of objects.

15. The system of claim 14 , wherein the method further comprises defining a threshold, the threshold being between the first peak and the second peak.

16. The system of claim 15 , wherein the bounding box is defined by the threshold.

17. The system of claim 11 , wherein the subtraction of the first electronic model from the second electronic model is performed voxel by voxel.

18. The system of claim 17 , wherein the method further comprises aligning a fixture portion of first electronic model with a fixture portion of the second electronic model.

19. The method of claim 18 , wherein the aligning is based on a best fit or an iterative closest point method.

20. The method of claim 18 , wherein the aligning is based on mechanical alignment of the fixture to a reproducible position within the system.

Assignees

• Faro Tech Inc

Inventors

• Stiebeiner Ariane
• Balatzis Georgio
• Raab Simon
• Wagner Stefan

Classifications

• G01N23/046 Primary

  using tomography, e.g. computed tomography [CT] · CPC title

• G01N23/20025

  Sample holders or supports therefor · CPC title

• G06F30/20

  Design optimisation, verification or simulation (optimisation, verification or simulation of circuit designs G06F30/30) · CPC title

• G01N2223/3075

  correcting for the properties of the container, e.g. empty · CPC title