Testbed device for use in predictive modelling of manufacturing processes

US11623316B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11623316-B2
Application numberUS-202016856533-A
CountryUS
Kind codeB2
Filing dateApr 23, 2020
Priority dateApr 23, 2019
Publication dateApr 11, 2023
Grant dateApr 11, 2023

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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Abstract

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A testbed device includes high performance actuators, a video microscopy system and a plurality of high resolution, throughput sensors adapted or configured for collecting data that may be used in predictive modelling of machine processes.

First claim

Opening claim text (preview).

What is claimed: 1. A testbed device, comprising: a base; a displaceable machine table supported on the base; a sample holder supported on the displaceable machine table; a displaceable spindle supported on the base; a video microscopy system, including a camera, a microscope and a light source; a plurality of sensors adapted to measure force, vibration and thermal emission; a tool holder carried on the displaceable spindle, the tool holder being adapted to hold a cutting or burnishing tool; and a control module including a controller, an X-actuator, a Y-actuator and a Z-actuator wherein the controller is adapted to (a) control the X-actuator, the Y-actuator and the Z-actuator, (b) receive data from the plurality of sensors, and (c) receive data images from the video microscopy system wherein the testbed device further includes a carbon fiber rod assembly integrated into the tool holder, a first laser interferometer targeting a first target element at a first end of the carbon fiber rod along a first line and a second laser interferometer targeting a second target element at a second end of the carbon fiber rod along a second line perpendicular to the first line. 2. The testbed device of claim 1 , wherein the plurality of sensors include a tool acoustic emission sensor integrated into the tool holder. 3. The testbed device of claim 2 , wherein the plurality of sensors include a sample acoustic emission sensor integrated into the sample holder. 4. The testbed device of claim 3 , wherein the plurality of sensors include a tangential force load cell integrated into the tool holder. 5. The testbed device of claim 4 , wherein the plurality of sensors include at least one vertical force load cell integrated into the displaceable machine table. 6. The testbed device of claim 5 , wherein said plurality of sensors have a sampling rate of at least 2 MHz/channel. 7. The testbed device of claim 6 , wherein the camera has a frame speed of at least 10,000 frames per second. 8. The testbed device of claim 7 , wherein the camera has a frame speed of at least 500,000 frames per second. 9. The testbed device of claim 7 , wherein said microscope provides image magnification of 5×-50×. 10. The testbed device of claim 9 , wherein said light source provides greater than 250 million lux. 11. The testbed device of claim 1 , wherein the video microscopy system provides optical resolution of approximately 550 nm at 50× magnification. 12. The testbed device of claim 1 , wherein the X-actuator, the Y-actuator and the Z-actuator all provide greater than 5 Gs of acceleration, 4.5 m/s of peak speed and 50 nm absolute encoder position feedback. 13. The testbed device of claim 1 , further including a sapphire constraint between a sample held in the sample holder and the camera. 14. The testbed device of claim 1 , further including a stationary proximity sensor and a data acquisition end point marker supported on the displaceable machine table. 15. The testbed device of claim 1 , wherein the camera has a frame speed of at least 10,000 frames per second. 16. The testbed device of claim 1 , wherein the camera has a frame speed of at least 500,000 frames per second. 17. The testbed device of claim 1 , wherein the camera has a frame speed of between 10,000 and 2,100,000 frames per second.

Assignees

Inventors

Classifications

  • B23Q17/098Primary

    by measuring noise · CPC title

  • for measuring existing positions of tools or workpieces · CPC title

  • Prediction, estimation of machining parameters from cutting data · CPC title

  • using interferometers · CPC title

  • B23Q17/249Primary

    using image analysis, e.g. for radar, infrared or array camera images · CPC title

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Frequently asked questions

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What does patent US11623316B2 cover?
A testbed device includes high performance actuators, a video microscopy system and a plurality of high resolution, throughput sensors adapted or configured for collecting data that may be used in predictive modelling of machine processes.
Who is the assignee on this patent?
Univ Kentucky Res Found
What technology area does this patent fall under?
Primary CPC classification B23Q17/098. Mapped technology areas include Operations & Transport.
When was this patent published?
Publication date Tue Apr 11 2023 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).