Multilayer filter device

Patent metadata

Field	Value
Publication number	US-11711063-B2
Application number	US-202217685442-A
Country	US
Kind code	B2
Filing date	Mar 3, 2022
Priority date	Mar 9, 2021
Publication date	Jul 25, 2023
Grant date	Jul 25, 2023

Abstract

A filter device includes a filter including at least one inductor and at least one capacitor, and a stack of a plurality of dielectric layers and a plurality of conductor layers. The plurality of dielectric layers include at least one first dielectric layer formed of a first dielectric material and at least one second dielectric layer formed of a second dielectric material. The plurality of conductor layers include at least one first conductor layer in contact with the at least one first dielectric layer, and at least one second conductor layer in contact with the at least one second dielectric layer. The temperature coefficient of resonant frequency of the first dielectric material has a positive value. The temperature coefficient of resonant frequency of the second dielectric material has a negative value.

First claim

What is claimed is:

1. A multilayer filter device comprising:
a filter that includes at least one inductor and at least one capacitor; and
a stack that includes a plurality of dielectric layers and a plurality of conductor layers stacked together, where the stack is intended to integrate the at least one inductor and the at least one capacitor; wherein
the at least one inductor and the at least one capacitor are formed using the plurality of conductor layers;
the plurality of dielectric layers include at least one first dielectric layer and at least one second dielectric layer;
the plurality of conductor layers include at least one first conductor layer in contact with the at least one first dielectric layer, and at least one second conductor layer in contact with the at least one second dielectric layer;
the at least one first dielectric layer is formed of a first dielectric material having a positive temperature coefficient of resonant frequency;
the at least one second dielectric layer is formed of a second dielectric material having a negative temperature coefficient of resonant frequency; and
a total dimension of the at least one first dielectric layer in a stacking direction of the plurality of dielectric layers is smaller than a total dimension of the at least one second dielectric layer in the stacking direction.

2. The multilayer filter device according to claim 1 , wherein:
the stack has a bottom surface and a top surface that are located at two ends thereof in the stacking direction, and four side surfaces connecting the bottom surface and the top surface; and
the at least one first dielectric layer is located closer to the bottom surface than to the top surface.

3. The multilayer filter device according to claim 1 , wherein:
the at least one second dielectric layer includes a plurality of second dielectric layers; and
the at least one first dielectric layer is located between one second dielectric layer and another in the plurality of second dielectric layers.

4. The multilayer filter device according to claim 1 , wherein:
the at least one capacitor includes a plurality of capacitors;
the at least one first conductor layer includes a plurality of first conductor layers; and
at least one of the plurality of capacitors is constituted by the at least one first dielectric layer and two of the first conductor layers, where the two first conductor layers are located to sandwich the at least one first dielectric layer therebetween.

5. The multilayer filter device according to claim 1 , wherein the at least one inductor is formed using the at least one second conductor layer.

6. The multilayer filter device according to claim 1 , wherein the filter is a band-pass filter that selectively passes a signal of a frequency within a predetermined passband.

7. The multilayer filter device according to claim 6 , wherein the passband has a width in a range of 10 to 600 MHz.

8. A multilayer filter device comprising:
a filter that includes at least one inductor and at least one capacitor; and
a stack that includes a plurality of dielectric layers and a plurality of conductor layers stacked together, where the stack is intended to integrate the at least one inductor and the at least one capacitor; wherein
the at least one inductor and the at least one capacitor are formed using the plurality of conductor layers;
the plurality of dielectric layers include at least one first dielectric layer and at least one second dielectric layer;
the plurality of conductor layers include at least one first conductor layer in contact with the at least one first dielectric layer, and at least one second conductor layer in contact with the at least one second dielectric layer;
the first dielectric layer is formed of a first dielectric material having a positive temperature coefficient of resonant frequency; and
the second dielectric layer is formed of a second dielectric material having a negative temperature coefficient of resonant frequency, wherein:
the at least one second dielectric layer includes a plurality of second dielectric layers; and
the at least one first dielectric layer is located between one second dielectric layer and another in the plurality of second dielectric layers.

9. A multilayer filter device comprising:
a filter that includes at least one inductor and at least one capacitor; and
a stack that includes a plurality of dielectric layers and a plurality of conductor layers stacked together, where the stack is intended to integrate the at least one inductor and the at least one capacitor; wherein
the at least one inductor and the at least one capacitor are formed using the plurality of conductor layers;
the plurality of dielectric layers include at least one first dielectric layer and at least one second dielectric layer;
the plurality of conductor layers include at least one first conductor layer in contact with the at least one first dielectric layer, and at least one second conductor layer in contact with the at least one second dielectric layer;
the first dielectric layer is formed of a first dielectric material having a positive temperature coefficient of resonant frequency; and
the second dielectric layer is formed of a second dielectric material having a negative temperature coefficient of resonant frequency, wherein:
the at least one capacitor includes a plurality of capacitors;
the at least one first conductor layer includes a plurality of first conductor layers; and
at least one of the plurality of capacitors is constituted by the at least one first dielectric layer and two of the first conductor layers, where the two are located to sandwich the at least one first dielectric layer therebetween.

Assignees

• Tdk Corp

Inventors

• Sato Takuya
• Tsukamoto Kazuhiro

Classifications

• H03H7/0115 Primary

  comprising only inductors and capacitors (H03H7/075, H03H7/09, H03H7/12, H03H7/13 take precedence) · CPC title

• H03H2001/0085

  Multilayer, e.g. LTCC, HTCC, green sheets · CPC title

• H01P1/2002 Primary

  Dielectric waveguide filters (H01P1/212, H01P1/213, H01P1/215, H01P1/219 take precedence) · CPC title

• H03H7/0161

  Bandpass filters (H03H7/12 takes precedence) · CPC title

• H03H7/1766

  Parallel LC in series path (H03H7/1783 takes precedence) · CPC title