CsI(TI) scintillator crystal including antiomy and other multi valence cations to reduce afterglow, and a radiation detection apparatus including the scintillation crystal
US-10928526-B2 · Feb 23, 2021 · US
US11693133B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-11693133-B2 |
| Application number | US-202217661520-A |
| Country | US |
| Kind code | B2 |
| Filing date | Apr 29, 2022 |
| Priority date | May 25, 2018 |
| Publication date | Jul 4, 2023 |
| Grant date | Jul 4, 2023 |
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A scintillation crystal can include a cesium halide that is co-doped with thallium and another element. In an embodiment, the scintillation crystal can include CsX:Tl, Me, where X represents a halogen, and Me represents a Group 5A element. In a particular embodiment, the scintillation crystal may have a cesium iodide host material, a first dopant including a thallium cation, and a second dopant including an antimony cation.
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What is claimed is: 1. A scintillator crystal comprising: a cesium iodide host material; a first dopant comprising thallium; a second dopant comprising antimony, wherein the scintillator crystal comprises between 1×10 −7 mol % and 1×10 −2 mol % antimony; and a third dopant comprising bismuth, wherein the scintillator crystal has a reduced afterglow. 2. The scintillator crystal of claim 1 , wherein a molar concentration of the first dopant is less than 10%. 3. The scintillator crystal of claim 1 , wherein the second dopant comprises trivalent antimony. 4. The scintillator crystal of claim 1 , wherein the scintillator crystal comprises less than 1×10 −3 mol % antimony and wherein the scintillator crystal has a light output intensity of less than 0.4% at 100 ms after exposure to an X-ray irradiation, relative to a light output intensity measured during the X-ray irradiation. 5. The scintillator crystal of claim 1 , wherein the scintillator crystal comprises less than 1×10 −3 mol % antimony and wherein the scintillator crystal has a light output intensity of less than 0.3% at 500 ms after exposure to an X-ray irradiation, relative to a light output intensity measured during the X-ray irradiation. 6. The scintillator crystal of claim 1 , wherein the scintillator crystal contains more than 1×10 −6 mol % of a second codopant capable of existing in more than one oxidation state within the crystal matrix. 7. The scintillator crystal of claim 1 , wherein a concentration of the second dopant in the scintillator crystal is greater than zero and no greater than 0.003 mol %. 8. The scintillator crystal of claim 1 , wherein the second dopant comprises pentavalent antimony and the third dopant comprises pentavalent bismuth. 9. A scintillator crystal comprising: a cesium iodide host material; a first dopant comprising thallium; a second dopant comprising a group VA element, wherein the scintillator crystal comprises no greater than 0.1 mol %; of the second dopant; and a third dopant comprising bismuth. 10. The scintillator crystal of claim 9 , wherein the group VA element is at least partially in its 3+ oxidation state. 11. The scintillator crystal of claim 9 , wherein the second dopant comprises pentavalent antimony. 12. The scintillator crystal of claim 9 , wherein the scintillator crystal comprises at least 3×10 −4 mol % antimony. 13. The scintillator crystal of claim 9 , wherein the scintillator crystal comprises less than 1×10 −3 mol % antimony and wherein the scintillator crystal has a light output intensity of less than 0.5% at 100 ms after exposure to an X-ray irradiation, relative to a light output intensity measured during the X-ray irradiation. 14. The scintillator crystal of claim 9 , wherein the scintillator crystal comprises less than 1×10 −3 mol % antimony and wherein the scintillator crystal has a light output intensity of less than 0.2% at 500 ms after exposure to an X-ray irradiation, relative to a light output intensity measured during the X-ray irradiation. 15. The scintillator crystal of claim 9 , wherein the scintillator crystal contains more than 1×10 −6 mol % of the second co-dopant capable of existing in more than one oxidation state within the crystal matrix. 16. The scintillator crystal of claim 9 , wherein the scintillator crystal comprises no greater than 0.003 mol % of the second dopant. 17. A scintillator crystal formed by a growth process, comprising: providing a cesium iodide host material; doping with thallium, wherein a molar concentration of said thallium is less than 10%; codoping with antimony, wherein a concentration of the second dopant in the melt is greater than zero and no greater than 0.01 mol %; and codoping with bismuth to produce a scintillator crystal with a reduced afterglow. 18. The scintillator crystal formed by the growth process of claim 17 , wherein the growth process is a Bridgman growth process. 19. The scintillator crystal formed by the growth process of claim 17 , wherein the formed scintillator crystal comprises between 1×10 −7 mol % and 1×10 −2 mol % antimony. 20. The scintillator crystal formed by the growth process of claim 17 , wherein the formed scintillator crystal comprises no greater than 0.003 mol % antimony.
containing gallium, indium or thallium · CPC title
Selection of materials · CPC title
with alkali or alkaline earth metals · CPC title
with alkali or alkaline earth metals · CPC title
Conversion screens for the conversion of the spatial distribution of X-rays or particle radiation into visible images, e.g. fluoroscopic screens (photographic processes using X-ray intensifiers G03C5/17; discharge tubes comprising luminescent screens H01J1/62; cathode ray tubes for X-ray conversion with optical output H01J31/50) · CPC title
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