Charged particle beam device

US11626266B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11626266-B2
Application numberUS-202117501249-A
CountryUS
Kind codeB2
Filing dateOct 14, 2021
Priority dateOct 28, 2020
Publication dateApr 11, 2023
Grant dateApr 11, 2023

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

Provided is a charged particle beam device capable of focusing with high accuracy even when a charged particle beam has a large off-axis amount. The charged particle beam device generates an observation image of a sample by irradiating the sample with a charged particle beam, and includes: a deflection unit that inclines the charged particle beam; a focusing lens that focuses the charged particle beam; an adjustment unit that adjusts a lens strength of the focusing lens based on an evaluation value calculated from the observation image; a storage unit that stores a relationship between a visual field movement amount and the lens strength; and a filter setting unit that calculates the visual field movement amount based on an inclination angle of the charged particle beam and the relationship, and sets an image filter to be superimposed on the observation image based on the calculated visual field movement amount.

First claim

Opening claim text (preview).

What is claimed is: 1. A charged particle beam device that generates an observation image of a sample by irradiating the sample with a charged particle beam, the charged particle beam device comprising: a deflection unit that inclines the charged particle beam; a focusing lens that focuses the charged particle beam; an adjustment unit that adjusts a lens strength of the focusing lens based on an evaluation value calculated from the observation image; a storage unit that stores a relationship between a visual field movement amount, which is an amount of movement of the charged particle beam on the sample for each off-axis amount that is an amount of the charged particle beam moving away from a center of the focusing lens, and the lens strength; and a filter setting unit that calculates the visual field movement amount based on an inclination angle of the charged particle beam and the relationship, and sets an image filter to be superimposed on the observation image based on the calculated visual field movement amount, wherein the evaluation value is calculated from a superimposed image obtained by superimposing the image filter on the observation image. 2. The charged particle beam device according to claim 1 , wherein the filter setting unit sets a position of the image filter based on the visual field movement amount. 3. The charged particle beam device according to claim 2 , wherein when the image filter protrudes from a region of the observation image, the filter setting unit narrows a width of the image filter. 4. The charged particle beam device according to claim 3 , wherein when the image filter is a rectangular function, a length of one side of the observation image is A, and the visual field movement amount is Δ, the filter setting unit sets the width of the image filter to be A−2Δ. 5. The charged particle beam device according to claim 1 , wherein the filter setting unit sets a size of the image filter based on the visual field movement amount. 6. The charged particle beam device according to claim 1 , wherein the relationship is created by measuring a visual field movement amount from an observation image of a known sample, which is a sample having a known shape, imaged while changing a lens strength and an off-axis amount. 7. The charged particle beam device according to claim 6 , wherein the known sample has a protrusion in an annular shape or a cross shape.

Assignees

Inventors

Classifications

  • Means for adjusting the focus · CPC title

  • Automatic focusing methods · CPC title

  • Lenses · CPC title

  • Deflecting along given lines · CPC title

  • H01J37/222Primary

    Image processing arrangements associated with the tube · CPC title

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What does patent US11626266B2 cover?
Provided is a charged particle beam device capable of focusing with high accuracy even when a charged particle beam has a large off-axis amount. The charged particle beam device generates an observation image of a sample by irradiating the sample with a charged particle beam, and includes: a deflection unit that inclines the charged particle beam; a focusing lens that focuses the charged partic…
Who is the assignee on this patent?
Hitachi High Tech Corp
What technology area does this patent fall under?
Primary CPC classification H01J37/222. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Apr 11 2023 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).