Back scattering inspection system and back scattering inspection method

Patent metadata

Field	Value
Publication number	US-11614413-B2
Application number	US-202017255968-A
Country	US
Kind code	B2
Filing date	Jan 3, 2020
Priority date	Jan 4, 2019
Publication date	Mar 28, 2023
Grant date	Mar 28, 2023

Abstract

The present disclosure provides a back scattering inspection system and a back scattering inspection method. The back scattering inspection system includes a frame and a back scattering inspection device. The rack includes a track arranged vertically or obliquely relative to the ground, and a space enclosed by the track forms an inspection channel; and the back scattering inspection device includes a back scattering ray emitting device and a back scattering detector, and the back scattering inspection device is movably disposed on the track for inspecting an inspected object passing through the inspection channel. The back scattering inspection system can perform back scattering inspection on a plurality of surfaces of the inspected object.

First claim

What is claimed is:

1. An X-ray backscatter inspection system, comprising:
a frame, comprising a track arranged vertically or obliquely relative to the ground, wherein a space enclosed by the track forms an inspection channel; and
an X-ray backscatter inspection device, comprising an X-ray emitter and an X-ray backscatter detector, wherein the X-ray backscatter inspection device is movably disposed on the track for inspecting an inspected object passing through the inspection channel;
a first driving device, in driving connection with the X-ray backscatter inspection device, wherein the first driving device is configured to drive the X-ray backscatter inspection device to move on the track;
a second driving device, wherein the second driving device is configured to drive the X-ray backscatter inspection device to rotate around a direction of the movement of the X-ray backscatter inspection device on the track.

2. The X-ray backscatter inspection system of claim 1 , wherein the X-ray emitter is disposed in such a way that a scanning direction of an X-ray pencil beam emitted by the X-ray emitter is parallel to an extension direction of the inspection channel.

3. The X-ray backscatter inspection system of claim 1 , wherein the track is one of a polygonal line-shaped track, a curved track, and a track formed by a combination of a straight track and a curved track.

4. The X-ray backscatter inspection system of claim 3 , wherein the track is one of a U-shaped track, an arc-shaped track, and a circular track.

5. The X-ray backscatter inspection system of claim 1 , further comprising a license plate identification system, wherein when the inspected object is a vehicle, a license plate recognition system is configured to identify license plate information of the vehicle.

6. The X-ray backscatter inspection system of claim 1 , further comprising a positioning sensor, configured to detect a position of the inspected object relative to the track.

7. The X-ray backscatter inspection system of claim 1 , further comprising a laser radar device, configured to inspect a surface of the inspected object.

8. The X-ray backscatter inspection system of claim 1 , further comprising an anti-collision system, wherein the anti-collision system comprises an anti-collision sensor disposed on the frame for detecting a distance between the track and the inspected object, and an alarm system in signal connection with the anti-collision sensor.

9. The X-ray backscatter inspection system of claim 1 , wherein the frame is a movable frame and a roller is installed at a bottom of the frame.

10. An X-ray backscatter inspection method using an X-ray backscatter inspection system, comprising:
Providing a frame that comprises a track and arranging the track vertically or obliquely relative to the ground to enclose a space therein to form an inspection channel;
movably disposing an X-ray backscatter inspection device in a manner that allows said X-ray backscatter inspection device to move along said track, wherein said X-ray backscatter inspection device comprises an X-ray emitter and an X-ray backscatter detector;
using a first driving device to move the X-ray backscatter inspection device along the track and using a second driving device to rotate the X-ray backscatter inspection device around the direction of the movement of the X-ray backscatter inspection device on the track to cause the X-ray backscatter inspection device to execute scanning inspection while causing an inspected object to be passing through the inspection channel.

11. The X-ray backscatter inspection method of claim 10 , wherein a scanning direction of an X-ray pencil beam emitted by the X-ray emitter is parallel to an extension direction of the inspection channel.

12. The X-ray backscatter inspection method of claim 10 , further comprising: causing the X-ray backscatter inspection device to rotate around the direction of the movement of the X-ray backscatter inspection device on the track when the X-ray backscatter inspection device moves along the track.

13. The X-ray backscatter inspection method of claim 10 , further comprising: using the second driving device to keep a first angle of the X-ray backscatter inspection device unchanged during movement of the X-ray backscatter inspection device on the track, said first angle being an angle of the X-ray backscatter inspection device around a direction of the movement of the X-ray backscatter inspection device; using the second driving device to rotate the X-ray backscatter inspection device by an angle to change the first angle to a second angle as the X-ray backscatter inspection device reaches a tail end of the track, said second angle being an angle of the X-ray inspection backscatter device around the direction of the movement of the X-ray backscatter inspection device different from the first angle; and performing a next scanning, wherein the X-ray backscatter inspection device moves from the tail end of the track to another end of the track.

14. The X-ray backscatter inspection method of claim 10 , further comprising: using a laser radar device to inspect whether a surface of the object is damaged.

15. The X-ray backscatter inspection method of claim 10 , further comprising: using an anti-collision sensor to detect the distance between the track and the inspected object, and causing an alarm system in signal connection with the anti-collision sensor to issue an alarm when the distance between the inspected object and the track is less than a safe distance.

16. The X-ray backscatter inspection method of claim 10 , further comprising: after inspecting a part of the inspected object in an extension direction of the inspection channel, changing the position of the inspected object relative to the frame along the extension direction of the inspection channel, and inspecting another part of the inspected object.

Assignees

• Univ Tsinghua
• Nuctech Co Ltd
• Nuctech Beijing Company Ltd

Inventors

• Li Jianmin
• Zhang Li
• Li Yuanjing
• Chen Zhiqiang
• Yu Hao
• Sun Shangmin
• Liu Bicheng
• Wang Weizhen
• Wang Dongyu
• Ma Yuan
• Hu Yu
• Zong Chunguang

Classifications

• G01N23/20008 Primary

  Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor (monochromators for X- rays using crystals G21K1/06) · CPC title

• G01N2223/3303

  object fixed; source and detector move · CPC title

• G01N23/203 Primary

  Measuring back scattering · CPC title

• G01V5/222 Primary

  measuring scattered radiation · CPC title