Capacitor lifespan estimation method, lifespan estimation program thereof, information processing device, and capacitor

Patent metadata

Field	Value
Publication number	US-11709209-B2
Application number	US-201917276647-A
Country	US
Kind code	B2
Filing date	Sep 27, 2019
Priority date	Sep 28, 2018
Publication date	Jul 25, 2023
Grant date	Jul 25, 2023

Abstract

A method includes processes of (a processing part 8) calculating an estimated heat generation temperature by using drive conditions (22, a storage part 6) at least including drive timing information (18) and drive current value information (20), and temperature change characteristic information (24) of a capacitor, calculating state change information (28) of the capacitor after elapse of a reference time by using the estimated heat generation temperature, and calculating a lifespan estimation value (lifespan estimation result 30) of the capacitor by using the state change information. This enables capacitor lifespan estimation corresponding to fluctuations of a drive current value flowing through the capacitor, the applicability of the capacitor is confirmed, and the safety of equipment using the capacitor is improved.

First claim

The invention claimed is:

1. A capacitor lifespan estimation method comprising:
calculating an estimated heat generation temperature by using drive conditions at least including drive timing information and drive current value information, and temperature change characteristic information of a capacitor, the drive timing information being indicative of a plurality of times from a start timing of the capacitor, the drive current value information being indicative of a plurality of drive current values corresponding to the plurality of times respectively, the plurality of drive current values being each indicative of a drive current value at a corresponded time of the plurality of times and fluctuating, the temperature change characteristic information including an equivalent series resistance, a thermal resistance, and a thermal capacity of the capacitor;
calculating an evaporation amount of an electrolytic solution of the capacitor after elapse of a reference time by using the estimated heat generation temperature; and
calculating a lifespan estimation value of the capacitor by using the evaporation amount of the electrolytic solution.

2. The capacitor lifespan estimation method according to claim 1 , comprising:
calculating an estimated evaporation value of the electrolytic solution of the capacitor in a set drive time by using the evaporation amount of the electrolytic solution of the capacitor, and
calculating the lifespan estimation value by using the estimated evaporation value and an evaporation reference value of the electrolytic solution.

3. The capacitor lifespan estimation method according to claim 1 , further comprising calculating a composite lifespan estimation value by using the lifespan estimation value, drive environment temperature information of the capacitor, and rate information of occurrence of the drive environment temperature information and the drive conditions.

4. The capacitor lifespan estimation method according to claim 1 , wherein the reference time includes a time for applying a drive current to the capacitor and a time until the heat generation temperature of the capacitor becomes equal to or less than a predetermined temperature after stop of the application of the drive current.

5. The capacitor lifespan estimation method according to claim 1 , further comprising:
determining whether the calculated lifespan estimation value satisfies a required lifespan condition, and
using this determination result to generate lifespan determination information including any one or more of the lifespan estimation value, the determination result, and lifespan value improvement information of the capacitor.

6. A capacitor designed by using the lifespan estimation value calculated by the capacitor lifespan estimation method according to claim 1 .

7. A capacitor, wherein the lifespan estimation value calculated by the capacitor lifespan estimation method according to claim 1 .

8. The capacitor lifespan estimation method according to claim 2 , further comprising calculating a composite lifespan estimation value by using the lifespan estimation value, drive environment temperature information of the capacitor, and rate information of occurrence of the drive environment temperature information and the drive conditions.

9. The capacitor lifespan estimation method according to claim 2 , wherein the reference time includes a time for applying a drive current to the capacitor and a time until the heat generation temperature of the capacitor becomes equal to or less than a predetermined temperature after stop of the application of the drive current.

10. The capacitor lifespan estimation method according to claim 3 , wherein the reference time includes a time for applying a drive current to the capacitor and a time until the heat generation temperature of the capacitor becomes equal to or less than a predetermined temperature after stop of the application of the drive current.

11. An information processing device having a capacitor lifespan estimation function, comprising:
an input part through which drive conditions at least including drive timing information and drive current value information are to be input, the drive timing information being indicative of a plurality of times from a start timing of the capacitor, the drive current value information being indicative of a plurality of drive current values corresponding to the plurality of times respectively, the plurality of drive current values being each indicative of a drive current value at a corresponded time of the plurality of times and fluctuating, the temperature change characteristic information including an equivalent series resistance, a thermal resistance, and a thermal capacity of the capacitor;
a storage part being configured to store the drive conditions and temperature change characteristic information of a capacitor; and
a processing part including a heat generation estimation part being configured to calculate an estimated heat generation temperature by using the drive conditions and the temperature change characteristic information, and a lifespan estimation part being configured to calculate an evaporation amount of an electrolytic solution of the capacitor after elapse of a reference time by using the estimated heat generation temperature and calculate a lifespan estimation value of the capacitor by using the evaporation amount of the electrolytic solution.

12. The information processing device according to claim 11 , wherein the lifespan estimation part calculates an estimated evaporation value of the electrolytic solution of the capacitor in a set drive time by using the evaporation amount of the electrolytic solution of the capacitor and calculates the lifespan estimation value by using the estimated evaporation value and an evaporation reference value of the electrolytic solution.

13. The information processing device according to claim 11 , wherein the processing part calculates a composite lifespan estimation value by using the lifespan estimation value, drive environment temperature information of the capacitor, and rate information of occurrence of the drive environment temperature information and the drive conditions.

14. The information processing device according to claim 11 , wherein the reference time includes a time for applying a drive current to the capacitor and a time until the heat generation temperature of the capacitor becomes equal to or less than a predetermined temperature after stop of the application of the drive current.

15. The information processing device according to claim 11 , wherein the processing part determines whether the calculated lifespan estimation value satisfies a required lifespan condition and uses this determination result to generate lifespan determination information including any one or more of the lifespan estimation value, the determination result, and lifespan value improvement information of the capacitor.

16. The information processing device according to claim 11 , further comprising a display part, wherein
the processing part generates, and displays on the display part, a lifespan estimation display screen using at least the lifespan estimation value and the drive conditions.

17. The information processing device according to claim 12 , wherein the processing part calculates a composite lifespan estimation value by using the lifespan estimation value, drive environment temperature information of the capacitor, and rate information of occurrence of the drive environment temperature information and the drive conditions.

18. The

Assignees

• Nippon Chemicon

Inventors

• SENZAI Daizou
• Furukawa Toshihiko

Classifications

• G01R31/64 Primary

  Testing of capacitors · CPC title

• H01G9/21

  Temperature-sensitive devices · CPC title

• G01R31/016 Primary

  Testing of capacitors (measuring capacitance G01R27/2605) · CPC title

• H01G13/00

  Apparatus specially adapted for manufacturing capacitors; Processes specially adapted for manufacturing capacitors not provided for in groups H01G4/00 - H01G11/00 · CPC title

• H01G9/14

  Structural combinations {or circuits} for modifying, or compensating for, electric characteristics of electrolytic capacitors · CPC title