Method and apparatus for demolding and analyzing a direct analysis sample

Patent metadata

Field	Value
Publication number	US-11662277-B2
Application number	US-202016776219-A
Country	US
Kind code	B2
Filing date	Jan 29, 2020
Priority date	Feb 11, 2019
Publication date	May 30, 2023
Grant date	May 30, 2023

Abstract

The present invention relates to an apparatus for demolding and analyzing a direct analysis sample formed from a molten metal material contained within a sample chamber assembly, wherein the sample chamber assembly comprises at least a sample housing, a cover plate and closing means, comprising:a cabinet defining an interior and comprising at least one opening for the sample housing to enter the cabinet, and analyzing means located inside the cabinet for analyzing an analysis surface of the sample;demolding means adapted to remove at least the closing means to expose at least part of the analysis surface of the sample; andtransporting means adapted to hold and transport the sample housing at least between a sample demolding position, where the closing means is removed by the demolding means, and a sample analysis position, where the analysis surface of the sample is analyzed by the analyzing means, and wherein the sample demolding position and the sample analysis position are different from each other.The invention also relates to a system and method for demolding and analyzing a direct analysis sample.

First claim

The invention claimed is:

1. An apparatus for demolding and analyzing a direct analysis sample formed within a sample chamber assembly from a molten metal material, wherein the sample chamber assembly comprises a sample housing, a cover plate, and a closing mechanism holding the sample housing and the cover plate together, the apparatus comprising:
a cabinet defining an interior and comprising at least one opening for the sample housing to enter the cabinet, and a sample analyzer located inside the cabinet for analyzing an analysis surface of the direct analysis sample;
a demolding mechanism adapted to engage the closing mechanism and to remove at least the closing mechanism from the sample housing and the cover plate to expose at least part of the analysis surface of the direct analysis sample; and
a transporting mechanism adapted to hold and transport the sample housing at least between a sample demolding position, where the closing mechanism is removed from the sample chamber assembly by the demolding mechanism, and a sample analysis position, where the analysis surface of the sample contained within the sample housing is analyzed by the sample analyzer, and wherein the sample demolding position and the sample analysis position are different from each other.

2. The apparatus of claim 1 , wherein the demolding mechanism comprises at least one blade arranged in at least a sideways direction or a longitudinal direction relative to an axis formed by the demolding position and the analysis position and adapted:
(i) to move over a surface of the sample chamber assembly to remove the closing mechanism from the sample chamber assembly, or
(ii) to move over a surface of the sample chamber assembly to remove the closing mechanism and to penetrate the sample chamber assembly to expose at least part of the analysis surface of the sample.

3. The apparatus of claim 2 , wherein the demolding mechanism further comprises an actuation means for moving the at least one blade and the at least one supporting surface, and wherein the actuation means comprises a hand gear for moving the at least one blade and the supporting surface mechanically, or a push rod for moving the at least one blade and the at least one supporting surface pneumatically or electrically, between a first position and a second position.

4. The apparatus of claim 3 , wherein the transporting mechanism comprises:
a first clamp and a second clamp for holding the sample housing and to stop movement of the sample housing in at least a forward direction and a backward direction from both the demolding position and the sample analysis position, wherein the first clamp and the second clamp are movably arranged in the forward and the backward direction for transporting the sample housing between the sample demolding position and the sample analysis position, wherein the second clamp is arranged at least in part opposite the first clamp, and
wherein the actuation means is adapted to be moved between the first position and the second position, wherein:
in the first position, the actuation means and the at least one blade are arranged for loading the sample housing, wherein at least the first clamp is at least partly arranged in the opening of the cabinet, and
in the second position, the actuation means and the at least one blade are arranged for analyzing the sample by the sample analyzer, wherein at least the second clamp is at least partly arranged in the opening of the cabinet.

5. The apparatus of claim 4 , further comprising:
at least a first dust cover mounted on a stationary part of the apparatus, and a second dust cover mounted on the blade or a moveable part mechanically associated with the blade and moving together with the blade, wherein at least part of the first dust cover and the second dust cover are arranged to be spaced apart to allow loading the sample chamber assembly when the actuation means is in the first position, and at least partly overlap when the actuation means is in the second position.

6. The apparatus of claim 5 , wherein the first dust cover comprises an insertion-opening for inserting the sample chamber assembly into the transporting mechanism, and wherein the second dust cover overlaps the insertion-opening when the actuation means is in the second position.

7. The apparatus of claim 5 , further comprising at least one dust seal arranged the first dust cover and/or the second dust cover to seal a remaining space between the first dust cover and the second dust cover when they are overlapping.

8. The apparatus of claim 2 , wherein the closing mechanism is a clamp.

9. The apparatus of claim 1 , wherein the demolding mechanism further comprises at least one supporting surface to support at least a part of the cover plate of the sample chamber assembly when held by the transporting mechanism, and wherein the at least one supporting surface is movably arranged to allow the cover plate to separate from the sample housing by means of gravitational force.

10. The apparatus of claim 1 , wherein the transporting mechanism comprises:
a first clamp and a second clamp for holding the sample housing and to stop movement of the sample housing in at least a forward direction and a backward direction from both the demolding position and the sample analysis position, wherein the first clamp and the second clamp are movably arranged in the forward and the backward direction for transporting the sample housing between the sample demolding position and the sample analysis position, wherein the second clamp is arranged at least in part opposite the first clamp.

11. The apparatus of claim 10 , wherein the first clamp or the second clamp further comprises a sensor means for detecting contact of the first clamp or the second clamp and the sample housing.

12. The apparatus of claim 10 , wherein
the second clamp comprises a first locking means adapted to allow the sample housing to be moved past the first locking means towards the first clamp, and to prevent movement of the sample housing in an opposite direction, and
the first clamp comprises a second locking means adapted to prevent movement of the sample housing in the forward direction and backward direction.

13. The apparatus of claim 1 , wherein the sample analyzer comprises an optical emission spectrometer.

14. The apparatus of claim 13 , wherein the optical emission spectrometer is
(i) a spark optical emission spectrometer, or
(ii) a top-loaded optical emission spectrometer comprising a spring to hold the analysis surface of the sample at a distance to a contact electrode of the top-loaded optical emission spectrometer, and adapted to establish an electric contact to the analysis surface of the sample when the spring is in a compressed state.

15. The apparatus of claim 14 , wherein the spring has a force of less than 100 Newton, to hold the analysis surface at a distance of less than 1 mm to the contact electrode of the top-loaded optical emission spectrometer.

16. A system for demolding and analyzing a direct analysis sample comprising:
an apparatus according to claim 1 ; and
a direct analysis sample formed from a molten metal material contained within the sample chamber assembly, wherein a ratio of a mass of the sample housing to a mass of the molten metal material solidified in the sample housing is higher than 5.

17. A method for demolding and analyzing a direct analysis sample formed within a sample chamber assembly from a molten metal material, wherein the sample chamber assembly comprises a sample housing, a cover plate and a closing mechanism holding

Assignees

• Heraeus Electro Nite Int

Inventors

• Cuypers Jan
• Verhoeven Jean-Paul

Classifications

• G01N21/67

  using electric arcs or discharges · CPC title

• G01N1/28 Primary

  Preparing specimens for investigation {including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q}(mounting specimens on microscopic slides G02B21/34; means for supporting the objects or the materials to be analysed in electron microscopes H01J37/20 {; laboratory gas handling apparatus B01L5/00}) · CPC title

• G01N2001/1031

  Sampling from special places · CPC title

• G01N21/25

  Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands · CPC title

• G01N21/62

  Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light · CPC title