Tool management system of machine tool
US-11520307-B2 · Dec 6, 2022 · US
US11623316B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-11623316-B2 |
| Application number | US-202016856533-A |
| Country | US |
| Kind code | B2 |
| Filing date | Apr 23, 2020 |
| Priority date | Apr 23, 2019 |
| Publication date | Apr 11, 2023 |
| Grant date | Apr 11, 2023 |
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A testbed device includes high performance actuators, a video microscopy system and a plurality of high resolution, throughput sensors adapted or configured for collecting data that may be used in predictive modelling of machine processes.
Opening claim text (preview).
What is claimed: 1. A testbed device, comprising: a base; a displaceable machine table supported on the base; a sample holder supported on the displaceable machine table; a displaceable spindle supported on the base; a video microscopy system, including a camera, a microscope and a light source; a plurality of sensors adapted to measure force, vibration and thermal emission; a tool holder carried on the displaceable spindle, the tool holder being adapted to hold a cutting or burnishing tool; and a control module including a controller, an X-actuator, a Y-actuator and a Z-actuator wherein the controller is adapted to (a) control the X-actuator, the Y-actuator and the Z-actuator, (b) receive data from the plurality of sensors, and (c) receive data images from the video microscopy system wherein the testbed device further includes a carbon fiber rod assembly integrated into the tool holder, a first laser interferometer targeting a first target element at a first end of the carbon fiber rod along a first line and a second laser interferometer targeting a second target element at a second end of the carbon fiber rod along a second line perpendicular to the first line. 2. The testbed device of claim 1 , wherein the plurality of sensors include a tool acoustic emission sensor integrated into the tool holder. 3. The testbed device of claim 2 , wherein the plurality of sensors include a sample acoustic emission sensor integrated into the sample holder. 4. The testbed device of claim 3 , wherein the plurality of sensors include a tangential force load cell integrated into the tool holder. 5. The testbed device of claim 4 , wherein the plurality of sensors include at least one vertical force load cell integrated into the displaceable machine table. 6. The testbed device of claim 5 , wherein said plurality of sensors have a sampling rate of at least 2 MHz/channel. 7. The testbed device of claim 6 , wherein the camera has a frame speed of at least 10,000 frames per second. 8. The testbed device of claim 7 , wherein the camera has a frame speed of at least 500,000 frames per second. 9. The testbed device of claim 7 , wherein said microscope provides image magnification of 5×-50×. 10. The testbed device of claim 9 , wherein said light source provides greater than 250 million lux. 11. The testbed device of claim 1 , wherein the video microscopy system provides optical resolution of approximately 550 nm at 50× magnification. 12. The testbed device of claim 1 , wherein the X-actuator, the Y-actuator and the Z-actuator all provide greater than 5 Gs of acceleration, 4.5 m/s of peak speed and 50 nm absolute encoder position feedback. 13. The testbed device of claim 1 , further including a sapphire constraint between a sample held in the sample holder and the camera. 14. The testbed device of claim 1 , further including a stationary proximity sensor and a data acquisition end point marker supported on the displaceable machine table. 15. The testbed device of claim 1 , wherein the camera has a frame speed of at least 10,000 frames per second. 16. The testbed device of claim 1 , wherein the camera has a frame speed of at least 500,000 frames per second. 17. The testbed device of claim 1 , wherein the camera has a frame speed of between 10,000 and 2,100,000 frames per second.
by measuring noise · CPC title
for measuring existing positions of tools or workpieces · CPC title
Prediction, estimation of machining parameters from cutting data · CPC title
using interferometers · CPC title
using image analysis, e.g. for radar, infrared or array camera images · CPC title
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