Methods, systems, and media for evaluating images

US11615643B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11615643-B2
Application numberUS-202117447067-A
CountryUS
Kind codeB2
Filing dateSep 8, 2021
Priority dateDec 28, 2016
Publication dateMar 28, 2023
Grant dateMar 28, 2023

How to read this patent

A practical reading order for non-experts. Skip the full description unless you need deep technical detail.

  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

    Who owns or filed the patent and who is credited as inventor.

  4. Key dates

    Filing, priority, publication, and grant dates set the timeline.

  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

    Prior art links and similar publications in this corpus.

Abstract

Official abstract text for this publication.

A method may include obtaining an image including a face. The method may further include determining at least one time domain feature related to the face in the image and at least one frequency domain information related to the face in the image. The method may further include evaluating the quality of the image based on the at least one time domain feature and the frequency domain information.

First claim

Opening claim text (preview).

What is claimed is: 1. A face recognition electronic system, comprising: at least one storage device storing a set of instructions; at least one processor in communication with the at least one storage device, wherein when executing the set of instructions the at least one processor: obtain a two-dimensional (2D) image including a face, and three-dimensional (3D) data corresponding to the 2D image, the 2D image including a plurality of pixels, the 3D data including a plurality of points; determine, for each of the plurality of pixels in the 2D image, a point in the 3D data corresponding to the pixel in the 2D image; determine a mask image based on the point in the 3D data corresponding to each of the plurality of pixels in the 2D image; determine, based on the mask image, a symmetry related parameter of the face in the 2D image; and correct, based on the symmetry related parameter of the face, the 2D image to generate a corrected 2D image including a front view of the face. 2. The system of claim 1 , wherein to determine, for each of the plurality of pixels in the 2D image, the point in the 3D data corresponding to the pixel in the 2D image, the at least one processor: determine at least one landmark point in the 2D image; determine at least one point in the 3D data corresponding to the at least one landmark point in the 2D image; determine a projection matrix based on the at least one point in the 3D data and a template 3D model of face; determine a relationship between the 2D image and the 3D data based on the projection matrix; determine, for each of the plurality of pixels in the 2D image, the point in the 3D data corresponding to the pixel in the 2D image based on the relationship between the 2D image and the 3D data. 3. The system of claim 2 , wherein the at least one landmark point in the 2D image includes at least one edge point of a facial feature. 4. The system of claim 2 , wherein to determine the at least one point in the 3D data corresponding to the at least one landmark point in the 2D image, the at least one processor: identify coordinates of the at least one landmark point in the 2D image; and identify points in the 3D data having same coordinates with the coordinates of the at least one landmark point in the 2D image as the at least one point in the 3D data corresponding to the at least one landmark point in the 2D image. 5. The system of claim 2 , wherein the template 3D model of face is generated based on a plurality of 2D images and corresponding 3D data. 6. The system of claim 1 , wherein to determine the symmetry related parameter of the face in the 2D image, the at least one processor: divide the mask image into a first sub-image and a second sub-image; determine a difference between the first sub-image and the second sub-image; and determine, based on the difference between the first sub-image and the second sub-image, the symmetry related parameter of the face in the 2D image. 7. The system of claim 6 , wherein the at least one processor: symmetrically divide the mask image along a vertical centerline into a left image and a right image, the left image being the first sub-image, the right image being the second sub-image. 8. The system of claim 6 , wherein to determine the difference between the first sub-image and the second sub-image, the at least one processor: determine a first sum of values of pixels in the first sub-image and a second sum of values of pixels in the second sub-image; and determine the difference between the first sub-image and the second sub-image based on the first sum and the second sum. 9. The system of claim 8 , wherein a value of a pixel in the mask image is associated with a normal line of a point in the 3D data corresponding to the pixel; and in response to that a pixel in the mask image corresponding to a point in the 3D data of which the angle between the normal line and the Z direction is greater than 45°, the value of the pixel in the mask image is set as 1, in response to that a pixel in the mask image corresponding to a point in the 3D data of which the angle between the normal line and the Z direction is equal or smaller than 45°, the value of the pixel is set as 0. 10. The system of claim 6 , wherein the difference between the first sub-image and the second sub-image is normalized. 11. The system of claim 1 , wherein to correct the 2D image, the at least one processor: determine a Gaussian image based on the mask image; determine a first coefficient associated with the symmetry related parameter, the mask image, and the Gaussian image; flip the Gaussian image and the 2D image; determine a second coefficient associated with the symmetry related parameter, the mask image, and the flipped Gaussian image; determine a first matrix based on the 2D image and the Gaussian image; determine a second matrix based on the 2D image and the first coefficient; determine a third matrix based on the flipped 2D image and the second coefficient; and correct the 2D image based on the first matrix, the second matrix, and the third matrix. 12. The system of claim 11 , wherein to correct the 2D image based on the first matrix, the second matrix, and the third matrix, the at least one processor: determine a corrected matrix of the 2D image by adding up the first matrix, the second matrix, and the third matrix; and correct the 2D image based on the corrected matrix of the 2D image. 13. A method implemented on at least one device each of which has at least one processor and storage, the method comprising: obtaining a two-dimensional (2D) image including a face, and three-dimensional (3D) data corresponding to the 2D image, the 2D image including a plurality of pixels, the 3D data including a plurality of points; determining, for each of the plurality of pixels in the 2D image, a point in the 3D data corresponding to the pixel in the 2D image; determining a mask image based on the point in the 3D data corresponding to each of the plurality of pixels in the 2D image; determining, based on the mask image, a symmetry related parameter of the face in the 2D image; and correcting, based on the symmetry related parameter of the face, the 2D image to generate a corrected 2D image including a front view of the face. 14. The method of claim 13 , wherein the determining, for each of the plurality of pixels in the 2D image, the point in the 3D data corresponding to the pixel in the 2D image includes: determining at least one landmark point in the 2D image; determining at least one point in the 3D data corresponding to the at least one landmark point in the 2D image; determining a projection matrix based on the at least one point in the 3D data and a template 3D model of face; determining a relationship between the 2D image and the 3D data based on the projection matrix; determining, for each of the plurality of pixels in the 2D image, the point in the 3D data corresponding to the at least one landmark point in the 2D image based on the relationship between the 2D image and the 3D data. 15. The method of claim 13 , wherein the determining of the symmetry related parameter of the face in the 2D image includes: dividing the mask image into a first sub-image and a second sub-image; determining a difference between the first sub-image and the second sub-image; and determining, based on the difference between the first sub-image and the second sub-image, the symmetry related parameter of the face in the 2D image. 16. The method of claim 15 , wherein the dividing the mask image into a first sub-image and a sec

Assignees

Inventors

Classifications

  • Frequency domain transformation; Autocorrelation · CPC title

  • G06V40/161Primary

    Detection; Localisation; Normalisation · CPC title

  • Encoded features or binary features, e.g. local binary patterns [LBP] · CPC title

  • G06V40/167Primary

    using comparisons between temporally consecutive images · CPC title

  • Evaluation of the quality of the acquired pattern · CPC title

Patent family

Related publications grouped by family.

External sources

Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US11615643B2 cover?
A method may include obtaining an image including a face. The method may further include determining at least one time domain feature related to the face in the image and at least one frequency domain information related to the face in the image. The method may further include evaluating the quality of the image based on the at least one time domain feature and the frequency domain information.
Who is the assignee on this patent?
Zhejiang Dahua Technology Co
What technology area does this patent fall under?
Primary CPC classification G06V40/161. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Mar 28 2023 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 7 related publications on this page (citations in our corpus or others sharing the same primary CPC).