Loss-based wavelength meter

Patent metadata

Field	Value
Publication number	US-11683092-B2
Application number	US-202117183538-A
Country	US
Kind code	B2
Filing date	Feb 24, 2021
Priority date	Feb 24, 2020
Publication date	Jun 20, 2023
Grant date	Jun 20, 2023

Abstract

A loss-based wavelength meter includes a first photodiode configured to measure power of monochromatic light; and a loss section having a monotonic wavelength dependency, wherein a wavelength of the monochromatic light is determined based on measurements of the first photodiode after the monochromatic light has gone through the loss section. This provides a compact implementation that may be used in integrated optics devices using silicon photonics as well as other embodiments.

First claim

What is claimed is:

1. A loss-based wavelength meter comprising:
a first photodiode and a second photodiode each configured to measure power of monochromatic light; and
a loss section having a monotonic wavelength dependency, configured to perform evanescent coupling of the monochromatic light for athermality based on the loss section being a waveguide configured with an evanescent coupling mechanism, wherein the loss section is located between the first photodiode and the second photodiode, and wherein a wavelength of the monochromatic light is determined based on a ratio of measurements of the first photodiode and the second photodiode.

2. The loss-based wavelength meter of claim 1 , further comprising a polarizing shaping section.

3. The loss-based wavelength meter of claim 1 , wherein the second photodiode is located before the loss section for an input power measurement.

4. The loss-based wavelength meter of claim 1 , wherein the loss section includes absorbing metal for a wavelength range of interest for the evanescent coupling mechanism.

5. The loss-based wavelength meter of claim 1 , wherein the loss section includes a doped semiconductor for the evanescent coupling mechanism.

6. The loss-based wavelength meter of claim 1 , wherein the loss section includes a semiconductor with a bandgap lower than photon energy in a wavelength range of interest for the evanescent coupling mechanism.

7. The loss-based wavelength meter of claim 1 , wherein the loss section includes Ge for the evanescent coupling mechanism.

8. The loss-based wavelength meter of claim 1 , wherein the loss section includes bend waveguides to assist modal overlap with an adjacent section for the evanescent coupling mechanism.

9. The loss-based wavelength meter of claim 1 , wherein the loss section utilizes coupling into radiative modes through waveguide roughness or waveguide bends.

10. The loss-based wavelength meter of claim 1 , wherein the loss section utilizes light coupling to a substrate.

11. The loss-based wavelength meter of claim 1 , further comprising a plurality of taps for temperature insensitivity based on tap ratios of the plurality of taps.

12. The loss-based wavelength meter of claim 1 , wherein the athermality is over a certain wavelength range.

13. The loss-based wavelength meter of claim 1 , wherein the monochromatic light has an exponential evanescent tail that grows proportionally to the wavelength that extends into a cladding region in the loss section, wherein loss, on the exponential evanescent tail, is exponentially dependent on the wavelength.

14. The loss-based wavelength meter of claim 1 , wherein the loss section has a defined slope for covering a certain wavelength range of interest.

15. The loss-based wavelength meter of claim 14 , wherein the loss section is one of a plurality of loss sections, each of the plurality of loss sections have a defined slope for covering a certain wavelength range of interest.

16. A method of utilizing a loss-based wavelength meter comprising:
providing monochromatic light through a loss section having a monotonic wavelength dependency;
performing, by the loss section, evanescent coupling of the monochromatic light for athermality based on the loss section being a waveguide configured with an evanescent coupling mechanism,
detecting power of the monochromatic light before and after the loss section; and
determining a wavelength of monochromatic light based on a ratio of measurements of the power before and after the monochromatic light has gone through the loss section.

17. The method of claim 16 , wherein the determining is based on the measurements after the monochromatic light traverse two different arms of an interferometer.

18. The method of claim 16 , further comprising
utilizing a plurality of taps for temperature insensitivity based on tap ratios of the plurality of taps.

19. The method of claim 16 , further comprising
combining the measurements with a measurement from a highly accurate but periodic optical reference.

20. The method of claim 16 , wherein the athermality is over a certain wavelength range.

Assignees

• Ciena Corp

Inventors

• Bois Antoine
• Delisle-Simard Alexandre
• Picard Marie-Josée
• Poulin Michel

Classifications

• H04B10/07

  Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems · CPC title

• H01S5/0683

  by monitoring the optical output parameters · CPC title

• G02B2006/1215

  Splitter · CPC title

• H04B10/07957

  Monitoring or measuring wavelength · CPC title

• H04B10/07955 Primary

  Monitoring or measuring power · CPC title