Method and devices to construct artificial inline defects to calibrate inspection hardware on automated fiber placement systems

Patent metadata

Field	Value
Publication number	US-11685129-B2
Application number	US-202017112442-A
Country	US
Kind code	B2
Filing date	Dec 4, 2020
Priority date	Dec 4, 2020
Publication date	Jun 27, 2023
Grant date	Jun 27, 2023

Abstract

Systems, methods, and devices are provided for the creation of predictable and accurate defects in a fiber tow of an Automated Fiber Placement (AFP) process, with such artificial defects being useful to support calibration of an in situ inspection system used in the AFP process. Various embodiments include methods for creating such artificial defects that support calibration of an in situ inspection system of an AFP system or process. Various embodiments may also include a defect stencils for an AFP system or process.

First claim

What is claimed is:

1. A method for creating artificial defects in a tow, the artificial defects supporting calibration of an in situ inspection system of an Automated Fiber Placement (AFP) system, the method comprising:
selecting a length and a width of an artificial defect;
selecting a defect stencil having a cut path corresponding to the selected length and width, the cut path within the defect stencil; and
creating the artificial defect in a tow to be deposited in a course by an AFP head of the AFP system, wherein creating the artificial defect comprises cutting a portion of tow material using the selected defect stencil before the tow is aligned by the AFP head to form the course.

2. The method of claim 1 , wherein the artificial defect is a gap defect or an overlap defect.

3. The method of claim 1 , wherein the defect stencil is a two part defect stencil having a stencil top and a stencil base configured such that when placed on one another the tow material is held in place.

4. The method of claim 3 , wherein cutting a portion of tow material using the selected defect stencil comprises passing a blade through an opening in the stencil top.

5. The method of claim 3 , wherein cutting a portion of tow material using the selected defect stencil comprises pressing a blade disposed in the stencil top through the tow material when the stencil top and the stencil base are placed on one another.

6. The method of claim 1 , wherein creating the artificial defect further comprises cutting the portion of tow material using the selected defect stencil within the AFP head.

7. A method for creating artificial defects in a tow, the artificial defects supporting calibration of an in situ inspection system of an Automated Fiber Placement (AFP) system, the method comprising:
selecting a length and a width of an artificial defect, wherein selecting the length and the width of the artificial defect comprises selecting the length and the width of a gap defect and an overlap defect;
selecting a defect stencil having a cut path corresponding to the selected length and width; and
creating the artificial defect in a tow to be deposited in a course by the AFP system, wherein creating the artificial defect comprises cutting a portion of tow material using the selected defect stencil, wherein cutting the portion of tow material using the selected defect stencil comprises cutting a portion of a first tow of the course selected to receive the gap defect using the selected defect stencil, and wherein creating the artificial defect further comprises applying the portion of the first tow to a second tow of the course to create the overlap defect.

8. The method of claim 7 , further comprising:
depositing the first tow of the course and the second tow of the course by the AFP system to create an AFP build having the gap defect and the overlap defect; and
imaging the AFP build using the in situ inspection system to detect the gap defect and the overlap defect.

9. The method of claim 8 , further comprising:
calibrating the in situ inspection system based at least in part on the detections of the gap defect and the overlap defect.

10. The method of claim 8 , wherein the defect stencil is a two part defect stencil having a stencil top and a stencil base configured such that when placed on one another the first tow is held in place between the stencil top and the stencil base.

11. The method of claim 10 , wherein the stencil top and the stencil base have openings therein configured to form a cut path corresponding to the selected length and width.

12. The method of claim 10 , wherein the stencil top includes one or more blades therein configured to cut the first tow.

13. A defect stencil for creating artificial defects in a tow, the artificial defects supporting calibration of an in situ inspection system for an Automated Fiber Placement (AFP) system, the stencil comprising:
a stencil top; and
a stencil base having a first opening extending a depth below a surface of the stencil base and forming a cut path within the stencil base,
wherein the stencil top and the stencil base are configured such that, when placed on one another with a tow of the AFP system in between the stencil top and the stencil base and contacting the surface of the stencil base, the stencil top and the stencil base hold the tow in place therebetween while the tow is cut along the cut path.

14. The defect stencil of claim 13 , wherein the stencil top has a second opening, the second opening configured to:
align with the first opening when the stencil top and the stencil base are placed on one another; and
receive a blade through the second opening to cut the tow along the cut path.

15. The defect stencil of claim 13 , wherein the stencil top has one or more blades disposed therein, the one or more blades configured to align with the first opening and cut the tow along the cut path when the stencil top and the stencil base are placed on one another.

16. The defect stencil of claim 13 , wherein:
the stencil base further comprises a tow support protruding from the surface of the stencil base; and
a width of the stencil base is greater than a width of the cut path.

17. The defect stencil of claim 16 , wherein the stencil top further comprises a tow gap configured to receive the tow support when the stencil top and the stencil base are placed on one another.

18. The defect stencil of claim 17 , wherein the stencil base comprises alignment protrusions configured to interact with sides of the stencil base when the stencil top and the stencil base are placed on one another.

19. The defect stencil of claim 18 , wherein the stencil top and the stencil base are formed of plastic.

20. The defect stencil of claim 13 , wherein the cut path extends a first distance toward a center of the stencil base and a second distance along a length of the stencil such that the cut path is configured to form a rectangle cut of the tow.

Assignees

• Nasa
• Us Adminstrator Of Nasa

Inventors

• Juarez Peter D
• Gregory Elizabeth D

Classifications

• B29C70/382 Primary

  Automated fiber placement [AFP] · CPC title

• G01N21/8851

  Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges (G01N21/8806 and G01N21/93 - G01N21/95692 take precedence; optical measurement of dimensions G01B11/00; optical scanning G02B26/10; image transformation G06T3/00; computerised image enhancement G06T5/00; image processing per se for flaw detection G06T7/0002) · CPC title

• G01N2021/8472

  Investigation of composite materials · CPC title

• G01N21/93

  Detection standards; Calibrating {baseline adjustment, drift correction} · CPC title

• G01N2021/8874

  Taking dimensions of defect into account · CPC title